Scanning Electron Microscopy and Optical Microscopy

Scanning Electron Microscopy and Optical Microscopy, Total:318 items.

The international standard classification for "Scanning Electron Microscopy and Optical Microscopy" includes: Optical equipment , Optics and optical measurements in general , Optical measuring instruments , Chemical analysis , Ophthalmic equipment , Other standards related to optics and optical measurements , Protection against crime .

The Chinese standard classification for "Scanning Electron Microscopy and Optical Microscopy" includes: Electron optics and other physical optics instrument , Magnifier and microscope , Optical metrological instrument , Chemical Measurement , Basic standards and general methods , Medical optical instrument and endoscope , Optical Measurement , Oil shale , Crime judging technology .

Professional Standard - Commodity Inspection

SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

Group Standards of the People's Republic of China

T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/SPSTS 030-2023 Graphene material sheet size measurement using scanning electron microscopy

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes

Professional Standard - Machinery

JB/T 9333-1999 Microscopes -- Immersion oil for general use in light microscopy
JB/T 7398.2-1994 Microscope Optical Connection Dimensions
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 9340-1999 Light-section microscope
JB/T 7794-1995 Polarizing Microscope
JB/T 8230.1-1999 Light microscope -- vocabulary
JB/T 6842-1993 Test Method of Scanning Electron Microscope

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Professional Standard - Education

JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
JY/T 0586-2020 General rules of analytical methods for confocal laser scanning microscope

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

Professional Standard - Medicine

YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 26600-2024 Microscopes—Immersion liquid for light microscopy
GB/T 42659-2023 Surface chemical analysis―Scanning probe microscopy―Determination of geometric quantities using SPM:Calibration of measuring systems
GB/T 26600-2011 Microscopes—Immersion liquids for light microscopy
GB 9247-1988 Microscopes--Series of condensers
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
GB/T 24665-2009 Polarizing microscope
GB/T 9247-2008 Microscopes—Condensers
GB/T 27668-2023 Microscopes—Vocabulary for light microscopy
GB/T 9247-1996 Microscopes-Condensers

机械工业部

JB/T 8230.1-1995 Light microscopy terminology
JB/T 8230.10-1995 Microscope condenser series

Professional Standard - Public Safety Standards

GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

工业和信息化部

SJ/T 11759-2020 Test method for determining the aspect ratio of solar cell's grid line electrode-confocal laser scanning microscope

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

SCC

13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
BS ISO 10934-1:2002 Optics and optical instruments. Vocabulary for microscopy-Light microscopy
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
10/30165036 DC BS ISO 27911. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
BS 7012-16:1997 Light microscopes-Diameter of interchangeable eyepieces for microscopes with tube length 160 mm
BS ISO 19012-2:2009 Optics and photonics. Designation of microscope objectives-Chromatic correction
DIN ISO 8578 E:2002 Draft Document - Optics and optical instruments - Microscopes - Marking of objectives and eyepieces (ISO 8578:1997)
BS 7012-1:1990 Light microscopes-Specification for the magnifying power of microscope imaging components
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
ISO 8036:2015 Plus Redline Microscopes - Immersion liquids for light microscopy (includes Redline Version)
BS ISO 10936-2:2001 Optics and optical instruments. Operation microscopes-Light hazard from operation microscopes used in ocular surgery
BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
10/30199182 DC BS ISO 11039. Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
BS 7012-8:1990 Light microscopes-Specification for surface marked graticules for eyepieces
BS 7012-6:1990 Light microscopes-Specification for spectral filters
DANSK DS/EN ISO 9220:1994 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness
BS ISO 19012-1:2007 Optics and photonics. Designation of microscope objectives-Flatness of field/plan
DIN ISO 8578:2003 Optics and optical instruments - Microscopes - Marking of objectives and eyepieces (ISO 8578:1997 + ISO 8578:1997/Cor. 1:2002)

Korean Agency for Technology and Standards (KATS)

KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS D 2713-2021 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS M 2617-2022 Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS M 2617-2007(2017) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS B ISO 8576-2006(2016) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS M 2617-2007(2022) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 10934-1:2004 Optics and optical instruments－Vocabulary for microscopy－Part 1：Light microscopy
KS B ISO 10934-1:2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS B ISO 8576:2006 Optics and optical instruments－Microscopes－Reference system of polarized light microscopy
KS B ISO 8578-2016(2021) Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS B ISO 8578-2021 Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS B ISO 8576-2006(2021) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS B ISO 8036-1:2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS B ISO 8036-1:2008 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS B ISO 10934-2-2011(2021) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 10934-2-2021 Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 10934-2-2011(2016) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 10934-2:2011 Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 8040:2006 Optics and optical instruments－Microscopes－Dimensions of tube slide and tube slot connections
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 8039:2016 Optics and optical instruments Microscopes Magnification
KS B ISO 8039:2006 Optics and optical instruments Microscopes Magnification
KS B ISO 8039-2016(2021) Optics and optical instruments Microscopes Magnification
KS B 5619-2019 Microscopes — Eyepiece reticles
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2022 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D 2714-2006 Scanning probe microscope-Method for lateral force microscope
KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS B ISO 11884-2-2021 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
ISO 11883:1997 Optics and optical instruments - Microscopes - Marking of stereomicroscopes
ISO 8577:1997 Optics and optical instruments - Microscopes - Spectral filters
ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
ISO 10934-1:2002 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
ISO 10934:2020 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
ISO 8038:1985 Optics and optical instruments; Microscopes; Screw thread for objectives
ISO 8578:1997 Optics and optical instruments - Microscopes - Marking of objectives and eyepieces
ISO 8036-1:1998 Optics and optical instruments - Microscopes - Part 1: Immersion oil for general use in light microscopy
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO 9344:1996 Optics and optical instruments - Microscopes - Graticules for eyepieces
ISO 10937:1997 Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces for microscopes with tube length 160 mm
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Part 2: Advanced techniques in light microscopy
ISO 10937:2000 Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 8040:1986 Optics and optical instruments; Microscopes; Connecting dimensions of tube slides and tube slots
ISO 8578:1997/Cor 1:2002 Optics and optical instruments - Microscopes - Marking of objectives and eyepieces; Technical Corrigendum 1
ISO 8040:2001 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 8039:1997 Optics and optical instruments - Microscopes - Magnification
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 11039:2012 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO 11884-2:1997 Optics and optical instruments - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 18115-2:2021 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
ISO 11884-1:1998 Optics and optical instruments - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO 19012-2:2009 Optics and photonics - Designation of microscope objectives - Part 2: Chromatic correction
ISO 28600:2011 Surface chemical analysis - Data transfer format for scanning-probe microscopy
ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS K 0147-2:2017 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy
JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance

American Society for Testing and Materials (ASTM)

ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy

GSO

BH GSO ISO 27911:2016 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
BH GSO ISO 8576:2016 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
BH GSO ISO 15227:2016 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
BH GSO ISO 11883:2016 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
GSO ISO 11883:2013 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
GSO ISO 15227:2015 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
OS GSO ISO 10934-1:2013 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy
BH GSO ISO 10934-1:2016 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy
GSO ISO 8578:2015 Microscopes -- Marking of objectives and eyepieces
GSO ISO 27911:2013 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
OS GSO ISO 10934-2:2013 Optics and optical instruments -- Vocabulary for microscopy -- Part 2: Advanced techniques in light microscopy
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 10934-1:2013 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy
OS GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
BH GSO ISO 11039:2015 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
BH GSO ISO 10937:2015 Optics and optical instruments-Microscopes – Diameter of interchangeable eyepieces.
GSO ISO 10937:2013 Optics and optical instruments-Microscopes – Diameter of interchangeable eyepieces.
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
GSO ISO 28600:2013 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
GSO ISO 8576:2015 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
BH GSO ISO 28600:2016 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
OS GSO ISO 11884-2:2013 Optics and optical instruments- Minmum requirements for stereomicroscopes- Part 2 high performance microscopes
BH GSO ISO 11884-2:2015 Optics and optical instruments- Minmum requirements for stereomicroscopes- Part 2 high performance microscopes
GSO ISO 8577:2015 Optics and optical instruments -- Microscopes -- Spectral filters
BH GSO ISO 8577:2016 Optics and optical instruments -- Microscopes -- Spectral filters
OS GSO ISO 8577:2015 Optics and optical instruments -- Microscopes -- Spectral filters
BH GSO ISO 11884-1:2015 Optics and Optical Instruments – Minimum requirements for Stereomicroscopes – Part 1 : Stereomicroscopes for general use
OS GSO ISO 11884-1:2013 Optics and Optical Instruments – Minimum requirements for Stereomicroscopes – Part 1 : Stereomicroscopes for general use
GSO ISO 10934-2:2013 Optics and optical instruments -- Vocabulary for microscopy -- Part 2: Advanced techniques in light microscopy
GSO ISO 11884-1:2013 Optics and Optical Instruments – Minimum requirements for Stereomicroscopes – Part 1 : Stereomicroscopes for general use
GSO ISO 10936-2:2016 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery

British Standards Institution (BSI)

BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS ISO 10934-1:2003 Optics and optical instruments - Vocabulary for microscopy - Light microscopy
BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
BS 7012-15:1997 Light microscopes - Marking of objectives and eyepieces
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
BS 7012-8:1997 Light microscopes - Graticules for eyepieces
BS ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Advanced techniques in light microscopy
BS ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS 7012-1:1998 Light microscopes - Specification for the magnifying power of microscope imaging components
BS ISO 8040:2001 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections
BS 7012-4.1:1998 Light microscopes - Specification for microscope objective and nosepiece screw threads - Screw thread type RMS (4/5 in x 1/36 in)
18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS ISO 10936-2:2010 Optics and photonics - Operation microscopes - Light hazard from operation microscopes used in ocular surgery
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS EN ISO 14880-1:2005 Optics and photonics - Microlens array - Vocabulary
BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
BS 7012-6:1998 Light microscopes. Specification for spectral filters
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B ISO 15227-2023 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 10934-1-2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS B ISO 8576-2023 Optics and optical instruments — Microscopes — Reference system of polarized light microscopy
KS B ISO 8578-2016 Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS B ISO 8036-1-2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS B ISO 8039-2016 Optics and optical instruments Microscopes Magnification
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery

German Institute for Standardization

DIN ISO 8577:2001 Optics and optical instruments - Microscopes - Spectral filters (ISO 8577:1997)
DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
DIN 58629-1:2006 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
DIN ISO 8576:2002 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
DIN ISO 8040:2003 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections (ISO 8040:2001)
DIN ISO 10937:2003 Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces (ISO 10937:2000)
DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

Military Standards (MIL-STD)

DOD A-A-54868-1993 MICROSCOPE, OPTICAL STEREOSCOPIC
DOD A-A-54970-1994 MICROSCOPE, OPTICAL
DOD A-A-50852 A-1985 MICROSCOPE, OPTICAL, BINOCULAR
DOD A-A-51796 A-1991 MICROSCOPE, OPTICAL (BINOCULAR)

PT-IPQ

E E 15-1971 Optical microscope

Defense Logistics Agency

DLA MIL-M-37869-1978 MICROSCOPE, OPTICAL, BINOCULAR

HU-MSZT

MNOSZ 5534-1956 Microscope light mirror

Association Francaise de Normalisation

NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging
NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF S12-023:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. CONNECTING DIMENSIONS OF TUBE SLIDES AND TUBE SLOTS.
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF X11-660:1983 Granulométrie - Analyse granulométrique par microscopie optique - Généralités sur le microscope.
X11-660:1983 Particle size analysis by optical microscope method. General indications on microscope.
NF X21-069-2:2010 Surface chemical analysis - Vocabulary - Part 2 : terms used in scanning-probe microscopy.
NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy

RU-GOST R

GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
GOST 28489-1990 Light microscopes. Terms and definitions
GOST 4.451-1986 Product-quality index system. Light microscopes. Nomenclature of indices
GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes

VDI - Verein Deutscher Ingenieure

VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method

DIN

DIN ISO 9344:2001 Optics and optical instruments - Microscopes - Graticules for eyepieces (ISO 9344:1996)

PL-PKN

PN N53040-1988 Light microscopes Optical mechanical dimensions

RO-ASRO

STAS 7353/5-1982 MICROSCOPES Basic optical parameters
STAS 6851/2-1975 MICROSCOPES Basic optical dimensions
STAS 7353/4-1982 MICROSCOPES Basic optical dimensions
STAS SR ISO 8040 Optics and optioal instruments - Mlcroscopes - Connecting dimensions of tube slides and tubes slois

SE-SIS

SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

Danish Standards Foundation

DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery

European Committee for Standardization (CEN)

EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

Spanish Association for Standardization (UNE)

UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)