Electron microscope scanning parameters

Electron microscope scanning parameters, Total:165 items.

The international standard classification for "Electron microscope scanning parameters" includes: Other standards related to analytical chemistry , Linear and angular measurements in general , Metallic coatings , Optical equipment , Linear and angular measurements , Other methods of testing of metals , Man-made fibres , Other standards related to optics and optical measurements , Chemical analysis , Protection against crime .

The Chinese standard classification for "Electron microscope scanning parameters" includes: Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Material Protection , Magnifier and microscope , Oil shale , Metallographic testing method , Chemical fibre in general , Optical Measurement , Chemical Measurement , Basic standards and general methods , Crime judging technology .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 30834-2022 Rating and classifying of inclusions in steel—Scanning electron microscope method
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
GB/T 17722-1999 Gold-plated thickness measurement by SEM
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM
GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
GB/T 27788-2011 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
GB/T 16594-1996 Micron grade lenght measurement by SEM
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
GB/T 30834-2014 Standard test methods for rating and classifying inclusions in steel―Scanning Electron Microscope
GB/T 36422-2018 Man-made fiber—Test method for micro morphology and diameter—Scanning electron microscope method

Group Standards of the People's Republic of China

T/COEMA 21O-2024 Polygonal scanning mirror for LIDAR
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
T/SPSTS 030-2023 Graphene material sheet size measurement using scanning electron microscopy
T/CSTM 00346-2021 Automatic classification and statistics for the Inclusions in Steel —Energy dispersive spectrum method of scanning electron microscope
T/CSTM 00229-2020 Identification of graphene materials in coatings materials Scanning Electron Microscope-Energy Dispersive Spectrometer method
T/NLIA 004-2021 In-situ SEM tensile test method for additive manufactured aluminum alloy
T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
T/CNIA 0161-2023 Method for inspecting the microstructure and morphology of deformed aluminum and aluminum alloys Scanning electron microscopy method

Professional Standard - Commodity Inspection

SN/T 3009-2011 Identification of Seawater Corrosion on Metallic Surface by SEM
SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

Professional Standard - Machinery

JB/T 7503-1994 Thickness of Cross Section of Metal Coatings Scanning Electron Microscope Measuring Method
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 6842-1993 Test Method of Scanning Electron Microscope

National Metrological Technical Specifications of the People's Republic of China

JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China

JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

Military Standard of the People's Republic of China-General Armament Department

GJB 8288-2014 Verification regulation for ultra-high speed rotating mirror streak camera system
GJB 2666A-2018 Specification for scanning reflective beryllium mirrors
GJB 2666-1996 Specification for scanning reflective beryllium mirrors
GJB 737.11-1993 Test methods for pyrotechnic chemicals Particle size determination Scanning electron microscopy

Professional Standard - Education

JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0586-2020 General rules of analytical methods for confocal laser scanning microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

SY 0545-2012 Determination of Thermal Characteristic Parameters of Wax Precipitation in Crude Oil Differential Scanning Calorimetry
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY/T 0545-1995 Determination of Thermal Characteristic Parameters of Wax Precipitation in Crude Oil Differential Scanning Calorimetry
SY/T 0545-2012 Determination of Thermal Property Parameters of the Wax Precipitation in Crude Oil. Test Method by Differential Scanning Calorimetry
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms
DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

国家质量监督检验检疫总局

SN/T 4704-2016 Kinetic parameters using isothermal methods―Differential scanning calorimetry method

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
GB/T 38783-2020 Method of coating thickness determination for precious metalcomposites by scanning electron microscope

工业和信息化部

YS/T 1491-2021 Method for determination of sphericity of nickel-based high-temperature alloy powder by scanning electron microscopy

Professional Standard - Public Safety Standards

GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry

American Society for Testing and Materials (ASTM)

ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 14966:2019 Ambient air — Determination of numerical concentration of inorganic fibrous particles — Scanning electron microscopy method
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 28600:2011 Surface chemical analysis - Data transfer format for scanning-probe microscopy
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method

SCC

13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
DANSK DS/EN ISO 9220:1994 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
AWWA QTC98270 Count Matching In-situ Particle Counts to Scanning Electron Microscopic Counts for Treatment Facility Process Control
10/30199179 DC BS ISO 28600. Surface chemical analysis. Data transfer format for scanning-probe microscopy

Korean Agency for Technology and Standards (KATS)

KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2022 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification

GSO

BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
ISO 17097:2024 3-D human body scan data — Methods for the processing of human body scan data
BH GSO ISO 28600:2016 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
GSO ISO 28600:2013 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

British Standards Institution (BSI)

18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 17097:2024 3-D human body scan data. Methods for the processing of human body scan data
BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS ISO 14966:2019 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
18/30375050 DC BS ISO 14966. Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
BS ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

International Telecommunication Union (ITU)

ITU-R BT.1358-1-2007 Studio parameters of 625 and 525 line progressive television systems
ITU-R BT.1358-1 SPANISH-2007 Studio parameters of 625 and 525 line progressive television systems
ITU-R BT.1358-1 FRENCH-2007 Studio parameters of 625 and 525 line progressive television systems

ITU-R - International Telecommunication Union/ITU Radiocommunication Sector

ITU-R BT.1358-1998 Studio Parameters of 625 and 525 Line Progressive Scan Television Systems

Association of German Mechanical Engineers

VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method

BSI

DANSK DS/ISO 17097:2024 3-D human body scan data – Methods for the processing of human body scan data

Society of Motion Picture and Television Engineers (SMPTE)

SMPTE RP 86-1991 Video Record Parameters for 1-in Type C Helical-Scan Television Tape Recording
SMPTE 15M-1998 Television Analog Recording - 1-in Type B Helical Scan - Basic System Parameters
SMPTE ST 15M-1998 Television Analog Recording - 1-in Type B Helical Scan - Basic System Parameters
SMPTE 293M-2003 Television - 720 X 483 Active Line at 59.94-Hz Progressive Scan Production - Digital Representation

VDI - Verein Deutscher Ingenieure

VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method

SE-SIS

SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice
SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method

RU-GOST R

GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes

Association Francaise de Normalisation

NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness

Danish Standards Foundation

DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

German Institute for Standardization

DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022

European Committee for Standardization (CEN)

EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

BELST

STB 2210-2011 Nano-sized carbon and non-carbon materials and composites based on them. Method for determining parameters using scan electron microscopy measurements

Spanish Association for Standardization (UNE)

UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

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