SEM 3 scanning

SEM 3 scanning, Total:202 items.

The international standard classification for "SEM 3 scanning" includes: Chemical analysis , Linear and angular measurements in general , Metallic coatings , Optical equipment , Linear and angular measurements , Other standards related to analytical chemistry , Other standards related to optics and optical measurements , Other methods of testing of metals , Man-made fibres , Protection against crime , Photographic paper, films and cartridges .

The Chinese standard classification for "SEM 3 scanning" includes: Electron optics and other physical optics instrument , Material Protection , Chemical Measurement , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Optical Measurement , Magnifier and microscope , Oil shale , Metallographic testing method , Chemical fibre in general , Petroleum geology exploration , Crime judging technology , Basic standards and general methods for photosensitive material .

Professional Standard - Machinery

JB/T 5478-1991 Manual Scanning Photoelectric Direct-reading Spectrometer
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 7503-1994 Thickness of Cross Section of Metal Coatings Scanning Electron Microscope Measuring Method

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes

National Metrological Verification Regulations of the People's Republic of China

JJG 936-2012 Verification Regulation of the Differential Scanning Calorimeter
JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

Military Standard of the People's Republic of China-General Armament Department

GJB 8288-2014 Verification regulation for ultra-high speed rotating mirror streak camera system
GJB 2666A-2018 Specification for scanning reflective beryllium mirrors
GJB 737.11-1993 Test methods for pyrotechnic chemicals Particle size determination Scanning electron microscopy
GJB 2666-1996 Specification for scanning reflective beryllium mirrors

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Group Standards of the People's Republic of China

T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
T/CVMA 58-2020 Dog and cat CT scan operating procedures
T/NLIA 004-2021 In-situ SEM tensile test method for additive manufactured aluminum alloy
T/GAIA 017-2022 Determination of fluorine content in the surface coating of aluminum and aluminum alloys— Scanning electron microscope and energy dispersive spectrometer method
T/CMAIA 002-2023 3D intelligent skin scanner
T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
T/ZZB 0608-2018 3D dental scanner
T/CSTM 00346-2021 Automatic classification and statistics for the Inclusions in Steel —Energy dispersive spectrum method of scanning electron microscope
T/CSTM 00229-2020 Identification of graphene materials in coatings materials Scanning Electron Microscope-Energy Dispersive Spectrometer method
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/SPSTS 030-2023 Graphene material sheet size measurement using scanning electron microscopy
T/CNIA 0161-2023 Method for inspecting the microstructure and morphology of deformed aluminum and aluminum alloys Scanning electron microscopy method

Professional Standard - Commodity Inspection

SN/T 3009-2011 Identification of Seawater Corrosion on Metallic Surface by SEM
SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

Professional Standard - Education

JY/T 0586-2020 General rules of analytical methods for confocal laser scanning microscope
JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 010-1996 General rules for analytical scanning electron microscopy

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 30834-2022 Rating and classifying of inclusions in steel—Scanning electron microscope method
GB/T 17722-1999 Gold-plated thickness measurement by SEM
GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
GB/T 27788-2011 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM
GB/T 16594-1996 Micron grade lenght measurement by SEM
GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
GB/T 30834-2014 Standard test methods for rating and classifying inclusions in steel―Scanning Electron Microscope
GB/T 36422-2018 Man-made fiber—Test method for micro morphology and diameter—Scanning electron microscope method
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
GB/T 42659-2023 Surface chemical analysis―Scanning probe microscopy―Determination of geometric quantities using SPM:Calibration of measuring systems
GB/T 16594-2008 General rules for measurement of length in micron scale by SEM

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY/T 6748-2008 Specification for core scan of oil and gas wells

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films
DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
GB/T 38783-2020 Method of coating thickness determination for precious metalcomposites by scanning electron microscope

工业和信息化部/国家能源局

JB/T 13176-2017 Differential scanning calorimeters

Professional Standard - Chemical Industry

HG/T 3640-1999 Photography - Film dimensions - Film for electronic scanner use

工业和信息化部

JB/T 13390-2018 Infrared line scanning thermometer
YS/T 1491-2021 Method for determination of sphericity of nickel-based high-temperature alloy powder by scanning electron microscopy

Professional Standard - Medicine

YY/T 1154-2009 Laser confocal scanner
YY 91098-1999 Radionuclide scanner

Professional Standard - Public Safety Standards

GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry

Professional Standard - Energy

NB/T 11139-2023 3D laser scanner for coal mine

Fujian Provincial Standard of the People's Republic of China

DB35/T 1778-2018 foot shape measurement scanning analysis method

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS K 7542:1993 Dimensions of photographic film for electronic scanner use

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO/DIS 17097:2023 3-D human body scan data — Part 1: Terminologies and methodologies for processing of human scan data
ISO/CD 17097 3-D digital human body scan data — Part 1: Terminologies and methodologies for processing of human scan data
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16067-2:2004 Photography - Electronic scanners for photographic images - Spatial resolution measurements - Part 2: Film scanners
ISO/IEC 17991:2021 Information technology -- Office equipment -- Method for measuring scanning productivity of digital scanning devices
ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

U.S. Military Regulations and Norms

ARMY MIL-PRF-49177 B VALID NOTICE 1-2013 SCAN-INTERLACE, PL-1408/UA
ARMY MIL-PRF-49168C-1997 SCAN-INTERLACE, PL-1403/UA, PL-1403A/UA
ARMY MIL-PRF-49168 C NOTICE 1-2013 SCAN-INTERLACE, PL-1403/UA, PL-1403A/UA
ARMY MIL-PRF-49166/3A-1999 MECHANICAL SCANNER, MX-9872(V)3/UA
ARMY MIL-PRF-49177 B-1997 SCAN-INTERLACE, PL-1408/UA
ARMY MIL-PRF-49168 C-1997 SCAN-INTERLACE, PL-1403/UA, PL-1403A/UA

SCC

AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS DISC PD 0016:2001 Document scanning. Guide to scanning business documents
BS PD 0016:2001 Document scanning. Guide to scanning business documents
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
MIL MIL-S-49301/3-1988 SCANNER, MECHANICAL, MX-10717(V)3/U
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
VDI/VDE 5565 BLATT 1:2023 Optical coherence tomography (OCT) — procedure descriptions
DANSK DS/EN ISO 9220:1994 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
AENOR UNE 57083:1974 Paper. Paper tapes, for use in electronic scanning equipment.
CEI 60-32:1998 Type B helical scan video recorders
MIL MIL-C-81953-1973 CABLE ASSEMBLY, MAGNETIC SWEEP MARK 17 MOD 1
AENOR UNE-EN ISO 9220:1996 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

Korean Agency for Technology and Standards (KATS)

KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS A ISO 16067-2-2005(2020) Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2022 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D 2714-2006 Scanning probe microscope-Method for lateral force microscope
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D 2713-2021 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS A ISO 16067-2-2020 Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS A ISO 16067-2:2005 Photography-Electronic scanners for photographic images-Spatial resolution measurement-Part 2:Film scanners

GSO

ISO 17097:2024 3-D human body scan data — Methods for the processing of human body scan data
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

British Standards Institution (BSI)

18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 17097:2024 3-D human body scan data. Methods for the processing of human body scan data
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS ISO 16067-2:2004 Photography. Electronic scanners for photographic images. Spatial resolution measurements. Film scanners
BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 16067-1:2003 Photography. Spatial resolution measurements for electronic scanners for photographic images. Scanners for reflective media
BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
BCI Horizon Scan Report 2021:2022 BCI Horizon Scan Report 2021
21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method

American Society for Testing and Materials (ASTM)

ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

IN-BIS

IS 6451-1972 Scan specification
IS 9782-1981 Specification for television scan generators

Association of German Mechanical Engineers

VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method

Institute of Electrical and Electronics Engineers (IEEE)

IEEE 1450.6.1-2009 Describing on-chip scan compression

Society of Motion Picture and Television Engineers (SMPTE)

SMPTE 293M-2003 Television - 720 X 483 Active Line at 59.94-Hz Progressive Scan Production - Digital Representation
SMPTE 294M-2001 Television 720 X 483 Active Line at 59.94-Hz Progressive Scan Production - Bit-Serial Interfaces
SMPTE ST 2016-2-2014 Format for Pan-Scan Information

VDI - Verein Deutscher Ingenieure

VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method

American National Standards Institute （ANSI)

ANSI/IEEE 1450.6.1:2009 Standard for Describing On-Chip Scan Compression

RU-GOST R

GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes

Association Francaise de Normalisation

NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy

SE-SIS

SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice
SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method

Danish Standards Foundation

DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

German Institute for Standardization

DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN IEC 60602:1989 Type B helical video recorders; identical with IEC 60602:1980 (status of 1987)

European Committee for Standardization (CEN)

EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)

BE-NBN

NBN Z 01-002-1991 Classification and typing of documents

ES-UNE

UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

ATIS - Alliance for Telecommunications Industry Solutions

0300102-2011 Scanner Testing Results per ATIS-0300085@ BCSC Test Specification for Product Label Scanning

SAE - SAE International

SAE J2201-1999 Universal Interface for OBD II Scan

Alliance of Telecommunications Industry Solutions （ATIS)

ATIS 0300102-2011 Scanner Testing Results per ATIS-0300085, BCSC Test Specification for Product Label Scanning

European Committee for Electrotechnical Standardization（CENELEC）

HD 574 S1-1990 Type B Helical Video Recorders

Lithuanian Standards Office

LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

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