Portable Scanning Tunneling Microscope
Portable Scanning Tunneling Microscope, Total:39 items.
The international standard classification for "Portable Scanning Tunneling Microscope" includes: Chemical analysis , Properties of surfaces .
The Chinese standard classification for "Portable Scanning Tunneling Microscope" includes: Chemical Measurement , Electron optics and other physical optics instrument , Basic standards and general methods .
Taiwan Provincial Standard of the People's Republic of China
- CNS 6600-1980 Portable Polarizing Microscope for Sampling and Determining Incombustible Matter in Coal and Rock-Dust Mixture
National Metrological Technical Specifications of the People's Republic of China
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
Professional Standard - Machinery
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
Group Standards of the People's Republic of China
- T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
Professional Standard - Commodity Inspection
- SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/Z 26083-2010 Determination for Copper(Ⅱ) octaalkoxyl-substituted phthalocyanine on graphite surface (scanning tunneling microscope)
Professional Standard - Education
- JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
American Society for Testing and Materials (ASTM)
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
Korean Agency for Technology and Standards (KATS)
- KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
- KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS I 0051-2019 General rules for scanning electron microscopy
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-1999 General rules for scanning electron microscopy
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
TIA - Telecommunications Industry Association
- TIA-573C000-1998 Sectional Specification for Field-Portable Optical Microscopes
- TIA/EIA-573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes
British Standards Institution (BSI)
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
RU-GOST R
- GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
SCC
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
- 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
GSO
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
KR-KS
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
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