scanning microscope
scanning microscope, Total:29 items.
The international standard classification for "scanning microscope" includes: Other standards related to optics and optical measurements .
The Chinese standard classification for "scanning microscope" includes: Optical Measurement , Chemical Measurement , Electron optics and other physical optics instrument .
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
Professional Standard - Education
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
- JY/T 0586-2020 General rules of analytical methods for confocal laser scanning microscope
- JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
National Metrological Verification Regulations of the People's Republic of China
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
Professional Standard - Machinery
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
Korean Agency for Technology and Standards (KATS)
- KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
- KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-2024 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-2019 General rules for scanning electron microscopy
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS I 0051-1999 General rules for scanning electron microscopy
Belgian Standards Institute
- NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)
British Standards Institution (BSI)
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GCC Standardization Organization
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
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