Semiconductor Analytical Microscope

Semiconductor Analytical Microscope, Total:242 items.

The international standard classification for "Semiconductor Analytical Microscope" includes: Optical equipment , Physicochemical methods of analysis , Coals , Other standards related to analytical chemistry , Chemical analysis , Test conditions and procedures in general , Tobacco, tobacco products and related equipment .

The Chinese standard classification for "Semiconductor Analytical Microscope" includes: Magnifier and microscope , Electron optics and other physical optics instrument , Basic standards and general methods , Coal petrography , Electrochemical, thermochemistry and optical profile type analyzer , Special electronic technology material , Tobacco curing in general .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
GB/T 4937.35-2024 Semiconductor devices—Mechanical and climatic test methods—Part 35: Acoustic microscopy for plastic encapsulated electronic components
GB/T 22062-2008 Microscopes - Graticules for oculars
GB/T 19863-2005 Testing of stereomicroscopes
GB/T 19864.1-2005 Stereomicroscopes - Part 1: Stereomicroscopes for general use
GB/T 6948-1998 Microscopical determination of the reflectance of vitrinite in coal
GB/T 43846.2-2024 Microscopes—Designation of microscope objectives—Part 2: Chromatic correction
GB/T 30705-2014 Microbeam analysis―Electron probe microanalysis―Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
GB/T 19864.2-2013 Stereomicroscopes—Part 2:High performance microscopes
GB/T 43846.1-2024 Microscopes—Designation of microscope objectives—Part 1: Flatness of field/Plan
GB/T 6948-2008 Method of determining microscopically the reflectance of vitrinite in coal
GB/T 19864.1-2013 Stereomicroscopes—Part 1:Stereomicroscopes for general use
GB/T 19864.2-2005 Stereomicroscopes - Part 2: High performance microscopes
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 10155-1988 Stereomicroscope

Professional Standard - Machinery

JB/T 7816-1995 Stereomicroscope
JB/T 8230.11-1999 Microscopes.Graticules for oculars

Professional Standard - Education

JY/T 012-1996 General rules for metallographic microscopy
JY/T 0586-2020 General rules of analytical methods for confocal laser scanning microscope
JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
JY/T 0585-2020 General rules of analytical methods for the metallographic microscope
JY/T 0581-2020 General analysis rules for transmission electron microscope
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 010-1996 General rules for analytical scanning electron microscopy

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 22062-2020 Microscopes—Graticules for eyepieces
GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)
GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy

工业和信息化部

YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method

Taiwan Provincial Standard of the People's Republic of China

CNS 11018-1984 Method of Preparing Coal Samples for Microscopical Analysis by Reflected Light

Professional Standard - Petroleum

SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1529.1-2015 Microscope objective designation part 1: flat field

Group Standards of the People's Republic of China

T/CEMIA 030-2022 Positive photoresist developer for semiconductor manufacture

国家烟草专卖局

YC/T 409-2018 Determination of special-purpose fibers in cigarette paper-Microscopy analysis method

Defense Logistics Agency

DLA A-A-52040-1992 STEREOSCOPES, LENS, AERIAL PHOTOGRAPH INTERPRETATION (POCKET)
DLA A-A-52040 VALID NOTICE 1-2001 STEREOSCOPES, LENS, AERIAL PHOTOGRAPH INTERPRETATION (POCKET)
DLA A-A-52040 VALID NOTICE 2-2007 STEREOSCOPES, LENS, AERIAL PHOTOGRAPH INTERPRETATION (POCKET)

GSO

OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 11883:2016 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
GSO ISO 11883:2013 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
GSO ISO 15227:2015 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
BH GSO ISO 15227:2016 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
OS GSO ISO 11884-1:2013 Optics and Optical Instruments – Minimum requirements for Stereomicroscopes – Part 1 : Stereomicroscopes for general use
BH GSO ISO 11884-1:2015 Optics and Optical Instruments – Minimum requirements for Stereomicroscopes – Part 1 : Stereomicroscopes for general use
GSO ISO 19012-1:2015 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
BH GSO ISO 27911:2016 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
GSO ISO 11884-1:2013 Optics and Optical Instruments – Minimum requirements for Stereomicroscopes – Part 1 : Stereomicroscopes for general use
OS GSO ISO 11884-2:2013 Optics and optical instruments- Minmum requirements for stereomicroscopes- Part 2 high performance microscopes
BH GSO ISO 11884-2:2015 Optics and optical instruments- Minmum requirements for stereomicroscopes- Part 2 high performance microscopes
BH GSO ISO 19012-1:2016 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
OS GSO IEC 60749-35:2014 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
OS GSO ISO 7404-5:2013 Methods for the petrographic analysis of coals - Part 5: Method of determining microscopically the reflectance of vitrinite
BH GSO ISO 10934-1:2016 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy
OS GSO ISO 10934-1:2013 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO 24639:2024 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
GSO IEC 60749-35:2014 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
BH GSO ISO 11039:2015 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
OS GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate

Association Francaise de Normalisation

NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
X11-660:1983 Particle size analysis by optical microscope method. General indications on microscope.
NF X11-660:1983 Granulométrie - Analyse granulométrique par microscopie optique - Généralités sur le microscope.
NF EN 60749-35:2006 Dispositifs à semiconducteurs - Méthodes d'essai climatiques et mécaniques - Partie 35 : microscopie acoustique pour composants électroniques à boîtier plastique
NF EN ISO 20705:2020 Textiles - Analyse quantitative par microscopie - Principes généraux des essais
NF G06-008*NF EN ISO 20705:2020 Textiles - Quantitative microscopical analysis - General principles of testing
NF X11-661:1990 Particle size analysis. Determination of particle size of powders. Optical microscope method.
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF E48-660:1991 Hydraulic fluid systems. Fluids. Determination of solid particulate contamination by optical microscope and image analysis.

Japanese Industrial Standards Committee (JISC)

JIS B 7139-2:2008 Stereomicroscopes -- Part 2: Testing of stereomicroscopes
JIS B 7139-4:2008 Stereomicroscopes -- Part 4: Marking of stereomicroscopes
JIS B 7139-1:2008 Stereomicroscopes -- Part 1: Minimum requirements for stereomicroscopes
JIS B 7139:1997 Stereo microscopes
JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS T 10936-2:2014 Operation microscopes.Part 2: Light hazard from operation microscopes used in ocular surgery

SE-SIS

SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

International Organization for Standardization (ISO)

ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 11883:1997 Optics and optical instruments - Microscopes - Marking of stereomicroscopes
ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
ISO 19012-2:2013 Microscopes - Designation of microscope objectives - Part 2: Chromatic correction
ISO 9344:2016 Microscopes - Graticules for eyepieces
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO/DIS 19012-4 Microscopes — Designation of microscope objectives — Part 4: Polarization characteristics
ISO 11884-1:1998 Optics and optical instruments - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 19012-1:2013 Microscopes.Designation of microscope objectives .Part 1: Flatness of field/Plan
ISO 19012-1:2011 Microscopes - Designation of microscope objectives - Part 1: Flatness of field/Plan
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 19012-3:2015 Microscopes - Designation of microscope objectives - Part 3: Spectral transmittance
ISO 11884-2:1997 Optics and optical instruments - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 7404-5:2009 Methods for the petrographic analysis of coals - Part 5: Method of determining microscopically the reflectance of vitrinite
ISO 10934-1:2002 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
ISO 20705:2019 Textiles — Quantitative microscopical analysis — General principles of testing
ISO 10934:2020 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO 8036-1:1998 Optics and optical instruments - Microscopes - Part 1: Immersion oil for general use in light microscopy
ISO 8040:1986 Optics and optical instruments; Microscopes; Connecting dimensions of tube slides and tube slots
ISO 8040:2001 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 15362:2014 Stereomicroscopes - Information provided to the user

British Standards Institution (BSI)

BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 9344:2016 Microscopes. Graticules for eyepieces
BS ISO 9344:2011 Microscopes. Graticules for eyepieces
BS 7012-0:1989 Light microscopes - General introduction
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
BS ISO 7404-5:2009 Methods for the petrographic analysis of coals - Method of determining microscopically the reflectance of vitrinite
BS 7012-8:1997 Light microscopes - Graticules for eyepieces
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS 7012-10.4:1998 Light microscopes - Minimum requirements for stereo microscopes - Information provided to the user
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS CECC 00013:1985 Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
23/30444981 DC BS ISO 19012-4. Microscopes. Designation of microscope objectives - Part 4. Polarization characteristics
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 8040:2001 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections
20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS ISO 15362:2014 Stereomicroscopes. Information provided to the user
BS ISO 11039:2012 Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate

Korean Agency for Technology and Standards (KATS)

KS B 5614-1998 Stereo microscopes
KS B 5614-2013 Stereo microscopes
KS B 5614-2018 Stereo microscopes
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 19012-1:2011 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
KS B ISO 19012-1:2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS B 5612-2019 Small size biological microscopes
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B 5601-1995(2016) Micrometer microscopes
KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2021 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B ISO 10934-1:2004 Optics and optical instruments－Vocabulary for microscopy－Part 1：Light microscopy
KS B ISO 10934-1:2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS H ISO 13366-1-2006(2016) Milk－Enumeration of somatic cells－Part 1：Microscopic method
KS B ISO 8036-1:2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS B ISO 8036-1:2008 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS B ISO 8040:2006 Optics and optical instruments－Microscopes－Dimensions of tube slide and tube slot connections

German Institute for Standardization

DIN 50452-1:1995 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles
DIN EN 60749-35:2007-03 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006); German version EN 60749-35:2006
DIN 50452-1:1995-11 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles
DIN 58629-1:2006 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
DIN ISO 8040:2003 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections (ISO 8040:2001)

SCC

12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
ISO 8036:2015 Plus Redline Microscopes - Immersion liquids for light microscopy (includes Redline Version)
13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
DANSK DS/EN 60749-35:2007 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
CEI EN 60749-35:2012 Semiconductor devices - Mechanical and climatic test methods Part 35: Acoustic microscopy for plastic encapsulated electronic components
10/30165036 DC BS ISO 27911. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS EN ISO 13366-1:1997 Milk. Enumeration of somatic cells-Microscopic method
DANSK DS/ISO 7404-5:2009 Methods for the petrographic analysis of coals - Part 5: Method of determining microscopically the reflectance of vitrinite
07/30145814 DC BS ISO 7404-5. Methods for the petrographic analysis of coals. Part 5. Method of determining microscopically the reflectance of vitrinite
BS 6127-5:1981 Petrographic analysis of bituminous coal and anthracite-Method of determining microscopically the reflectance of vitrinite
AS 2856:1986 Coal - Maceral analysis
AS 2486:1989 Methods for microscopical determination of the reflectance of coal macerals
08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness

Military Standards (MIL-STD)

DOD A-A-54868-1993 MICROSCOPE, OPTICAL STEREOSCOPIC
DOD A-A-54200-1990 MAILING CASE SECTION, MICROSCOPE SLIDE

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B 5614-2023 Binocular stereo microscopes
KS B ISO 15227-2023 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
KS B ISO 10934-1-2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS B ISO 8036-1-2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy

HU-MSZT

MSZ 2657-1966 Grain size analysis microscopy
MNOSZ 5536-1956 Microscope object sockets and tubes

RO-ASRO

STAS 3974-1961 Semi-finished and finished fiber products for the paper and pulp industry. Quality microscopy analysis
STAS 7856-1967 Refractory raw materials and products. Microscopic analysis to determine mineralogy

Standard Association of Australia （SAA）

ISO 19012-4:2024 Microscopes - Designation of microscope objectives - Part 4: Polarization characteristics

AENOR

UNE 32301:1995 SOLID MINERAL FUELS. PETROGRAPHIC ANALYSIS METHODS. METHOD FOR DETERMINING MICROSCOPICALLY THE REFLECTANCE OF VITRINITE.

American Society for Testing and Materials (ASTM)

ASTM D3997-97(2004) Standard Practice for Preparing Coke Samples for Microscopical Analysis by Reflected Light
ASTM D3997-97 Standard Practice for Preparing Coke Samples for Microscopical Analysis by Reflected Light
ASTM D2797/D2797M-09 Standard Practice for Preparing Coal Samples for Microscopical Analysis by Reflected Light
ASTM D2798-11a Standard Test Method for Microscopical Determination of the Vitrinite Reflectance of Coal

RU-GOST R

GOST R 55659-2013 Methods for the petrographic analysis of coals. Part 5. Method of determining microscopically the reflectance of vitrinite
GOST 7702.1-1974 Poultry meat. Methods for chemical and microscopic analysis of meat freshness

CZ-CSN

CSN 73 1331-1974 Microscopical analysis of the air-void systém in hardened concrete
CSN 75 7712-1998 Water quality - Biological analysis - Determination of bioseston
CSN 75 7711-1987 Water Quality Microscopical biological qualitative and quantitative analysis

ES-UNE

UNE-EN 60749-35:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006) (Endorsed by AENOR in January of 2007.)

Danish Standards Foundation

DS/EN 60749-35:2007 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
DS/ISO 7404-5:2009 Methods for the petrographic analysis of coals - Part 5: Method of determining microscopically the reflectance of vitrinite

ZA-SANS

SANS 7404-5:1994 Methods for the petrographic analysis of bituminous coal and anthracite Part 5: Method of determining microscopically the reflectance of vitrinite

European Committee for Standardization (CEN)

EN ISO 20705:2020 Textiles - Quantitative microscopical analysis - General principles of testing (ISO 20705:2019)

IN-BIS

IS 3099 Pt.1-1992 Microscopy—Specification for glass slides and glass slides Part 1 Microscope slides
IS 3099 Pt.2-1992 Microscopy — Slides and glass slides — Specification Part 2 Microscope slides

International Electrotechnical Commission (IEC)

IEC 62779-4:2020 Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope

Lithuanian Standards Office

LST EN 60749-35-2007 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006)

PL-PKN

PN G04524-1992 Hard coal Method for the petrographic analysis Determination microscopically reflectance of vitrinite