microscope electron
microscope electron, Total:200 items.
The international standard classification for "microscope electron" includes: Optical equipment , Chemical analysis , Other standards related to analytical chemistry , Optical measuring instruments , Ophthalmic equipment .
The Chinese standard classification for "microscope electron" includes: Electron optics and other physical optics instrument , Magnifier and microscope , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Chemical Measurement , Medical optical instrument and endoscope .
Professional Standard - Machinery
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 7398.13-1994 Specimens slides for microscopes and biological microscopes
- JB/T 5480-1991 Diaphragm of Electron Microscope
- JB/T 5383-1991 Specification for Transmission Electron Microscope
- JB/T 5481-1991 Lamp Filament of Electron Microscope
- JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
- JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
- JB/T 8230.2-1995 Microscope objective lens series
- JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 9246-1996 Microscopes-Oculars (eyepieces)
- GB/T 43846.2-2024 Microscopes—Designation of microscope objectives—Part 2: Chromatic correction
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
- GB 9246-1988 Microscopes--Series of oculars(eyepieces)
- GB/T 9246-2008 Microscopes—Oculars (eyepieces)
- GB/T 2609-1996 Microscopes--Objectives
- GB 7667-2003 The dose of X-rays leakage from electron microscope
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 9247-1996 Microscopes-Condensers
- GB/T 2609-2006 Microscopes - Objectives
- GB 7667-1996 The dose of X-rays leakage from electron microscope
- GB/T 22056-2008 Microscopes - Marking of objectives and eyepieces
- GB/T 22056-2018 Microscopes—Marking of objectives and eyepieces
- GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
- GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
- GB/T 9247-2008 Microscopes—Condensers
- GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
- GB/T 2609-2015 Microscopes―Objectives
- GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X - Ray energy dispersive spectrometry(EDS)quantitative microanalysis for thin biological specimens
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Education
- JY/T 0581-2020 General analysis rules for transmission electron microscope
- JY/T 011-1996 General rules for transmission electron microscopy
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
- JY/T 010-1996 General rules for analytical scanning electron microscopy
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
Professional Standard - Medicine
- YY/T 0067-2007 Micro-circulation microscopes
- YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery
Professional Standard - Ferrous Metallurgy
- YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
Professional Standard - Petroleum
- SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
Association of German Mechanical Engineers
- DVS 2803-1974 Electron-beam welding in microscopy (survey)
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2025 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
- ISO 10934:2025 Microscopes — Vocabulary for light microscopy
- ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
- ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 19012-4:2024 Microscopes - Designation of microscope objectives - Part 4: Polarization characteristics
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 9344:2011 Microscopes - Graticules for eyepieces
- ISO/PRF 19012-4:2024 Microscopes
- ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO/DIS 19012-4 Microscopes — Designation of microscope objectives — Part 4: Polarization characteristics
- ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
- ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
- ISO 19012-2:2013 Microscopes - Designation of microscope objectives - Part 2: Chromatic correction
- ISO 8578:2012 Microscopes - Marking of objectives and eyepieces
American Society for Testing and Materials (ASTM)
- ASTM STP 372-1965 Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
British Standards Institution (BSI)
- BS ISO 25498:2025 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- BS ISO 10934:2025 Microscopes. Vocabulary for light microscopy
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- 25/30505052 DC BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope
- 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
- BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
- BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
- BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
- BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
- BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
- BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
- BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
- 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
- BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
- BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
- BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
- BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
- 12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
- BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
- 19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
- BS ISO 19012-1:2011 Microscopes. Designation of microscope objectives-Flatness of field/Plan
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
- 24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
- 18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
- BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
- BS 3836-2:1965 Specification for components of microscopes. Dimensions and marking of microscopes
- BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
- BS ISO 8578:2012 Microscopes. Marking of objectives and eyepieces
- BS 7012-16:1997 Light microscopes-Diameter of interchangeable eyepieces for microscopes with tube length 160 mm
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- BH GSO ISO 15227:2016 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
- OS GSO ISO 8578:2015 Microscopes -- Marking of objectives and eyepieces
- OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
- JIS B 7148:1992 Microscope eyepieces
- JIS B 7150:1993 Micrometer microscopes
- JIS B 7139-4:2008 Stereomicroscopes -- Part 4: Marking of stereomicroscopes
- JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
- JIS B 7139-2:2008 Stereomicroscopes -- Part 2: Testing of stereomicroscopes
- JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
- JIS B 7252:2015 Marking of microscope objectives and eyepieces
- JIS B 7252:2001 Marking of microscope objectives and eyepieces
GCC Standardization Organization
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
- GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 19012-1:2015 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
- GSO ISO 15227:2015 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
- GSO ISO 11883:2013 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
Korean Agency for Technology and Standards (KATS)
- KS I 0051-2019 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-2024 General rules for scanning electron microscopy
- KS M 0044-1999 General rules for scanning electron microscopy
- KS D ISO 22493-2012(2017) Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493:2012 Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS I 0051-1999 General rules for scanning electron microscopy
- KS D ISO 16700:2013 Microbeam analysis-Scanning electron microscopy-Guidelines for calibrating image magnification
- KS D 2716-2008 Measurement of nanoparticle diameter-Transmission electron microscope
- KS B 5601-1995 Micrometer microscopes
- KS D 2716-2008(2018) Measurement of nanoparticle diameter-Transmission electron microscope
- KS B 5601-1995(2021) Micrometer microscopes
- KS B ISO 11884-2:2011 Optics and photonics - Minimum requirements for stereomicroscope - Part 2: High performance microscopes
- KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
- KS D 2714-2016(2021) Scanning probe microscope-Method for lateral force microscope
- KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
- KS B 5601-2021 Micrometer microscopes
- KS B ISO 11884-2-2021 Optics and photonics - Minimum requirements for stereomicroscope - Part 2: High performance microscopes
- KS B ISO 11884-2-2011(2021) Optics and photonics-Minimum requirements for stereomicroscope-Part 2:High performance microscopes
- KS D 2714-2016 Scanning probe microscope-Method for lateral force microscope
- KS B ISO 15227-2023 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
- KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
- KS B ISO 8578:2016 Optics and optical instruments-Microscopes-Marking of objectives and eyepieces
- KS B ISO 11884-2-2011(2016) Optics and photonics - Minimum requirements for stereomicroscope - Part 2: High performance microscopes
- KS B 5619-1999 Microscopes-Eyepiece reticles
- KS B ISO 19012-1:2011 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
- KS B ISO 19012-1:2016 Optics and photonics - Designation of microscope objectives - Part 1: Flatness of field/Plan
- KS B ISO 8578:2006 Optics and optical instruments-Microscopes-Marking of objectives and eyepieces
- KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
- KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
- KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
- KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
- KS D 2714-2021 Scanning probe microscope-Method for lateral force microscope
- KS B 5615-2016(2021) Biological microscope objectives
- KS B 5615-1997 Biological microscope objectives
- KS L 2010-2009(2024) Slide glasses for microscope
Association Francaise de Normalisation
- NF ISO 15932:2014 Microbeam Analysis - Analytical Electron Microscopy - Vocabulary
- NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of confocal fluorescence microscopes for biological imaging
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
Institute of Interconnecting and Packaging Electronic Circuits (IPC)
- IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components
- IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
International Electrotechnical Commission (IEC)
- IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components
Military Standards (MIL-STD)
- DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
- DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS
Bureau of Indian Standards
- IS 13108-2019 Optics and Photonics —— Microscopes —— Immersion Liquids for Light Microscopy ( Second Revision )
German Institute for Standardization
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
- DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
- DIN 58889:1986-09 Lenses and oculars for microscops - Marking
- DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern
- DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
Magyar Szabványügyi Testület
- MNOSZ 5534-1956 Microscope light mirror
Spanish Association for Standardization (UNE)
- AENOR UNE 1059:1956 Microcopy.
Gosstandart of Russia
- GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
electron microscope,microscope electron,microscope electron,Electron Microscope Dimensions,scanning electron microscope,The magnification of the electron microscope,fine electron microscope,Earliest Electron Microscope,Electron for Transmission Electron Microscopy,Choice of Electron Microscope,microscope electron,The structure of the electron microscope,electron microscope,The most advanced electron microscope,electrons in an electron microscope,electron microscope electron,in the electron microscope,electron microscope electron,electron microscope