General SEM

General SEM, Total:10 items.

The international standard classification for "General SEM" includes: .

The Chinese standard classification for "General SEM" includes: Electron optics and other physical optics instrument .

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National Metrological Technical Specifications of the People's Republic of China

• JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Machinery

• JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
• JB/T 6842-1993 Test Method of Scanning Electron Microscope

Professional Standard - Commodity Inspection

• SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

National Metrological Verification Regulations of the People's Republic of China

• JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

Korean Agency for Technology and Standards (KATS)

• KS I 0051-2019 General rules for scanning electron microscopy
• KS M 0044-1999 General rules for scanning electron microscopy
• KS I 0051-1999(2019) General rules for scanning electron microscopy

Japanese Industrial Standards Committee (JISC)

• JIS K 0132:1997 General rules for scanning electron microscopy

International Organization for Standardization (ISO)

• ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements

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