Kelvin probe electron microscope

Kelvin probe electron microscope, Total:10 items.

The international standard classification for "Kelvin probe electron microscope" includes: Other standards related to optics and optical measurements .

The Chinese standard classification for "Kelvin probe electron microscope" includes: Optical Measurement .

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Military Standard of the People's Republic of China-General Armament Department

• GJB 9727-2020 Langmuir Probe Detector Specifications

National Metrological Technical Specifications of the People's Republic of China

• JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes

Professional Standard - Education

• JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
• GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM

Korean Agency for Technology and Standards (KATS)

• KS V 7398-2007(2012) Marine bronze 20 K globe valves
• KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
• KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
• KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope

CZ-CSN

• CSN ON 81 3790-1966 Electric feeler

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