Semiconductor Elemental Analysis

Semiconductor Elemental Analysis, Total:16 items.

The international standard classification for "Semiconductor Elemental Analysis" includes: .

The Chinese standard classification for "Semiconductor Elemental Analysis" includes: .

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General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 4298-1984 The activation analysis method for the determination of elemental impurities in semiconductor silicon materials

International Electrotechnical Commission (IEC)

• IEC 60747-14-2:2000 Semiconductor devices - Part 14-2: Semiconductor sensors; Hall elements
• IEC 60747-14-1:2000 Semiconductor devices - Part 14-1: Semiconductor sensors; General and classification

British Standards Institution (BSI)

• BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
• BS IEC 60747-14-2:2000 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements

GSO

• GSO IEC 60747-14-2:2014 Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
• BH GSO IEC 60747-14-2:2016 Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
• OS GSO ISO 17247:2013 Coal - Ultimate analysis

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

• IEEE 59-1962 SEMICONDUCTOR RECTIFIER COMPONENTS

RU-GOST R

• GOST R 53355-2009 Solid mineral fuels. Ultimate analysis

GOSTR

• GOST R 53355-2018 Solid mineral fuel. Ultimate analysis

PL-PKN

• PN T01503 ArkusZ01-1972 Semiconduc?or devices Dimension Device A1
• PN T01503 ArkusZ50-1973 Semiconductor devicesDimensions Case C9

Korean Agency for Technology and Standards (KATS)

• KS C 7013-1985 TYPE DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICES
• KS C 7013-1971(2000) TYPE DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICES

SCC

• DIN 50451-7:2018 Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric acid by ICP-MS

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