Scanning Spectroscopy Analysis

Scanning Spectroscopy Analysis, Total:57 items.

The international standard classification for "Scanning Spectroscopy Analysis" includes: Other standards related to analytical chemistry , Optical equipment , Chemical analysis , Protection against crime .

The Chinese standard classification for "Scanning Spectroscopy Analysis" includes: Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Basic standards and general methods , Crime judging technology .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 17361-2013 Microbeam analysis—Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary
GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air
GB/T 35097-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrosmetry—Determination of numberical concentration of inorganic fibrous particles in ambient air

Fujian Provincial Standard of the People's Republic of China

DB35/T 1778-2018 foot shape measurement scanning analysis method
DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Group Standards of the People's Republic of China

T/CSTM 00346-2021 Automatic classification and statistics for the Inclusions in Steel —Energy dispersive spectrum method of scanning electron microscope
T/CMAIA 002-2023 3D intelligent skin scanner
T/CSTM 00229-2020 Identification of graphene materials in coatings materials Scanning Electron Microscope-Energy Dispersive Spectrometer method

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Professional Standard - Education

JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
JY/T 010-1996 General rules for analytical scanning electron microscopy

National Metrological Technical Specifications of the People's Republic of China

JJF 1712-2018 Calibration Specification for Thin Layer Chromatography Scanners

Professional Standard - Machinery

JB/T 5478-1991 Manual Scanning Photoelectric Direct-reading Spectrometer

Professional Standard - Public Safety Standards

GA/T 1418-2017 Analysis of elements in glass evidence in Forensics—Scanning electron microscope/energy dispersive X-ray spectrometry(SEM/EDX)

未注明发布机构

DIN 51007-2 E:2020-11 Thermal analysis - Differential thermal analysis (DTA) and Differential scanning calorimetry (DSC) - Part 2: Fast differential scanning calorimetry (f-DSC); Chip calorimetry

National Metrological Verification Regulations of the People's Republic of China

JJG(航空) 044-1989 Verification rules for single-scan oscillographic polarographs

Professional Standard - Petroleum

SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

International Organization for Standardization (ISO)

ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 7111:1987 Plastics; Thermogravimetry of polymers; Temperature scanning method

American Society for Testing and Materials (ASTM)

ASTM E1683-02(2014)e1 Standard Practice for Testing the Performance of Scanning Raman Spectrometers
ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1683-02(2022) Standard Practice for Testing the Performance of Scanning Raman Spectrometers
ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry

GSO

BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary

SCC

BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
DANSK DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
NACE AMPP TM21610-2022 Potentiodynamic Scans: Material Preparation, Data Acquisition and Analysis

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS A 5555-2-2023 3-D digital human body scan data — Part 2: Methods and considerations for an analysis of human scan data

British Standards Institution (BSI)

BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

Korean Agency for Technology and Standards (KATS)

KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary

Association Francaise de Normalisation

NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

German Institute for Standardization

DIN 51007-2:2021 Thermal analysis - Differential thermal analysis (DTA) and Differential scanning calorimetry (DSC) - Part 2: Fast differential scanning calorimetry (f-DSC); Chip calorimetry
DIN 51007-2:2021-10 Thermal analysis - Differential thermal analysis (DTA) and Differential scanning calorimetry (DSC) - Part 2: Fast differential scanning calorimetry (f-DSC); Chip calorimetry

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