Scanning Electron Microscope Electron Probe

Scanning Electron Microscope Electron Probe, Total:82 items.

The international standard classification for "Scanning Electron Microscope Electron Probe" includes: Other standards related to analytical chemistry , Other standards related to optics and optical measurements , Chemical analysis , Optical equipment .

The Chinese standard classification for "Scanning Electron Microscope Electron Probe" includes: Electrochemical, thermochemistry and optical profile type analyzer , Optical Measurement , Basic standards and general methods , Electron optics and other physical optics instrument , Chemical Measurement .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 20726-2025 Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 43661-2024 Surface chemical analysis—Scanning probe microscopy—Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
GB/T 42659-2023 Surface chemical analysis―Scanning probe microscopy―Determination of geometric quantities using SPM:Calibration of measuring systems
GB/T 17365-1998 Method of preparation for samples of metal and alloy in electron probe microanalysis

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes

Fujian Provincial Standard of the People's Republic of China

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope

Professional Standard - Machinery

JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

Professional Standard - Petroleum

SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Korean Agency for Technology and Standards (KATS)

KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2006 Scanning probe microscope-Method for lateral force microscope
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2024 General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary

International Organization for Standardization (ISO)

ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 11039:2012 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
ISO 18115-2:2021 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
ISO 28600:2011 Surface chemical analysis - Data transfer format for scanning-probe microscopy
ISO 11775:2015 Surface chemical analysis - Scanning-probe microscopy - Determination of cantilever normal spring constants
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary

Association of German Mechanical Engineers

VDI VDE 2656 Blatt 1-2019 Determination of geometrical quantities by using of scanning probe microscopes
VDI VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes Calibration of measurement systems
VDI/VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems
VDI/VDE 2656 Blatt 1-2006 Bestimmung geometrischer Messgroessen mit Rastersondermikroskopen - Kalibrierung von Messsystemen
VDI/VDE 2656 BLATT 1-2019 Determination of geometric measurements with scanning probe microscopes - calibration of measuring systems

British Standards Institution (BSI)

13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
10/30199182 DC BS ISO 11039. Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
10/30199179 DC BS ISO 28600. Surface chemical analysis. Data transfer format for scanning-probe microscopy
BS ISO 18115-2:2010 Surface chemical analysis - Vocabulary - Terms used in scanning-probe microscopy
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 11775:2015 Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants

American Society for Testing and Materials (ASTM)

ASTM E1813-07 Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 0147-2:2017 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy
JIS K 0182:2023 Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants

GCC Standardization Organization

GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
GSO ISO 28600:2013 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 11775:2021 Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 11039:2015 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
BH GSO ISO 28600:2016 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 11775:2022 Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate

Gosstandart of Russia

GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration

Association Francaise de Normalisation

NF X21-069-2:2010 Surface chemical analysis - Vocabulary - Part 2 : terms used in scanning-probe microscopy.

American Water Works Association (AWWA)

AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope