Scanning Electron Microscopy Sample Preparation Methods

Scanning Electron Microscopy Sample Preparation Methods, Total:58 items.

The international standard classification for "Scanning Electron Microscopy Sample Preparation Methods" includes: Chemical analysis , Protection against crime .

The Chinese standard classification for "Scanning Electron Microscopy Sample Preparation Methods" includes: Basic standards and general methods , Oil shale , Electron optics and other physical optics instrument , Chemical Measurement , Crime judging technology .

Professional Standard - Petroleum

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope

Professional Standard - Machinery

JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 6842-1993 Test Method of Scanning Electron Microscope

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

Professional Standard - Commodity Inspection

SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Japanese Industrial Standards Committee (JISC)

JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method

Korean Agency for Technology and Standards (KATS)

KS I 0051-1999 General rules for scanning electron microscopy
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2024 General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary

British Standards Institution (BSI)

BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary

GCC Standardization Organization

GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness

Association of German Mechanical Engineers

VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method

American Society for Testing and Materials (ASTM)

ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

Association Francaise de Normalisation

XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness

Swedish Institute for Standards

SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
SS-ISO 9220:1989 Metallic coatings - Measurements of coating thickness - Scanning electron microscope method

Ente Nazionale Italiano di Unificazione

UNI ISO 9220:1990 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.

German Institute for Standardization

DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

Spanish Association for Standardization (UNE)

UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

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