Advantages of scanning tunneling microscope
Advantages of scanning tunneling microscope, Total:9 items.
The international standard classification for "Advantages of scanning tunneling microscope" includes: .
The Chinese standard classification for "Advantages of scanning tunneling microscope" includes: .
American Society for Testing and Materials (ASTM)
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
Korean Agency for Technology and Standards (KATS)
- KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
RU-GOST R
- GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
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