How many times is the scanning electron microscope generally
How many times is the scanning electron microscope generally, Total:20 items.
The international standard classification for "How many times is the scanning electron microscope generally" includes: Optical equipment .
The Chinese standard classification for "How many times is the scanning electron microscope generally" includes: Magnifier and microscope , Electron optics and other physical optics instrument .
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 27788-2011 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
- GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
Group Standards of the People's Republic of China
- T/COEMA 210-2024 Laser radar uses a multi-faceted scanning mirror
- T/COEMA 21O-2024 Polygonal scanning mirror for LIDAR
Professional Standard - Commodity Inspection
- SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Machinery
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
Korean Agency for Technology and Standards (KATS)
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-2024 General rules for scanning electron microscopy
- KS I 0051-2019 General rules for scanning electron microscopy
American Society for Testing and Materials (ASTM)
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
Japanese Industrial Standards Committee (JISC)
- JIS K 0149-1:2019 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
- JIS K 0132:1997 General rules for scanning electron microscopy
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
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