GB/T 27788-2011 in English

SUPERSEDED

Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification

Issued on:2011-12-30
Implemented on:2012-08-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $250.00
$243.00

Standard No:	GB/T 27788-2011
Document status:	SUPERSEDED
Superseded by:	GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
Superseded on:	2021-04-01
Title in English:	Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
Title in Chinese:	微束分析扫描电镜图像放大倍率校准导则
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2011-12-30
Implemented on:	2012-08-01
ICS Classification:	37.020-Optical equipment
Chinese Classification:	N32-Magnifier and microscope
Professional Classification:	GB-National Standard
Related Keywords:	microbeam analysis scanning electron microscopy guidelines special-purpose length-measuring scanning electron microscopes image magnification scopethis international standard electron microscope electron
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《GB/T 27788-2011微束分析扫描电镜图像放大倍率校准导则》由TC38（全国微束分析标准化技术委员会）归口，主管部门为国家标准化管理委员会。

Scope

This International Standard specifies methods for calibrating the magnification of scanning electron microscope (SEM) images using appropriate reference substances. This standard is limited to the calibration of magnifications due to the range of pitch sizes on the reference material. This standard does not apply to special-purpose length-measuring scanning electron microscopes.

More samples: JGJ 94-2008 GB 18306-2015 YD/T 3934-2021

Sample only — not a preview of GB/T 27788-2011

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