Sign In |Help & Support
ALL SECTORS
  • ALL SECTORS
  • GB(National Standard)
  • CB(Shipping)
  • CECS(Engineering Construction)
  • CJ(Urban Construction)
  • CY(News and Publication)
  • DB(Provincial Standard)
  • DL(Electricity & Power)
  • DZ(Geology & Mineralogy)
  • FZ(Spinning & Textile)
  • GA(Public Security)
  • HB(Aviation)
  • HG(Chemical Industry)
  • HJ(Environmental Protection)
  • JB(Machinery)
  • JC(Building Materials)
  • JG(Building & Construction)
  • JJ(Metering)
  • JT(Highway & Transportation)
  • LY(Forestry)
  • MT(Coal)
  • NB(Energy)
  • NY(Agriculture)
  • QB(Light Industry)
  • QC(Automobile & Vehicle)
  • QJ(Aerospace)
  • SH(Petrochemical)
  • SJ(Electronics)
  • SL(Water Resources)
  • SN(Commodity Inspection)
  • SY(Oil & Gas)
  • TB(Railway & Train)
  • YB(Ferrous Metallurgy)
  • YC(Tobacco)
  • YD(Telecommunication)
  • YY(Medical Device)
Database: 365,228(8 Aug 2026)

How to use the probe

How to use the probe, Total:132 items.

The international standard classification for "How to use the probe" includes: Optical measuring instruments , Other standards related to analytical chemistry , Optical equipment , Other methods of testing of metals , Other standards related to optics and optical measurements , Testing of metals .

The Chinese standard classification for "How to use the probe" includes: Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Semimetal and semiconductor material analysis method , Optical Measurement , Metal physical property test method , Technical management .


Taiwan Provincial Standard of the People's Republic of China

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 17360-2008 Quantitative analysis method of low content Si and Mn in steel with electron probe microanalysis
  • GB/T 17506-1998 The method of electron probe microanalysis as corrosive layer on ferrous metals of ship
  • GB/T 15616-1995 Qantitative method for electron probe microanalysis of metals and alloys
  • GB/T 17363-1998 Method of quantitative electron probe microanalysis on gold products
  • GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
  • GB/T 17360-1998 Method of quantitative electron probe microanalysis on low contents of Si and Mn in steels
  • GB/T 17506-2008 The analysis method of corrosive layer on ferrous metals of ship with EPMA
  • GB/T 15246-2002 Quantitative analysis of sulfide minerals by electron probe microanalysis
  • GB/T 15616-2008 Quantitative method for electron probe microanalysis of metals and alloys
  • GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
  • GB/T 15075-1994 Method for testing EPMA instrument
  • GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
  • GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
  • GB/T 15074-1994 General guide for EPMA quantitative analysis
  • GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis
  • GB/T 15074-2008 General guide of quantitative analysis by EPMA
  • GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA)

Professional Standard - Education

  • JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope

Professional Standard - Non-ferrous Metal

  • YS/T 602-2007 Test method for resistivity of zone-refined germanium ingot using a two-point probe
  • YS/T 602-2017 Test method for resistivity of zone-refined germanium ingot using a two-point probe

Yunnan Provincial Standard of the People's Republic of China

  • DB53/T 443-2012 Fire technical appraisal method Electron probe analysis method

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
  • GB/T 39518-2020 Geometrical product specifications (GPS)—Guidelines for the evaluation of coordinate measuring machine (CMM) test uncertainty for CMMs using single and multiple stylus contacting probing systems

Professional Standard - Electron

  • SJ/T 31123-1994 Requirements of readiness and methods of inspection and assessment for automatic multi-point test probes
  • SJ/T 10481-1994 Test method for resistivity of silicon epitaxial layers by area contacts three-probe techniques
  • SJ/T 31122-1994 Requirements of readiness and methods of inspection and assessment for four-point probes
  • SJ/T 10315-1992 Generic specification for Four-point probe

国家能源局

  • SY/T 6027-2019 Quantitative analysis of rocks and minerals by electron probe microanalysis

Group Standards of the People's Republic of China

  • T/ZGIA 001-2019 Graphene test method for the determination of powder conductivity four-probe method
  • T/CSTM 00252-2020 Test method for carbon fiber electrical resistivity by Four-probe method
  • T/CASAS 019-2021 Test method for resistivity of micro and nano metal sintered compact: four probe method

Professional Standard - Petroleum

  • SY/T 6027-2012 Quantitative Analysis Method of Rock and Mineral by Electron Probe Microanalysis
  • SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals

国家质量监督检验检疫总局

  • SN/T 4821-2017 Detection method for bovine complex vertebral malformation by TaqMan PCR

Professional Standard - Ferrous Metallurgy

  • YB/T 6166-2024 Graphene film sheet resistance measurement four-probe method

海关总署

  • SN/T 5315-2021 Test method of photocatalytic ceramics for self-cleaning - Fluorescence probe method

Hebei Provincial Standard of the People's Republic of China

  • DB13/T 5255-2020 Determination of square resistance of graphene conductive ink by four-probe method

Professional Standard - Aviation

  • HB 8422-2014 Quantitative detection method of EPMA for trace elements in alloys

Military Standard of the People's Republic of China-General Armament Department

  • GJB 5309.22-2004 Test methods for pyrotechnics Part 22: Probe method for determination of explosion synchronicity

Association Francaise de Normalisation

  • NF ISO 11938:2012 Microbeam analysis - Electron microprobe analysis (Castaing microprobe) - Elemental mapping analysis methods using wavelength dispersive spectrometry
  • NF S91-111:1998 Dental explorers.
  • NF A92-801-4*NF EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4 : determination of chemical composition by electron probe microanalysis (EPMA).

American Society for Testing and Materials (ASTM)

  • ASTM D6230-98(2005) Standard Test Method for Monitoring Ground Movement Using Probe-Type Inclinometers
  • ASTM E499-95(2006) Standard Test Methods for Leaks Using the Mass Spectrometer Leak Detector in the Detector Probe Mode
  • ASTM D5334-00(2004) Standard Test Method for Determination of Thermal Conductivity of Soil and Soft Rock by Thermal Needle Probe Procedure
  • ASTM D5334-22 Standard Test Method for Determination of Thermal Conductivity of Soil and Rock by Thermal Needle Probe Procedure
  • ASTM D5334-22ae1 Standard Test Method for Determination of Thermal Conductivity of Soil and Rock by Thermal Needle Probe Procedure
  • ASTM D5334-22a Standard Test Method for Determination of Thermal Conductivity of Soil and Rock by Thermal Needle Probe Procedure
  • ASTM F2170-16 Standard Test Method for Determining Relative Humidity in Concrete Floor Slabs Using in situ Probes
  • ASTM F397-93(1999) Standard Test Method for Resistivity of Silicon Bars Using a Two-Point Probe
  • ASTM D7046-11 Standard Guide for Use of the Metal Detection Method for Subsurface Exploration
  • ASTM F390-98(2003) Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array
  • ASTM D6230-13 Standard Test Method for Monitoring Ground Movement Using Probe-Type Inclinometers
  • ASTM D6230-98 Standard Test Method for Monitoring Ground Movement Using Probe-Type Inclinometers
  • ASTM D8153-22 Standard Test Method for Determination of Soil Water Contents Using a Dielectric Permittivity Probe
  • ASTM D5334-00 Standard Test Method for Determination of Thermal Conductivity of Soil and Soft Rock by Thermal Needle Probe Procedure
  • ASTM B667-97(2009) Standard Practice for Construction and Use of a Probe for Measuring Electrical Contact Resistance
  • ASTM F390-11 Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array
  • ASTM B667-97(2014) Standard Practice for Construction and Use of a Probe for Measuring Electrical Contact Resistance
  • ASTM B667-97(2019) Standard Practice for Construction and Use of a Probe for Measuring Electrical Contact Resistance
  • ASTM B667-97(2003)e1 Standard Practice for Construction and Use of a Probe for Measuring Electrical Contact Resistance
  • ASTM D5334-08 Standard Test Method for Determination of Thermal Conductivity of Soil and Soft Rock by Thermal Needle Probe Procedure

Korean Agency for Technology and Standards (KATS)

  • KS B 0535-2005 Method for measurement ox performancecharacteristics of ultrasonic probes
  • KS P 7112-2006 Dental explorers
  • KS P ISO 7551:2013 Dental absorbent points
  • KS D 0260-1999 TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
  • KS D 2714-2016 Scanning probe microscope-Method for lateral force microscope
  • KS D 2714-2021 Scanning probe microscope-Method for lateral force microscope
  • KS L 1619-2003 Test methods for measuring resistivity of electrically conductive ceramic thin films with four point probe method
  • KS D 2714-2006 Scanning probe microscope-Method for lateral force microscope
  • KS L 1619-2013 Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
  • KS C 0256-2022 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
  • KS C 0256-2002 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
  • KS C 0256-2002(2022) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
  • KS L 1619-2013(2018) Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
  • KS D ISO 16592-2021 Microbeam analysis-Electron probe microanalysis-Guidelines for determining the carbon content of steels using a calibration curve method
  • KS D 0260-1989(1994) TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
  • KS C IEC 61290-10-3-2003(2018) Basic test method for optical fiber amplifier - Part 10-3: Multi-channel parameters - Probe method

ECIA - Electronic Components Industry Association

  • EIA-364-25C-1998 TP-25C Probe Damage Test Procedure for Electrical Connectors (FSC 5935; Should Be Used Instead of MIL-STD-1344@ Method 2006.1)

CEN - European Committee for Standardization

International Organization for Standardization (ISO)

  • ISO 7492:1983 Dental explorers
  • ISO 7551:1996 Dental absorbent points
  • ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy

European Committee for Standardization (CEN)

RU-GOST R

GOST

  • GOST 22024-1976 Concrete. Method of thermal conductivity determination by means of a probe

Japanese Industrial Standards Committee (JISC)

  • JIS H 0602:1995 Testing method of resistivity for silicon crystals and silicon wafers with four-point probe
  • JIS H 0612:1975 Testing methods of resistivity for single crystal silicon wafers with four point probe
  • JIS T 5402 ERRATUM 1:2000 Dental explorers (Erratum 1)
  • JIS K 7194:1994 Testing method for resistivity of conductive plastics with a four-point probe array
  • JIS R 1637:1998 Test method for resistivity of conductive fine ceramic thin films with a four-point probe array

GSO

  • GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • GSO ISO 20487:2021 Traditional Chinese medicine — Test method of single-use acupuncture needles for electrical stimulation
  • BH GSO ISO 20487:2022 Traditional Chinese medicine — Test method of single-use acupuncture needles for electrical stimulation
  • OS GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • BH GSO ISO 11938:2017 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • GSO IEC 61290-10-3:2014 Optical amplifiers - Test methods - Part 10-3: Multichannel parameters - Probe methods
  • BH GSO ISO 16592:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for determining the carbon content of steels using a calibration curve method

SCC

  • DANSK DS/ISO 20487:2019 Traditional Chinese medicine – Test method of single-use acupuncture needles for electrical stimulation
  • DANSK DS/EN 61290-10-3:2003 Optical amplifiers - Test methods - Part 10-3: Multichannel parameters - Probe methods
  • ETSI TR 103 581:2019 Use of measurement detectors in radio measurement methods
  • BS ISO 16592:2006 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method

British Standards Institution (BSI)

  • BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
  • 18/30324477 DC BS ISO 20487. Traditional chinese medicine. Test method of single-use acupuncture needle for electrical stimulation
  • BS EN 1971-2:2012 Copper and copper alloys. Eddy current test for measuring defects on seamless round copper and copper alloy tubes. Test with an internal probe on the inner surface
  • BS EN 1971-2:2011 Copper and copper alloys. Eddy current test for measuring defects on seamless round copper and copper alloy tubes. Test with an internal probe on the inner surface
  • BS EN ISO 21672-1:2012 Dentistry. Periodontal probes. General requirements

Indonesia Standards

  • SNI 7915-2013 White Spot Syndrome Virus (WSSV) Detection Quantitative Method (Real-Time) Polymerase Chain Reaction (qPCR) Using Hydrolysis Probes
  • SNI 7959-2014 Detection of Koi Herpesvirus (KHV) by a quantitative (real-time) method Polymerase Chain Reaction (qPCR) using hydrolysis probes
  • SNI 8231.1-2016 Deteksi Megalocytivirus Bagian 1: Metode quantitative (real-time) polymerase chain reaction (qPCR) menggunakan hydrolysis probe
  • SNI 7962-2014 Detection of betanodaviruses causing viral neuronecrosis (VNN) using quantitative (real-time) reverse transcription-polymerase chain reaction (RT-qPCR) methods using hydrolysis probes
  • SNI 7914-2013 Detection of Taura Syndrome Virus (TSV) Quantitative (real-time) reverse transcription-polymerase chain reaction (RT-qPCR) method using hydrolysis probes
  • SNI 7913-2013 Macrobrachium rosenbergii nodavirus (MrNV) detection Quantitative (real-time) reverse transcription polymerase chain reaction (RT-qPCR) method using hydrolysis probes
  • SNI 7916-2013 Infectious myonecrosis virus (IMNV) detection Quantitative (real-time) reverse transcription polymerase chain reaction (RT-qPCR) method using hydrolysis probes

National Aeronautics and Space Administration (NASA)

  • NASA-TN-D-6827-1972 Flight calibration of compensated and uncompensated pitot-static airspeed probes and application of the probes to supersonic cruise vehicles

KR-KS

  • KS L 1619-2013(2023) Testing methods for resistivity of conductive fine ceramic thin films with four point probe array

Spanish Association for Standardization (UNE)

  • UNE-EN 61290-10-3:2003 Optical amplifiers - Test methods -- Part 10-3: Multichannel parameters - Probe methods (Endorsed by AENOR in November of 2003.)

Association of German Mechanical Engineers

  • VDI/VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems

VDI - Verein Deutscher Ingenieure

  • VDI/VDE 2656 Blatt 1-2006 Bestimmung geometrischer Messgroessen mit Rastersondermikroskopen - Kalibrierung von Messsystemen

CZ-CSN

German Institute for Standardization

  • DIN EN 2591-6415:2003 Aerospace series - Elements of electrical and optical connection; Test methods - Part 6415: Optical elements; Test probe damage; German and English version EN 2591-6415:2001
  • DIN EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA) English version of DIN EN 1071-4:2006-05