scanning electron microscope and electron probe
scanning electron microscope and electron probe, Total:9 items.
The international standard classification for "scanning electron microscope and electron probe" includes: .
The Chinese standard classification for "scanning electron microscope and electron probe" includes: .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
Fujian Provincial Standard of the People's Republic of China
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
National Metrological Technical Specifications of the People's Republic of China
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
Professional Standard - Education
- JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
International Organization for Standardization (ISO)
- ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
Korean Agency for Technology and Standards (KATS)
- KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
SCC
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
Electron Probe and Scanning Electron Microscope,scanning electron microscope and electron probe,Scanning Electron Microscope and Electron Probe...,Scanning Electron Microscope and Electron Probe,Electron Probe and SEM x,% of scanning electron microscope and optical microscope
