SEM

SEM, Total:10 items.

The international standard classification for "SEM" includes: Other methods of testing of metals , Optical equipment , Other standards related to analytical chemistry .

The Chinese standard classification for "SEM" includes: Metallographic testing method , Magnifier and microscope , Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer .

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Group Standards of the People's Republic of China

• T/CSTM 00346-2021 Automatic classification and statistics for the Inclusions in Steel —Energy dispersive spectrum method of scanning electron microscope
• T/CSTM 00229-2020 Identification of graphene materials in coatings materials Scanning Electron Microscope-Energy Dispersive Spectrometer method

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 30834-2022 Rating and classifying of inclusions in steel—Scanning electron microscope method
• GB/T 27788-2011 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
• GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
• GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

• GJB 5891.6-2006 Test method of loading material for initiating explosive device Part 6: Measurement of grain size Scanning electron microscopy

Japanese Industrial Standards Committee (JISC)

• JIS K 0132:1997 General rules for scanning electron microscopy

Association of German Mechanical Engineers

• VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method

SCC

• VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method

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