Scanning Electron Microscopy and Optical Microscopy
Scanning Electron Microscopy and Optical Microscopy, Total:165 items.
The international standard classification for "Scanning Electron Microscopy and Optical Microscopy" includes: Optical equipment , Chemical analysis , Ophthalmic equipment .
The Chinese standard classification for "Scanning Electron Microscopy and Optical Microscopy" includes: Electron optics and other physical optics instrument , Magnifier and microscope , Chemical Measurement , Basic standards and general methods , Medical optical instrument and endoscope .
Professional Standard - Commodity Inspection
- SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
Group Standards of the People's Republic of China
- T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
- T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
National Metrological Technical Specifications of the People's Republic of China
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Machinery
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
- JB/T 8230.1-1999 Light microscope -- vocabulary
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 8230.1-1995 Light microscopy terminology
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 27668-2023 Microscopes—Vocabulary for light microscopy
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
Professional Standard - Education
- JY/T 0586-2020 General rules of analytical methods for confocal laser scanning microscope
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
- JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
- JY/T 010-1996 General rules for analytical scanning electron microscopy
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
Professional Standard - Petroleum
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
- SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
Professional Standard - Medicine
- YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery
American Society for Testing and Materials (ASTM)
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 8576 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
- ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
- ISO 10934:2025 Microscopes — Vocabulary for light microscopy
- ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
- ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
- ISO 15227 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
- ISO 11883:1997 Optics and optical instruments - Microscopes - Marking of stereomicroscopes
- ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
- ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
- ISO 8577:1997 Optics and optical instruments - Microscopes - Spectral filters
- ISO 10934-1:2002 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
- ISO 10934:2020 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
- ISO 8578:1997 Optics and optical instruments - Microscopes - Marking of objectives and eyepieces
- ISO 10937:1997 Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces for microscopes with tube length 160 mm
- ISO 8036-1:1998 Optics and optical instruments - Microscopes - Part 1: Immersion oil for general use in light microscopy
- ISO 9344:1996 Optics and optical instruments - Microscopes - Graticules for eyepieces
- ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
- ISO 8038:1985 Optics and optical instruments; Microscopes; Screw thread for objectives
- ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Part 2: Advanced techniques in light microscopy
British Standards Institution (BSI)
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
- BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
- BS ISO 10934:2025 Microscopes. Vocabulary for light microscopy
- BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
- BS ISO 10934-1:2003 Optics and optical instruments - Vocabulary for microscopy - Light microscopy
- BS ISO 10934-1:2002 Optics and optical instruments. Vocabulary for microscopy-Light microscopy
- 10/30165036 DC BS ISO 27911. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
- BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
- BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
- 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
- 19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
- 24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
- BS 7012-8:1997 Light microscopes - Graticules for eyepieces
- BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
- BS ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Advanced techniques in light microscopy
- BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
- BS ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
- BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
- BS 7012-15:1997 Light microscopes - Marking of objectives and eyepieces
- BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
- BS 7012-16:1997 Light microscopes-Diameter of interchangeable eyepieces for microscopes with tube length 160 mm
- BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
- 18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
- BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
- BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
- BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
Korean Agency for Technology and Standards (KATS)
- KS D 2714-2016(2021) Scanning probe microscope-Method for lateral force microscope
- KS D ISO 22493:2012 Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS D 2714-2016 Scanning probe microscope-Method for lateral force microscope
- KS D 2714-2021 Scanning probe microscope-Method for lateral force microscope
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-2024 General rules for scanning electron microscopy
- KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
- KS I 0051-2019 General rules for scanning electron microscopy
- KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
- KS D 2713-2021 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
- KS D ISO 22493-2012(2017) Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS I 0051-1999 General rules for scanning electron microscopy
- KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
- KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
- KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
- KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
- KS B ISO 15227-2023 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
- KS M 2617-2022 Optics and optical instruments-Microscopes-Immersion oil for general use in light microscopy
- KS M 2617-2007(2017) Optics and optical instruments-Microscopes-Immersion oil for general use in light microscopy
- KS B ISO 8576-2006(2016) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
- KS B ISO 8576:2006 Optics and optical instruments-Microscopes-Reference system of polarized light microscopy
- KS M 2617-2007(2022) Optics and optical instruments-Microscopes-Immersion oil for general use in light microscopy
- KS B ISO 8576-2023 Optics and optical instruments — Microscopes — Reference system of polarized light microscopy
- KS B ISO 8576-2006(2021) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
- KS B ISO 11884-2-2021 Optics and photonics - Minimum requirements for stereomicroscope - Part 2: High performance microscopes
- KS B ISO 10934-1-2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
- KS B ISO 10934-1-2024 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
- KS B ISO 10934-1:2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
- KS B ISO 10934-1:2004 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
- KS B ISO 8578-2016(2021) Optics and optical instruments-Microscopes-Marking of objectives and eyepieces
- KS B ISO 8578-2021 Optics and optical instruments-Microscopes-Marking of objectives and eyepieces
- KS B ISO 8578-2016 Optics and optical instruments-Microscopes-Marking of objectives and eyepieces
- KS B ISO 8036-1:2006 Optics and optical instruments-Microscopes-Part 1:Immersion oil for general use in light microscopy
- KS B ISO 8036-1-2006 Optics and optical instruments-Microscopes-Part 1:Immersion oil for general use in light microscopy
- KS B ISO 8036-1:2008 Optics and optical instruments - Microscopes - Part 1: Immersion oil for general use in light microscopy
Japanese Industrial Standards Committee (JISC)
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
- JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
- JIS B 7144:1995 Microscope -- Connection of condensers for transmitted light with substage sleeves
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 27911:2016 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- BH GSO ISO 15227:2016 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
- BH GSO ISO 11883:2016 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
- BH GSO ISO 8576:2016 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
- BH GSO ISO 10934-1:2016 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy
- BH GSO ISO 11039:2015 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
GCC Standardization Organization
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
- GSO ISO 11883:2013 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
- GSO ISO 15227:2015 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
- GSO ISO 8578:2015 Microscopes -- Marking of objectives and eyepieces
- GSO ISO 27911:2013 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
- GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 10934-1:2013 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy
Military Standards (MIL-STD)
- DOD A-A-54868-1993 MICROSCOPE, OPTICAL STEREOSCOPIC
- DOD A-A-54970-1994 MICROSCOPE, OPTICAL
- DOD A-A-51796 A-1991 MICROSCOPE, OPTICAL (BINOCULAR)
- DOD A-A-50852 A-1985 MICROSCOPE, OPTICAL, BINOCULAR
German Institute for Standardization
- DIN ISO 9344:2001 Optics and optical instruments - Microscopes - Graticules for eyepieces (ISO 9344:1996)
- DIN ISO 9344:2001-12 Optics and optical instruments - Microscopes - Graticules for eyepieces (ISO 9344:1996)
- DIN ISO 8577:2001 Optics and optical instruments - Microscopes - Spectral filters (ISO 8577:1997)
- DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
- DIN 58629-1:2006 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
- DIN ISO 8578:2003 Optics and optical instruments - Microscopes - Marking of objectives and eyepieces (ISO 8578:1997 + ISO 8578:1997/Cor. 1:2002)
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
- OS GSO ISO 10934-1:2013 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy
- OS GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
PT-IPQ
- E E 15-1971 Optical microscope
Association Francaise de Normalisation
- NF S12-023:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. CONNECTING DIMENSIONS OF TUBE SLIDES AND TUBE SLOTS.
- NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging
- NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of confocal fluorescence microscopes for biological imaging
Bureau of Indian Standards
- IS 13108-2019 Optics and Photonics —— Microscopes —— Immersion Liquids for Light Microscopy ( Second Revision )
- IS 13108-1-2002 Optics and Optical Instruments - Microscopes - Part 1 : Immersion Oil for General Use in Light Microscopy
Defense Logistics Agency
- DLA MIL-M-37869-1978 MICROSCOPE, OPTICAL, BINOCULAR
Magyar Szabványügyi Testület
- MNOSZ 5534-1956 Microscope light mirror
Scanning Electron Microscopy and Optical Microscopy,Optical Microscopy and Scanning Electron Microscopy,Optical Microscopy and Scanning Electron Microscopy,% of scanning electron microscope and optical microscope,Scanning Electron Microscopy and Optical Microscopy