1. Scanning Electron Microscope
1. Scanning Electron Microscope, Total:54 items.
The international standard classification for "1. Scanning Electron Microscope" includes: Linear and angular measurements , Other standards related to analytical chemistry , Linear and angular measurements in general , Metallic coatings , Other methods of testing of metals , Optical equipment , Chemical analysis .
The Chinese standard classification for "1. Scanning Electron Microscope" includes: Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Material Protection , Metallographic testing method , Chemical Measurement , Basic standards and general methods .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 16594-1996 Micron grade lenght measurement by SEM
- GB/T 30834-2014 Standard test methods for rating and classifying inclusions in steel―Scanning Electron Microscope
- GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
- GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
- GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
- GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM
- GB/T 17722-1999 Gold-plated thickness measurement by SEM
Professional Standard - Machinery
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
Professional Standard - Commodity Inspection
- SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
National Metrological Technical Specifications of the People's Republic of China
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
Group Standards of the People's Republic of China
- T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
- T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
- T/COEMA 21O-2024 Polygonal scanning mirror for LIDAR
Military Standard of the People's Republic of China-General Armament Department
- GJB 2666-1996 Specification for scanning reflective beryllium mirrors
- GJB 2666A-2018 Specification for scanning reflective beryllium mirrors
Professional Standard - Education
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
- JY/T 010-1996 General rules for analytical scanning electron microscopy
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
国家能源局
- SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
Professional Standard - Petroleum
- SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
Korean Agency for Technology and Standards (KATS)
- KS I 0051-2019 General rules for scanning electron microscopy
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-1999 General rules for scanning electron microscopy
- KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
SCC
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
- 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
- VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
RU-GOST R
- GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
- GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
- GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
GSO
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
KR-KS
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
British Standards Institution (BSI)
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
American Society for Testing and Materials (ASTM)
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
Association of German Mechanical Engineers
- VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method
SEM,scanning electron microscope,,General SEM,SEM,,How long is the scanning electron microscope,SEM SEM SEM,The first scanning electron microscope,Environmental SEM SEM,Scanning electron microscope one,SEM together,1. Scanning Electron Microscope,SEM SEM,How long is scanning electron microscopy,scanning electron microscope primary electron,SEM-EDS,SEM Primary Particles,SEM General,What kind of scanning electron microscope is generally used,How to analyze scanning electron microscope
