Semiconductor Test Analysis

Semiconductor Test Analysis, Total:200 items.

The international standard classification for "Semiconductor Test Analysis" includes: Optoelectronics. Laser equipment , Testing of metals , Testing of metals in general , Radiation measurements , Aerospace electric equipment and systems .

The Chinese standard classification for "Semiconductor Test Analysis" includes: Technical management , Technical management , Laser device , Semimetal and semiconductor material analysis method , Metal physical property test method , Nuclear instrument and detector in general , Electronic components .

Military Standard of the People's Republic of China-General Armament Department

GJB 128B-2021 Semiconductor discrete device test methods
GJB 128-1986 Aerial photographic specification for military topographic mapping
GJB 3157-1998 Semiconductor discrete device failure analysis methods and procedures
GJB 3233-1998 Semiconductor integrated circuit failure analysis procedures and methods
GJB 128A-1997 Semiconductor discrete device test methods

Group Standards of the People's Republic of China

T/CNIA 0143-2022 Ultrapure Resin Vessels for Trace Impurity Analysis of Semiconductor Materials
T/QGCML 3970-2024 Semiconductor workshop metal dust intelligent detection and analysis system
T/CVIA 134-2024 Semiconductor laser device testing methods
T/ZZB Q041-2022 Mixed signal semiconductor device test equipment
T/SHDSGY 113-2022 Radio frequency front end semiconductor test software
T/ZACA 041-2022 Mixed signal semiconductor device test equipment

National Metrological Verification Regulations of the People's Republic of China

JJG(电子) 31010-2007 Verification Regulations for Precision Analyzer of Semiconductor Parameters

Professional Standard - Electron

SJ/T 2215-2015 Measuring methods for semiconductor photocouplers
SJ 2749-1987 Method of measurement for semiconductor laser diodes
SJ/T 2749-2016 Semiconductor Laser Diode Test Methods
SJ 20234-1993 Verification regulation of model HP4145A semiconductor parameter analyzer
SJ 2355.1-1983 General procedures of measurement for light-emitting deivces
SJ 20744-1999 General rule of infrared absorption spectral analysis for the impurity concentration in semiconductor materials
SJ/Z 3206.13-1989 General rules for emision spectrum analysis for semiconductor materials
SJ 2215.1-1982 General procedures of measurement for semiconductor photocouplers
SJ 2214.1-1982 General procedures of measurement for semiconductor photodiodes and phototransistors
SJ 20788-2000 Measurment method for thermal impedance of semiconductor diodes
SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes

National Metrological Technical Specifications of the People's Republic of China

JJF 2009-2022 Calibration Specification for Semiconductor Parameters Precision Analyzers

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 5201-1994 Test procedures for semiconductor charged particle detectors
GB/T 13974-1992 methods for semiconductor device curve tracers
GB/T 20521.4-2025 Semiconductor Devices - Part 14-4: Semiconductor Sensors - Semiconductor Accelerometers
GB/T 6616-2023 Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge
GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials
GB/T 31359-2015 Test methods of semiconductor lasers
GB/T 4298-1984 The activation analysis method for the determination of elemental impurities in semiconductor silicon materials
GB/T 14140-2025 Test method for measuring diameter of semiconductor wafer
GB/T 1550-1997 methods for measuring conductivity type of extrinsic semiconducting materials
GB/T 20521.5-2025 Semiconductor Devices - Part 14-5: Semiconductor Sensors - PN Junction Semiconductor Temperature Sensors

Professional Standard - Aerospace

Magyar Szabványügyi Testület

MNOSZ 700-3.lap-1955 Semiconductor Model Analysis Test Laboratory Sample Preparation
MSZ 700/36.lap-1961 Semiconductor testing experiments in coal mines
MSZ 700/23.lap-1965 STMicroelectronics tests coke
MSZ 700/24.lap-1965 STMicroelectronics Coke Test
MSZ 700/26.lap-1961 STMicroelectronics testing. Rapid method for determination of ash content
MNOSZ 700-8.lap-1955 STMicroelectronics tests carbon and jaundice
MSZ 700/27.lap-1962 STMicroelectronics test flash definition
MSZ 700/41.lap-1961 STMicroelectronics testing. Quickly determine total sulfur content

Institute of Electrical and Electronics Engineers (IEEE)

IEEE 759-1984 Test procedures for semiconductor X-ray energy spectrometers
IEEE No 256-1963 IEEE Test Procedure for Semiconductor Diodes
IEEE 660-1986 Semiconductor memory test pattern language

Korean Agency for Technology and Standards (KATS)

KS C 2607-2002 TESTING METHODS OF SEMICONDUCTOR
KS C IEC 60749-7-2020 Semiconductor devices — Mechanical and climatic test methods —Part 7: Internal moisture content measurement and the analysis of other residual gases
KS M 1804-2008(2018) Test method of hydrofluoric acid for semi-conductor
KS C 6045-1991(2001) TESTING METHODS FOR SEMICONDUCTOR RECTIFIER DIODES
KS C 6045-1986 TESTING METHODS FOR SEMICONDUCTOR RECTIFIER DIODES
KS C IEC 60749-7:2020 Semiconductor devices — Mechanical and climatic test methods —Part 7: Internal moisture content measurement and the analysis of other residual gases
KS C 6045-2002 TESTING METHODS FOR SEMICONDUCTOR RECTIFIER DIODES

British Standards Institution (BSI)

BS IEC 60747-18-1:2019 Semiconductor devices. Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors
BS EN 61207-7:2013 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
BS EN 61207-7:2014 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
BS EN 61207-7:2013(2015) Expression of performance of gas analyzers Part 7 : Tuneable semiconductor laser gas analyzers
BS EN IEC 60749-7:2026 Semiconductor devices. Mechanical and climatic test methods - Internal moisture content measurement and the analysis of other residual gases
BS IEC 60747-14-4:2011 Semiconductor devices. Discrete devices. Semiconductor accelerometers
BS EN IEC 63364-1:2022 Semiconductor devices. Semiconductor devices for IoT system - Test method of sound variation detection
BS EN IEC 63378-3:2025 Thermal standardization on semiconductor packages - Thermal circuit simulation models of discrete semiconductor packages for transient analysis
BS IEC 60747-14-1:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - General and classification - Sensor generals and classification for semiconductor sensors
BS IEC 62951-7:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
BS EN 60747-15:2004 Discrete semiconductor devices. Isolated power semiconductor devices
BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
BS IEC 60747-14-1:2000 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-General and classification-Sensor generals and classification for semiconductor sensors
BS IEC 60747-14-2:2000 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
BS IEC 62951-5:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for thermal characteristics of flexible materials
25/30539990 DC Draft BS EN 63364-2 Semiconductor devices - Semiconductor devices for IoT system - Part 2: Test method of semiconductor photon sources incorporating human factors for wearable equipment
BS IEC 63378-2-1:2024 Thermal standardization on semiconductor packages - 3D thermal simulation models of semiconductor packages for steady-state analysis. Discrete packages
22/30443678 DC BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods - Part 34-1. Power cycling test for power semiconductor module
BS IEC 60747-14-3:2001 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-Pressure sensors
BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
BS IEC 60747-6:2000 Discrete semiconductor devices and integrated circuits - Thyristors
BS EN 60749-7:2011 Semiconductor devices. Mechanical and climatic test methods. Internal moisture content measurement and the analysis of other residual gases

German Institute for Standardization

DIN 50452-1:1995-11 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles
DIN EN 61207-7:2015-07 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (IEC 61207-7:2013); German version EN 61207-7:2013 / Note: Applies in conjunction with DIN EN 61207-1 (2011-04).
DIN EN 62880-1 E:2014-08 Semiconductor devices - Semiconductor wafer level reliability - Part 1: Copper stress migration test method
DIN 50452-3:1995-10 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 3: Calibration of optical particle counters
DIN IEC 60747-11:1992 Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
DIN 50452-2:2009-10 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 2: Determination of particles by optical particle counters
DIN EN 62417:2010-12 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
DIN 50441-2:1998 Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 2: Testing of edge profile
DIN 50452-2 E:2008-04 Draft Document - Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 2: Determination of particles by optical particle counters
DIN EN 62415:2010-12 Semiconductor devices - Constant current electromigration test (IEC 62415:2010); German version EN 62415:2010
DIN 50441-1:1996 Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 1: Thickness and thickness variation
DIN 50452-2 E:2008 Draft Document - Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 2: Determination of particles by optical particle counters
DIN 50441-5:2001 Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 5: Terms of shape and flatness deviation
DIN EN IEC 63364-1:2025-01 Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection (IEC 63364-1:2022); German version EN IEC 63364-1:2023
DIN EN 60749-44:2017-04 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016
DIN EN 60749-7:2012 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (IEC 60749-7:2011); German version EN 60749-7:2011
DIN EN IEC 62969-2:2018-09*VDE 0884-69-2:2018-09 Semiconductor devices – Semiconductor interface for automotive vehicles
DIN EN IEC 62969-4:2019-03*VDE 0884-69-4:2019-03 Semiconductor devices – Semiconductor interface for automotive vehicles
DIN EN 62779-1:2017-01*VDE 0884-79-1:2017-01 Semiconductor devices – Semiconductor interface for human body communication
DIN 50448:1998 Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulating semi-conductor slices using a capacitive probe
DIN EN IEC 62969-1:2018-08*VDE 0884-69-1:2018-08 Semiconductor devices – Semiconductor interface for automotive vehicles
DIN EN 62779-3:2017-03*VDE 0884-79-3:2017-03 Semiconductor devices – Semiconductor interface for human body communication
DIN EN IEC 62969-3:2018-12*VDE 0884-69-3:2018-12 Semiconductor devices – Semiconductor interface for automotive vehicles
DIN EN 60749-38:2008-10 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008
DIN EN 62416:2010-12 Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010); German version EN 62416:2010
DIN EN 62779-2:2017-01*VDE 0884-79-2:2017-01 Semiconductor devices – Semiconductor interface for human body communication

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JEP140-2002 Beaded Thermocouple Temperature Measurement of Semiconductor Packages

Association Francaise de Normalisation

NF EN IEC 63364-1:2023 Semiconductor devices - Semiconductor devices for IDO system - Part 1: Acoustic variation detection test method
NF C46-251-7*NF EN 61207-7:2014 Expression of performance of gas analyzers - Part 7 : tunable semiconductor laser gas analyzers
NF C96-364-1*NF EN IEC 63364-1:2023 Semiconductor devices - Semiconductor devices for IoT system - Part 1 : test method of sound variation detection
NF EN 61207-7:2014 Gas analyzer performance expression - Part 7: Tunable semiconductor laser gas analyzers
NF EN 62417:2010 Semiconductor Devices – Mobile Ion Testing for Metal Oxide Field Effect Semiconductor Transistors (MOSFETs)
NF EN 60749-38:2008 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
NF EN 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: test method for the effects of a single event (SEE) irradiated by a neutron beam for semiconductor devices
NF EN 62415:2010 Semiconductor Devices - Constant Current Electromigration Test
NF C86-378-3*NF EN IEC 63378-3:2025 Thermal standardization on semiconductor packages - Part 3 : thermal circuit simulation models of discrete semiconductor packages for transient analysis
NF EN 62416:2010 Semiconductor Devices – Hot Carrier Testing on MOS Transistors
NF C96-022-44*NF EN 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44 : neutron beam irradiated single event effect (SEE) test method for semiconductor devices

National Standardisation Body (ASRO)

STAS 11066/2-1980 THYRISTORS Test methods

Comitato Elettrotecnico Italiano

CEI EN 61207-7/EC:2014 Expression of performance of gas analyzers Part 7: Tunable semiconductor laser gas analyzers
CEI EN 61207-7:2014 Expression of performance of gas analyzers Part 7: Tunable semiconductor laser gas analyzers
CEI EN IEC 63364-1:2023 Semiconductor devices - Semiconductor devices for IoT system Part 1: Test method of sound variation detection
CEI EN 62417:2011 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
CEI EN 62415:2011 Semiconductor devices - Constant current electromigration test
CEI EN 60749-38:2010 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
CEI EN 60749-44:2017 Semiconductor devices - Mechanical and climatic test methods Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
CEI EN 60749-7:2012 Semiconductor devices - Mechanical and climatic test methods Part 7: Internal moisture content measurement and the analysis of other residual gases
CEI EN 62416:2011 Semiconductor devices - Hot carrier test on MOS transistors
CEI EN IEC 63378-3:2025 Thermal standardization on semiconductor packages – Part 3: Thermal circuit simulation models of discrete semiconductor packages for transient analysis

Defense Logistics Agency

DLA MIL-STD-750 F CHANGE 1-2013 TEST METHODS FOR SEMICONDUCTOR DEVICES
DLA MIL-STD-750 F-2012 TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES

Spanish Association for Standardization (UNE)

UNE-EN 61207-7:2013/AC:2015 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (Endorsed by AENOR in September of 2015.)
UNE-EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (Endorsed by AENOR in January of 2014.)
UNE-EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
UNE-EN 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.)
UNE-EN IEC 63364-1:2023 Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (Endorsed by Asociación Española de Normalización in March of 2023.)
UNE-EN 60749-38:2008 Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)
UNE-EN 62415:2010 Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
UNE-EN 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)
UNE-EN 300386 V1.5.1:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)
UNE-EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)

Bureau of Indian Standards

IS 7412-1974 Life test of semiconductor devices
IS 9816-1981 General requirements and classifications for semiconductor device testing
IS 11425-1985 Test procedures for semiconductor charged particle detectors

Czech Standards Institute (UNMZ)

CSN 35 1540-1979 Tests of power semiconductor converters
CSN 35 8701-1975 Terminology of semiconductors and semiconductor devices

International Electrotechnical Commission (IEC)

IEC 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
IEC 60747-18-1:2019 Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
IEC 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
IEC 61207-7:2013/COR1:2015 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers; Corrigendum 1
IEC 60749-34-1:2025 PRV Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
IEC 63364-1:2022 Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
IEC 62951-7:2019 Semiconductor devices – Flexible and stretchable semiconductor devices – Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor (Edition 1.0)
IEC 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
IEC 60333:1970 Test procedures for semiconductor detectors for ionizing radiation
IEC 63378-3:2025 Thermal standardization on semiconductor packages - Part 3: Thermal circuit simulation models of discrete semiconductor packages for transient analysis
IEC 63378-2-1:2024 Thermal standardization on semiconductor packages - Part 2-1: 3D thermal simulation models of semiconductor packages for steady-state analysis - Discrete packages
IEC 60747-14-4:2011 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
IEC 60747-14-1:2000 Semiconductor devices - Part 14-1: Semiconductor sensors; General and classification
IEC 60333:1983 Test procedures for semiconductor charged-particle detectors

Swedish Institute for Standards

SS-EN 61207-7:2014 Expression of performance of gas analyzers - Part 7: Tunable semiconductor laser gas analyzers
SS-EN 62417:2011 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
SS-EN IEC 63364-1:2023 Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
SS-EN 62416:2011 Semiconductor devices - Hot carrier test on MOS transistors
SS-EN 60749-38:2009 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory

European Committee for Electrotechnical Standardization（CENELEC）

EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
EN IEC 60749-7:2026 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
EN 62415:2010 Semiconductor devices - Constant current electromigration test
EN IEC 63378-3:2025 Thermal standardization on semiconductor packages - Part 3: Thermal circuit simulation models of discrete semiconductor packages for transient analysis
EN 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

Danish Standards Foundation

DANSK DS/EN IEC 63364-1:2023 Semiconductor devices – Semiconductor devices for IoT system – Part 1: Test method of sound variation detection
DANSK DS/EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
DANSK DS/EN 61207-7/AC:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
DANSK DS/EN 62415:2010 Semiconductor devices - Constant current electromigration test
DS/EN 62415:2010 Semiconductor devices - Constant current electromigration test
DANSK DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
DANSK DS/EN 60749-38:2008 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
DS/EN 60749-38:2008 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
DANSK DS/EN 60749-44:2016 Semiconductor devices – Mechanical and climatic test methods – Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
DS/EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
DANSK DS/EN IEC 63378-3:2025 Thermal standardization on semiconductor packages – Part 3: Thermal circuit simulation models of discrete semiconductor packages for transient analysis

American Society for Testing and Materials (ASTM)

ASTM F1191-88 Guidelines for Radiation Testing of Semiconductor Memory
ASTM F43-99 Semiconductor material resistivity test method
ASTM F1894-98(2011) Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness
ASTM F1894-98 Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness
ASTM F1894-98(2003) Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness

Finnish Standards Institute

SFS-EN IEC 63364-1:2023 Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
SFS-EN IEC 63378-3:2025 Thermal standardization on semiconductor packages - Part 3: Thermal circuit simulation models of discrete semiconductor packages for transient analysis

Military Standards (MIL-STD)

MIL-STD-750-2A Mechanical test methods for semiconductor devices

Yugoslav Association for Standardization

JUS N.R1.500-1980 Semiconductor components ACCEPTANCE Electrical tests

Gosstandart of Russia

GOST 26239.0-1984 Semiconductor silicon, raw materials for its production and quartz. General requirements for methods of analysis

The Directorate General of Specifications and Metrology (DGSM)

OS GSO IEC 60749-38:2014 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory

GCC Standardization Organization

GSO IEC 60747-14-5:2015 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
GSO IEC 60749-38:2014 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
GSO IEC 60747-15:2014 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
OS GSO IEC 63275-1:2024 Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability
GSO IEC 60749-44:2021 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

Lithuanian Standards Office

LST EN 62417-2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
LST EN 60749-38-2008 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008)

Türk Standardları Enstitüsü

TS 2643-1977 Test Procedures For Bemiconductor Detectors For Ionizing Radiation

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