JY/T 0582-2020 in English

VALID

General rules of analytical methods for the scanning probe microscope

Issued on:2020-09-29
Implemented on:2020-12-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $330.00
$321.00

Standard No:	JY/T 0582-2020
Document status:	VALID
Title in English:	General rules of analytical methods for the scanning probe microscope
Title in Chinese:	扫描探针显微镜分析方法通则
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2020-09-29
Implemented on:	2020-12-01
Professional Classification:	JY-Education
Related Keywords:	scanning probe microscope introduction standard overview probe microscope atomic force microscope conductor surface atomic force microscope general standard
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Introduction

Standard Overview and Technology Evolution

JY/T 0582-2020, as a general standard for scanning probe microscope (SPM) analysis methods, integrates the technical requirements of multiple national standards such as GB/T 27760-2011. This standard systematically regulates the standardized operating procedures of seven working modes, including contact mode and tapping mode, for the first time.

Classification and Principle of Core Instruments

Instrument Type	Working Principle	Resolution Range	Typical Applications
Scanning Tunneling Microscope (STM)	Quantum Tunneling Effect	0.1nm(lateral)	Atomic Structure of Conductor Surface
Atomic Force Microscope (AFM)	Probe-Sample Interaction Force	1nm(lateral)	Surface Morphology of Insulator

Detailed explanation of key operating specifications

Environmental control requirements

Chapter 5 of the standard clearly stipulates that the laboratory should maintain an ambient temperature of 20℃±5℃ and a relative humidity of ≤60%. Vibration interference must be controlled below 1μm amplitude.

Calibration process

Taking atomic force microscope as an example, Appendix B of the standard explains in detail:

Use standard grid samples for XY direction calibration, the deviation should be <4μm
Use step height standard samples in the Z direction, and the error must be controlled within ±2%
Force constant calibration requires thermal tuning method, repeat the measurement 3 times and take the average

Implementation recommendations

Data quality control

Standard Article 9.2.1 recommends:

Collect images of at least 3 different areas for each sample
The scanning size should include the macroscopic morphology of 500μm×500μm and the microscopic structure of 1μm×1μm
Force curve measurement requires baseline correction and thermal drift compensation

Troubleshooting

For the typical faults pointed out in Chapter 7:

Fault phenomenon	Possible cause	Solution
Image stripe noise	Probe contamination/vibration interference	Replace probe/activate isolation table
Drift in Z direction	Unbalanced thermal expansion	Measurement after 30 minutes of warm-up