SEM and Optics

SEM and Optics, Total:120 items.

The international standard classification for "SEM and Optics" includes: Man-made fibres , Linear and angular measurements in general , Metallic coatings , Optical equipment , Other standards related to analytical chemistry , Linear and angular measurements , Other methods of testing of metals , Chemical analysis , Protection against crime , Ophthalmic equipment .

The Chinese standard classification for "SEM and Optics" includes: Electron optics and other physical optics instrument , Chemical Measurement , Chemical fibre in general , Material Protection , Electrochemical, thermochemistry and optical profile type analyzer , Metallographic testing method , Basic standards and general methods , Crime judging technology , Medical optical instrument and endoscope .

Professional Standard - Commodity Inspection

SN/T 3009-2011 Identification of Seawater Corrosion on Metallic Surface by SEM
SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

Group Standards of the People's Republic of China

T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/CSTM 00346-2021 Automatic classification and statistics for the Inclusions in Steel —Energy dispersive spectrum method of scanning electron microscope
T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy

Professional Standard - Machinery

JB/T 5478-1991 Manual Scanning Photoelectric Direct-reading Spectrometer
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 16594-1996 Micron grade lenght measurement by SEM
GB/T 36422-2018 Man-made fiber—Test method for micro morphology and diameter—Scanning electron microscope method
GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
GB/T 30834-2014 Standard test methods for rating and classifying inclusions in steel―Scanning Electron Microscope
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM
GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
GB/T 42659-2023 Surface chemical analysis―Scanning probe microscopy―Determination of geometric quantities using SPM:Calibration of measuring systems
GB/T 17722-1999 Gold-plated thickness measurement by SEM
GB/T 30834-2022 Rating and classifying of inclusions in steel—Scanning electron microscope method

Military Standard of the People's Republic of China-General Armament Department

GJB 8381-2015 Combined method of streak photography and laser interferometry for cylinder test of explosives
GJB 2666-1996 Specification for scanning reflective beryllium mirrors
GJB 2666A-2018 Specification for scanning reflective beryllium mirrors

工业和信息化部

SJ/T 11759-2020 Test method for determining the aspect ratio of solar cell's grid line electrode-confocal laser scanning microscope

Professional Standard - Education

JY/T 0586-2020 General rules of analytical methods for confocal laser scanning microscope
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 010-1996 General rules for analytical scanning electron microscopy

Professional Standard - Public Safety Standards

GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
GA/T 1418-2017 Analysis of elements in glass evidence in Forensics—Scanning electron microscope/energy dispersive X-ray spectrometry(SEM/EDX)
GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

未注明发布机构

VDI VDE 5565 Blatt 1-2023 Optical coherence tomography (OCT) - Process descriptions
VDI VDE 5565 Blatt-1 E:2022-02 Optical coherence tomography (OCT) Process descriptions

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Professional Standard - Medicine

YY/T 1895-2023 Intravascular optical coherence tomograph

SCC

13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
VDI/VDE 5565 BLATT 1:2023 Optical coherence tomography (OCT) — procedure descriptions
10/30165036 DC BS ISO 27911. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
VDI/VDE 2634 BLATT 2-2012 Optical 3-D measuring systems — imaging systems with area probing
VDI/VDE 2634 BLATT 2-2012 Optical 3-D measuring systems — imaging systems with area probing
10/30199182 DC BS ISO 11039. Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate

American Society for Testing and Materials (ASTM)

ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization

Korean Agency for Technology and Standards (KATS)

KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D 2713-2021 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope

Japanese Industrial Standards Committee (JISC)

JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

International Organization for Standardization (ISO)

ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
ISO/DIS 16971-1:2011 Ophthalmic instruments — Optical coherence tomographs — Part 1: Optical coherence tomographs for the posterior segment of the human eye
ISO/CD 16971-1 Ophthalmic instruments — Optical coherence tomographs — Part 1: Optical coherence tomographs for the posterior segment of the human eye
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 8577:1997 Optics and optical instruments - Microscopes - Spectral filters
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 11039:2012 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
ISO 18115-2:2021 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy

GSO

BH GSO ISO 27911:2016 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
GSO ISO 27911:2013 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
OS GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
BH GSO ISO 11039:2015 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
BH GSO ISO 28600:2016 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
GSO ISO 28600:2013 Surface chemical analysis -- Data transfer format for scanning-probe microscopy

British Standards Institution (BSI)

BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
23/30451302 DC Draft BS ISO 16971-1 Ophthalmic instruments . Optical coherence tomographs. Part 1: Optical coherence tomographs for the posterior segment of the human eye
BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

Association of German Mechanical Engineers

VDI/VDE 2634 Blatt 2-2002 Optical 3D-measuring systems - Optical systems based on area scanning
VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method

German Institute for Standardization

DIN ISO 8577:2001 Optics and optical instruments - Microscopes - Spectral filters (ISO 8577:1997)

RU-GOST R

GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope

VDI - Verein Deutscher Ingenieure

VDI/VDE 2634 Blatt 2-2011 Optical 3-D measuring systems - Optical systems based on area scanning

Association for Information and Image Management (AIIM)

AIIM MS52-1991 Recommended Practice for the Requirements and Characteristics of Documents Intended for Optical Scanning