ion probe method
ion probe method, Total:80 items.
The international standard classification for "ion probe method" includes: Optical measuring instruments , Other standards related to analytical chemistry , Optical equipment , Other standards related to optics and optical measurements , Semiconducting materials , Test conditions and procedures in general , Other methods of testing of metals , Surgical instruments and materials , Testing of metals .
The Chinese standard classification for "ion probe method" includes: Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Semimetal and semiconductor material in general , Semimetal and semiconductor material analysis method , Optical Measurement , Other special devices , Metal physical property test method .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 17363-1998 Method of quantitative electron probe microanalysis on gold products
- GB/T 14141-2009 Test method for sheet resistance of silicon epitaxial,diffused and ion-implanted layers using a collinear four-probe array
- GB/T 15616-1995 Qantitative method for electron probe microanalysis of metals and alloys
- GB/T 17360-2008 Quantitative analysis method of low content Si and Mn in steel with electron probe microanalysis
- GB/T 17360-1998 Method of quantitative electron probe microanalysis on low contents of Si and Mn in steels
- GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA)
- GB/T 15075-1994 Method for testing EPMA instrument
- GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
- GB/T 17365-1998 Method of preparation for samples of metal and alloy in electron probe microanalysis
- GB/T 15616-2008 Quantitative method for electron probe microanalysis of metals and alloys
- GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis
- GB/T 15246-2002 Quantitative analysis of sulfide minerals by electron probe microanalysis
- GB/T 17506-2008 The analysis method of corrosive layer on ferrous metals of ship with EPMA
- GB/T 15074-2008 General guide of quantitative analysis by EPMA
- GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
- GB/T 17363.1-2009 Nondestructive mensuration of gold content in the gold products - Part 1: Method of electron probe microanalysis
- GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis
- GB/T 17506-1998 The method of electron probe microanalysis as corrosive layer on ferrous metals of ship
- GB/T 15074-1994 General guide for EPMA quantitative analysis
- GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
- GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
未注明发布机构
- DIN 6801-1 E:2016-06 Procedures of dosimetry with probe-type detectors for proton and ion radiation - Part 1: Ionization chambers
- DIN 6800-1 E:2013-04 Procedures in dosimetry; principles of photon and electron dosimetry with probe-type detectors
Professional Standard - Medicine
- YY/T 0172-1994 Explorer for womb
- YY/T 0172-2014 Uterine probe
Yunnan Provincial Standard of the People's Republic of China
- DB53/T 443-2012 Fire technical appraisal method Electron probe analysis method
Professional Standard - Petroleum
- SY/T 6027-2012 Quantitative Analysis Method of Rock and Mineral by Electron Probe Microanalysis
- SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals
国家能源局
- SY/T 6027-2019 Quantitative analysis of rocks and minerals by electron probe microanalysis
Group Standards of the People's Republic of China
- T/BEA 43002-2023 Calibration Specification for Single Langmuir Probe Plasma Instrument
- T/CSTM 00252-2020 Test method for carbon fiber electrical resistivity by Four-probe method
Professional Standard - Aviation
- HB 8422-2014 Quantitative detection method of EPMA for trace elements in alloys
Professional Standard - Military and Civilian Products
- WJ 2297-1995 Electronic Probe Verification Regulations
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1017-1990 Verification Regulations for Electronic Probe Instrument
- JJG 901-1995 Verivication Regulation of Electron Probe Microanalyzer
Military Standard of the People's Republic of China-General Armament Department
- GJB 10296-2021 Ionospheric vertical detection ionogram measurement method
Professional Standard - Machinery
- JB/T 12074-2014 Quantitative Analysis of Composition Metal - Electron Probe Microanalysis
Professional Standard - Education
- JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
Taiwan Provincial Standard of the People's Republic of China
- CNS 12846-1991 Helium Mass Spectrometer Leak Testing by Trace Probe Method
Professional Standard - Non-ferrous Metal
- YS/T 602-2017 Test method for resistivity of zone-refined germanium ingot using a two-point probe
- YS/T 602-2007 Test method for resistivity of zone-refined germanium ingot using a two-point probe
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
- GB/T 17360-2020 Microbeam analysis- Method of quantitative determination for low contents of silicon and manganese in steels using electron probe microanalyzer
Fujian Provincial Standard of the People's Republic of China
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
SCC
- AASHTO T 332-2022 Standard Method of Test for Determining Chloride Ions in Concrete and Concrete Materials by Specific Ion Probe
- AASHTO T 332-2007(2020) Standard Method of Test for Determining Chloride Ions in Concrete and Concrete Materials by Specific Ion Probe
- AASHTO TP 55-1998(2005) Standard Method of Test for Determining Chloride Ions in Concrete and Concrete Materials by Specific Ion Probe
- DIN 6801-1:2019 Procedures of dosimetry with probe-type detectors for proton and ion radiation - Part 1: Ionization chambers
- DIN 6801-1 E:2016 Draft Document - Procedures of dosimetry with probe-type detectors for proton and ion radiation - Part 1: Ionization chambers
- DIN 6800-2:2020 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 2: Ionization chamber dosimetry of high energy photon and electron radiation
- AS 1086:1971 Dental chisels, excavators, probes and scalers
AASHTO - American Association of State Highway and Transportation Officials
- T 332-2007 Standard Method of Test for Determining Chloride Ions in Concrete and Concrete Materials by Specific Ion Probe
- TP 55-1998 Standard Method of Test for Determining Chloride Ions in Concrete and Concrete Materials by Specific Ion Probe
- TP55-1998 Standard Test Method for Determining Chloride Ions in Concrete and Concrete Materials by Specific Ion Probe
The American Road & Transportation Builders Association
- AASHTO T 332-2007(R2020) Standard Method of Test for Determining Chloride Ions in Concrete and Concrete Materials by Specific Ion Probe
- AASHTO T 332-2007 Standard Method of Test for Determining Chloride Ions in Concrete and Concrete Materials by Specific Ion Probe
- AASHTO TP55-1998 Standard Test Method for Determining Chloride Ions in Concrete and Concrete Materials by Specific Ion Probe 2000 Edition
- AASHTO TP 55-1998(R2004) TS-3c TP 55-1 AASHTO Standard Method of Test for Determining Chloride Ions in Concrete and Concrete Materials by Specific Ion Probe
German Institute for Standardization
- DIN 6801-1:2019-09 Procedures of dosimetry with probe-type detectors for proton and ion radiation - Part 1: Ionization chambers
- DIN 6800-2:2020-08 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 2: Ionization chamber dosimetry of high energy photon and electron radiation
- DIN 6800-1:1980 Procedures in dosimetry; principles of photon and electron dosimetry with probe-type detectors
CZ-CSN
- CSN ON 81 3790-1966 Electric feeler
- CSN ON 81 3791-1966 Holder of electric íeeler
HU-MSZT
- MNOSZ 15510-1955 Surgical instruments. uterine probe
Association Francaise de Normalisation
- NF ISO 11938:2012 Microbeam analysis - Electron microprobe analysis (Castaing microprobe) - Elemental mapping analysis methods using wavelength dispersive spectrometry
- XP P94-123:1999 Soils: reconnaissance and tests - Logging in boreholes - Neutron probe method
Korean Agency for Technology and Standards (KATS)
- KS B 0535-2005 Method for measurement ox performancecharacteristics of ultrasonic probes
- KS D 2714-2016 Scanning probe microscope-Method for lateral force microscope
American Society for Testing and Materials (ASTM)
- ASTM E499-95(2006) Standard Test Methods for Leaks Using the Mass Spectrometer Leak Detector in the Detector Probe Mode
- ASTM D5334-22ae1 Standard Test Method for Determination of Thermal Conductivity of Soil and Rock by Thermal Needle Probe Procedure
- ASTM D5334-22a Standard Test Method for Determination of Thermal Conductivity of Soil and Rock by Thermal Needle Probe Procedure
- ASTM D5334-00(2004) Standard Test Method for Determination of Thermal Conductivity of Soil and Soft Rock by Thermal Needle Probe Procedure
- ASTM D5334-22 Standard Test Method for Determination of Thermal Conductivity of Soil and Rock by Thermal Needle Probe Procedure
RU-GOST R
- GOST R ISO 7492-2009 Dental explorers. Technical requirements and test methods
- GOST ISO 7492-2011 Dental explorers. Technical requirements and test methods
- GOST 13675-1968 Butterprobe weight. Methods and means of verification
- GOST 13591-1968 Potatoprobe weight. Methods and means of verification
PL-PKN
- PN P04991-1989 Methods of chemical tests Knitted medical articles Determination of heavy metals jons
Japanese Industrial Standards Committee (JISC)
- JIS H 0612:1975 Testing methods of resistivity for single crystal silicon wafers with four point probe
ion probe,ion trap probe,Kelvin probe method,ion probe,secondary ion probe,ion probe how,probe method,Probe Method Curve,ion pair probe,ion probe,Materials for ion probes,ion probe material,ion probe,Ion Probe Center,ionic method,Cyanide probe,How to use the probe,ion probe year,ion probe method,Chloride Probe