scanning microscope

scanning microscope, Total:158 items.

The international standard classification for "scanning microscope" includes: Chemical analysis , Optical equipment , Other standards related to optics and optical measurements , Protection against crime , Ophthalmic equipment .

The Chinese standard classification for "scanning microscope" includes: Electron optics and other physical optics instrument , Chemical Measurement , Basic standards and general methods , Magnifier and microscope , Optical Measurement , Crime judging technology , General and microsurgical devices , Medical optical instrument and endoscope .

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes

Professional Standard - Machinery

JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 7398.13-1994 Specimens slides for microscopes and biological microscopes
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

Professional Standard - Commodity Inspection

SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 9247-1996 Microscopes-Condensers
GB/T 2609-2015 Microscopes―Objectives
GB/T 2609-2006 Microscopes - Objectives
GB/T 9246-1996 Microscopes-Oculars (eyepieces)
GB/T 2609-1996 Microscopes--Objectives
GB/T 9246-2008 Microscopes—Oculars (eyepieces)
GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
GB/T 42659-2023 Surface chemical analysis―Scanning probe microscopy―Determination of geometric quantities using SPM:Calibration of measuring systems
GB/T 43846.1-2024 Microscopes—Designation of microscope objectives—Part 1: Flatness of field/Plan
GB/T 9247-2008 Microscopes—Condensers

Group Standards of the People's Republic of China

T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device

Professional Standard - Education

JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0586-2020 General rules of analytical methods for confocal laser scanning microscope
JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

未注明发布机构

JIS K 0182:2023 Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Professional Standard - Medicine

YY 0067-1992 Micro-circulation microscopes

国家食品药品监督管理局

YY/T 0067-2007 Micro-circulation microscopes

机械工业部

JB/T 8230.9-1995 Microscope eyepiece series

British Standards Institution (BSI)

BS ISO 11039:2012 Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
BS ISO 11775:2015 Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
BS ISO 18115-2:2010 Surface chemical analysis - Vocabulary - Terms used in scanning-probe microscopy
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

Korean Agency for Technology and Standards (KATS)

KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS B 5601-1995(2021) Micrometer microscopes
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B 5601-1995 Micrometer microscopes
KS D 2714-2006 Scanning probe microscope-Method for lateral force microscope
KS D 2713-2021 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS B 5601-2021 Micrometer microscopes
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B ISO 19012-1:2011 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
KS B ISO 19012-1:2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS L 2010-2009(2019) Slide glasses for microscope

SCC

13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 19012-1:2011 Microscopes. Designation of microscope objectives-Flatness of field/Plan
AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
10/30165036 DC BS ISO 27911. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
12/30266267 DC BS ISO 19012-1. Microscopes. Designation of microscope objectives. Flatness of field/Plan
10/30199182 DC BS ISO 11039. Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
10/30199179 DC BS ISO 28600. Surface chemical analysis. Data transfer format for scanning-probe microscopy
AENOR UNE 1059:1956 Microcopy.
BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
BS 7012-8:1990 Light microscopes-Specification for surface marked graticules for eyepieces

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
ISO 19012-1:2013 Microscopes.Designation of microscope objectives .Part 1: Flatness of field/Plan
ISO 19012-1:2011 Microscopes - Designation of microscope objectives - Part 1: Flatness of field/Plan
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 11039:2012 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 18115-2:2021 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
ISO 28600:2011 Surface chemical analysis - Data transfer format for scanning-probe microscopy
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO 9344:2011 Microscopes - Graticules for eyepieces
ISO/PRF 19012-4:2024 Microscopes
ISO 11775:2015 Surface chemical analysis - Scanning-probe microscopy - Determination of cantilever normal spring constants
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 19012-2:2013 Microscopes - Designation of microscope objectives - Part 2: Chromatic correction
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
JIS K 0147-2:2017 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy
JIS B 7148:1992 Microscope eyepieces
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS B 7150:1993 Micrometer microscopes
JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS B 7147:1993 Biological microscope objectives

GSO

BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 27911:2016 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
BH GSO ISO 11039:2015 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
OS GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
GSO ISO 28600:2013 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
BH GSO ISO 28600:2016 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
BH GSO ISO 19012-1:2016 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 27911:2013 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO 11775:2021 Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
BH GSO ISO 11775:2022 Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO 18115-2:2013 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy
OS GSO ISO 9344:2015 Microscopes -- Graticules for eyepieces

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

American Society for Testing and Materials (ASTM)

ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope

Association Francaise de Normalisation

NF X21-069-2:2010 Surface chemical analysis - Vocabulary - Part 2 : terms used in scanning-probe microscopy.
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.

HU-MSZT

MNOSZ 5534-1956 Microscope light mirror
MNOSZ 15577-1953 microscope light

RU-GOST R

GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope

VDI - Verein Deutscher Ingenieure

VDI 3877 Blatt 1-2009 Indoor air pollution - Measurement of settled dust on surfaces - Scanning electron microscopy method
VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren

Others: scan face,surface probe microscopy,scan face,surface microscope,scanning microscope,surface scanning microscope,Surface gold + surface sweep,Surface near-field optical microscopy,face scan