fine electron microscope

fine electron microscope, Total:244 items.

The international standard classification for "fine electron microscope" includes: Optical equipment , Products of the chemical industry in general , Physicochemical methods of analysis , Chemical analysis , Ophthalmic equipment , Protection against crime , Veterinary medicine .

The Chinese standard classification for "fine electron microscope" includes: Electron optics and other physical optics instrument , Magnifier and microscope , Basic standards and general methods for dye , Basic standards and general methods , Chemical Measurement , Medical optical instrument and endoscope , Crime judging technology , Animal quarantine, veterinary and epidemic prevention .

Professional Standard - Machinery

JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 8230.5-1999 Microscope -- connecting and fitting dimensions between ocular （eyepiece） and tube
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 5383-1991 Specification for Transmission Electron Microscope
JB/T 7398.1-1994 Symbols for Microscope Objectives and Eyepieces
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 9352-1999 Test method for the transmission electron microscope

未注明发布机构

DIN 58272 E:2015-09 Medical instruments - Microscopic forceps, fine pattern
DIN 58272 E:2022-08 Medical instruments - Microscopic forceps, fine pattern

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 43846.1-2024 Microscopes—Designation of microscope objectives—Part 1: Flatness of field/Plan
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 22056-2008 Microscopes - Marking of objectives and eyepieces
GB/T 42886-2023 Microscopes—Microscopes with digital imaging displays—Information provided to the user regarding imaging performance
GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
GB/T 22061-2008 Microscopes - Reference system of polarized light microscopy
GB/T 43846.2-2024 Microscopes—Designation of microscope objectives—Part 2: Chromatic correction
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 22132-2008 Microscopes - Diameter of interchangeable eyepieces
GB/T 27596-2011 Dyestuffs—Determination of particle fineness—Microscope method

Professional Standard - Education

JY/T 011-1996 General rules for transmission electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0581-2020 General analysis rules for transmission electron microscope

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China

JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy

Group Standards of the People's Republic of China

T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/CSTM 00162-2020 Calibration methods for transmission electron microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Professional Standard - Medicine

YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
GB/T 22056-2018 Microscopes—Marking of objectives and eyepieces

工业和信息化部

YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Professional Standard - Commodity Inspection

SN/T 1225-2003 Protocol of diagnostic method for leucocytozoosis-Microscopic examination

German Institute for Standardization

DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern
DIN 58272:2023-03 Medical instruments - Microscopic forceps, fine pattern
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO/DIS 19606:2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for surface roughness of fine ceramic films by atomic force microscopy
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO/DIS 19012-4 Microscopes — Designation of microscope objectives — Part 4: Polarization characteristics
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 8578:2012 Microscopes - Marking of objectives and eyepieces
ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
ISO 19012-3:2015 Microscopes - Designation of microscope objectives - Part 3: Spectral transmittance
ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method

Japanese Industrial Standards Committee (JISC)

JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
JIS B 7139-2:2008 Stereomicroscopes -- Part 2: Testing of stereomicroscopes
JIS B 7139-4:2008 Stereomicroscopes -- Part 4: Marking of stereomicroscopes
JIS B 7252:2015 Marking of microscope objectives and eyepieces
JIS B 7252:2001 Marking of microscope objectives and eyepieces
JIS B 7139-1:2008 Stereomicroscopes -- Part 1: Minimum requirements for stereomicroscopes
JIS B 7149:1995 Microscopes -- Eyepiece reticles
JIS B 7143:1977 Engagement between microscope eyepiece and eyepiece sleeves
JIS B 7143:2022 Engagement between microscope eyepiece and eyepiece sleeves
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS R 3702:1996 Cover glasses for microscopes

GSO

OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 19606:2021 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for surface roughness of fine ceramic films by atomic force microscopy
BH GSO ISO 19606:2022 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for surface roughness of fine ceramic films by atomic force microscopy
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
GSO ISO 19012-1:2015 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
OS GSO ISO 8578:2015 Microscopes -- Marking of objectives and eyepieces
BH GSO ISO 11883:2016 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
BH GSO ISO 15227:2016 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
GSO ISO 15227:2015 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
GSO ISO 11883:2013 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
BH GSO ISO 19012-1:2016 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
OS GSO ISO 10936-2:2016 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery
GSO ISO 10936-2:2016 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery
BH GSO ISO 10936-2:2017 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery

British Standards Institution (BSI)

BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
23/30461942 DC BS ISO 19606. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for surface roughness of fine ceramic films by atomic force microscopy
BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS ISO 8578:2012 Microscopes. Marking of objectives and eyepieces
BS 2043:1968 Method for the determination of wool fibre fineness by the use of a projection microscope
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
23/30444981 DC BS ISO 19012-4. Microscopes. Designation of microscope objectives - Part 4. Polarization characteristics
BS ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 18221:2016 Microscopes. Microscopes with digital imaging displays. Information provided to the user regarding imaging performance

Korean Agency for Technology and Standards (KATS)

KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS B ISO 11884-2-2021 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 8578:2006 Optics and optical instruments-Microscopes-Marking of objectives and eyepieces
KS B ISO 8578:2016 Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS B 5619-1999 Microscopes-Eyepiece reticles
KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS H ISO 13366-1-2006(2016) Milk－Enumeration of somatic cells－Part 1：Microscopic method
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B ISO 8576:2006 Optics and optical instruments－Microscopes－Reference system of polarized light microscopy
KS B ISO 8576-2006(2021) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2022 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D 8544-2021 Metallic coating－Measurement of coating thickness－Transmission electron microscopy method

Association of German Mechanical Engineers

DVS 2803-1974 Electron-beam welding in microscopy (survey)
DVS 2801-1968 Resistance welding in microscopy (survey)

SCC

DIN 58272 E:2015 Draft Document - Medical instruments - Microscopic forceps, fine pattern
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS EN ISO 13366-1:1997 Milk. Enumeration of somatic cells-Microscopic method
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
BS ISO 19012-1:2011 Microscopes. Designation of microscope objectives-Flatness of field/Plan
BS 3836-2:1965 Specification for components of microscopes. Dimensions and marking of microscopes
BS 7012-16:1997 Light microscopes-Diameter of interchangeable eyepieces for microscopes with tube length 160 mm
12/30266267 DC BS ISO 19012-1. Microscopes. Designation of microscope objectives. Flatness of field/Plan
BS ISO 19012-2:2009 Optics and photonics. Designation of microscope objectives-Chromatic correction
DIN 58878:1978 Colour designation of objectives for microscopes
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
ISO 8036:2015 Plus Redline Microscopes - Immersion liquids for light microscopy (includes Redline Version)
BS 2043:1953 Method for the determination of wool fibre fineness using the projection microscope
BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method

Association Francaise de Normalisation

NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique
NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
X11-660:1983 Particle size analysis by optical microscope method. General indications on microscope.
NF X11-660:1983 Granulométrie - Analyse granulométrique par microscopie optique - Généralités sur le microscope.

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 15227-2023 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
KS B ISO 8576-2023 Optics and optical instruments — Microscopes — Reference system of polarized light microscopy

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components
IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components

American Society for Testing and Materials (ASTM)

ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E175-82(2010) Standard Terminology of Microscopy
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

HU-MSZT

MSZ 3282-1968 Melting point detection using microscopic and microscopic methods

Military Standards (MIL-STD)

DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS
DOD A-A-51796 A-1991 MICROSCOPE, OPTICAL (BINOCULAR)

International Electrotechnical Commission (IEC)

IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components

Standard Association of Australia （SAA）

ISO 19012-4:2024 Microscopes - Designation of microscope objectives - Part 4: Polarization characteristics

DIN

DIN 58272:2023 Medical instruments - Microscopic forceps, fine pattern

RU-GOST R

GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
GOST 3361-1975 Eyepieces and body-tubes of the microscopes. Attaching dimensions
GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components

VDI - Verein Deutscher Ingenieure

VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method

TIA - Telecommunications Industry Association

TIA/EIA-573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes

Danish Standards Foundation

DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DS 2011:1985 Micrometers. External micrometers of standard design. Terms and definitions, requirements, testing

American National Standards Institute （ANSI)

ANSI/TIA/EIA 573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes

SE-SIS

SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice