Efficient Semiconductor Microscopy

Efficient Semiconductor Microscopy, Total:96 items.

The international standard classification for "Efficient Semiconductor Microscopy" includes: Optical equipment , Coals .

The Chinese standard classification for "Efficient Semiconductor Microscopy" includes: Magnifier and microscope , Electron optics and other physical optics instrument , Coal petrography .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 19864.2-2013 Stereomicroscopes—Part 2:High performance microscopes
GB/T 19864.2-2005 Stereomicroscopes - Part 2: High performance microscopes
GB/T 19863-2005 Testing of stereomicroscopes
GB/T 19864.1-2005 Stereomicroscopes - Part 1: Stereomicroscopes for general use
GB/T 19864.1-2013 Stereomicroscopes—Part 1:Stereomicroscopes for general use
GB/T 6948-2008 Method of determining microscopically the reflectance of vitrinite in coal
GB/T 43846.2-2024 Microscopes—Designation of microscope objectives—Part 2: Chromatic correction
GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
GB/T 22056-2008 Microscopes - Marking of objectives and eyepieces
GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
GB/T 10155-1988 Stereomicroscope
GB/T 6948-1998 Microscopical determination of the reflectance of vitrinite in coal

Professional Standard - Machinery

JB/T 7816-1995 Stereomicroscope
JB/T 7398.1-1994 Symbols for Microscope Objectives and Eyepieces

Group Standards of the People's Republic of China

T/CEMIA 036-2023 High alkali concentration negative photoresist developer for semiconductor display

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 13-1992 Verification Regulations for High Temperature Microscopy

Professional Standard - Electron

SJ 1977-1981 Detail specification for high frequency field-effect transistors,Type CS4
SJ 1981-1981 Detail specification for high frequency field-effect transistors,Type CS8
SJ 1982-1981 Detail specification for high frequency field-effect transistors,Type CS9
SJ 1979-1981 Detail specification for high frequency field-effect transistors,Type CS6
SJ 1978-1981 Detail specification for high frequency field-effect transistors,Type CS5
SJ 1980-1981 Detail specification for high frequency field-effect transistors,Type CS7

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 22056-2018 Microscopes—Marking of objectives and eyepieces

British Standards Institution (BSI)

BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
BS 7012-4.1:1998 Light microscopes - Specification for microscope objective and nosepiece screw threads - Screw thread type RMS (4/5 in x 1/36 in)
BS 7012-10.4:1998 Light microscopes - Minimum requirements for stereo microscopes - Information provided to the user
BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS CECC 00013:1985 Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS ISO 8578:2012 Microscopes. Marking of objectives and eyepieces
BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice

SE-SIS

SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

Japanese Industrial Standards Committee (JISC)

JIS B 7139-2:2008 Stereomicroscopes -- Part 2: Testing of stereomicroscopes
JIS B 7139-4:2008 Stereomicroscopes -- Part 4: Marking of stereomicroscopes
JIS B 7139-1:2008 Stereomicroscopes -- Part 1: Minimum requirements for stereomicroscopes
JIS B 7139:1997 Stereo microscopes
JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
JIS B 7252:2015 Marking of microscope objectives and eyepieces
JIS B 7252:2001 Marking of microscope objectives and eyepieces

Korean Agency for Technology and Standards (KATS)

KS B 5614-1998 Stereo microscopes
KS B 5614-2013 Stereo microscopes
KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B 5614-2018 Stereo microscopes
KS B ISO 11884-2-2021 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B 5612-2019 Small size biological microscopes
KS B ISO 8578:2006 Optics and optical instruments-Microscopes-Marking of objectives and eyepieces
KS B ISO 8578:2016 Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS B 5619-1999 Microscopes-Eyepiece reticles
KS B ISO 10934-2-2011(2016) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 10934-2-2011(2021) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy

Military Standards (MIL-STD)

DOD A-A-54868-1993 MICROSCOPE, OPTICAL STEREOSCOPIC

International Organization for Standardization (ISO)

ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
ISO 11884-2:1997 Optics and optical instruments - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 11883:1997 Optics and optical instruments - Microscopes - Marking of stereomicroscopes
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO/DIS 19012-4 Microscopes — Designation of microscope objectives — Part 4: Polarization characteristics
ISO 11884-1:1998 Optics and optical instruments - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 8578:2012 Microscopes - Marking of objectives and eyepieces

GSO

BH GSO ISO 11883:2016 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
BH GSO ISO 11884-2:2015 Optics and optical instruments- Minmum requirements for stereomicroscopes- Part 2 high performance microscopes
OS GSO ISO 11884-2:2013 Optics and optical instruments- Minmum requirements for stereomicroscopes- Part 2 high performance microscopes
GSO ISO 15227:2015 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
GSO ISO 11883:2013 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
BH GSO ISO 15227:2016 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
OS GSO ISO 11884-1:2013 Optics and Optical Instruments – Minimum requirements for Stereomicroscopes – Part 1 : Stereomicroscopes for general use
BH GSO ISO 11884-1:2015 Optics and Optical Instruments – Minimum requirements for Stereomicroscopes – Part 1 : Stereomicroscopes for general use
GSO ISO 19012-1:2015 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
OS GSO ISO 8578:2015 Microscopes -- Marking of objectives and eyepieces

KR-KS

KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 15227-2023 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B 5614-2023 Binocular stereo microscopes

SCC

ISO 8036:2015 Plus Redline Microscopes - Immersion liquids for light microscopy (includes Redline Version)
BS ISO 19012-1:2011 Microscopes. Designation of microscope objectives-Flatness of field/Plan
BS 3836-2:1965 Specification for components of microscopes. Dimensions and marking of microscopes
BS 7012-16:1997 Light microscopes-Diameter of interchangeable eyepieces for microscopes with tube length 160 mm

CZ-CSN

CSN 72 1084-1974 Methodics of pyrogenic microscopy of anorganic substances

Standard Association of Australia （SAA）

ISO 19012-4:2024 Microscopes - Designation of microscope objectives - Part 4: Polarization characteristics

HU-MSZT

MNOSZ 5536-1956 Microscope object sockets and tubes

Association Francaise de Normalisation

NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique
NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging

German Institute for Standardization

DIN 50452-1:1995 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles

Others: Efficient Semiconductor Microscopy,Efficient Electron Microscopy,Efficient Metallographic Microscope