Sign In |Help & Support
ALL SECTORS
  • ALL SECTORS
  • GB(National Standard)
  • CB(Shipping)
  • CECS(Engineering Construction)
  • CJ(Urban Construction)
  • CY(News and Publication)
  • DB(Provincial Standard)
  • DL(Electricity & Power)
  • DZ(Geology & Mineralogy)
  • FZ(Spinning & Textile)
  • GA(Public Security)
  • HB(Aviation)
  • HG(Chemical Industry)
  • HJ(Environmental Protection)
  • JB(Machinery)
  • JC(Building Materials)
  • JG(Building & Construction)
  • JJ(Metering)
  • JT(Highway & Transportation)
  • LY(Forestry)
  • MT(Coal)
  • NB(Energy)
  • NY(Agriculture)
  • QB(Light Industry)
  • QC(Automobile & Vehicle)
  • QJ(Aerospace)
  • SH(Petrochemical)
  • SJ(Electronics)
  • SL(Water Resources)
  • SN(Commodity Inspection)
  • SY(Oil & Gas)
  • TB(Railway & Train)
  • YB(Ferrous Metallurgy)
  • YC(Tobacco)
  • YD(Telecommunication)
  • YY(Medical Device)
Database: 365,228(8 Aug 2026)

SEM analysis

SEM analysis, Total:80 items.

The international standard classification for "SEM analysis" includes: Chemical analysis , Other standards related to analytical chemistry , Optical equipment , Linear and angular measurements in general , Metallic coatings , Natural fibres , Protection against crime .

The Chinese standard classification for "SEM analysis" includes: Basic standards and general methods , Chemical Measurement , Electrochemical, thermochemistry and optical profile type analyzer , Magnifier and microscope , Electron optics and other physical optics instrument , Oil shale , Material Protection , Half finished wool products , Crime judging technology .


中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
  • GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy

Professional Standard - Education

  • JY/T 0586-2020 General rules of analytical methods for confocal laser scanning microscope
  • JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
  • JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
  • JY/T 010-1996 General rules for analytical scanning electron microscopy

Fujian Provincial Standard of the People's Republic of China

  • DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
  • DB35/T 1778-2018 foot shape measurement scanning analysis method

National Metrological Verification Regulations of the People's Republic of China

Professional Standard - Petroleum

  • SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
  • SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
  • SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

国家能源局

  • SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
  • GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
  • GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
  • GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
  • GB/T 17722-1999 Gold-plated thickness measurement by SEM
  • GB/T 16594-1996 Micron grade lenght measurement by SEM
  • GB/T 42659-2023 Surface chemical analysis―Scanning probe microscopy―Determination of geometric quantities using SPM:Calibration of measuring systems
  • GB/T 27788-2011 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
  • GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
  • GB/T 14593-2008 analysis method of cashmere, wool and their blends - Scanning electron microscope method
  • GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope

Guangdong Provincial Standard of the People's Republic of China

  • DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air
  • GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification

Jiangsu Provincial Standard of the People's Republic of China

  • DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms

Professional Standard - Judicatory

  • SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Professional Standard - Nuclear Industry

  • EJ/T 20150.23-2018 PWR Rod-Radiation Fuel Assembly Post-Illumination Part 23: SEM Analysis of Fuel Cladding Tubes

Professional Standard - Aviation

  • HB 20094.4-2012 Test method for determination of wear metals in operating liquid for aviation.Part 4: Scanning electron microscopy and energy dispersive spectrometry

Professional Standard - Commodity Inspection

  • SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

Professional Standard - Machinery

National Metrological Technical Specifications of the People's Republic of China

  • JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Public Safety Standards

  • GA/T 1418-2017 Analysis of elements in glass evidence in Forensics—Scanning electron microscope/energy dispersive X-ray spectrometry(SEM/EDX)

International Organization for Standardization (ISO)

  • ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
  • ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
  • ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
  • ISO 28600:2011 Surface chemical analysis - Data transfer format for scanning-probe microscopy
  • ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO 11039:2012 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
  • ISO 18115-2:2010 Analyse chimique des surfaces — Vocabulaire — Partie 2: Termes utilisés en microscopie à sonde à balayage (Première édition)
  • ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
  • ISO 18115-2:2013 Surface chemical analysis.Vocabulary.Part 2: Terms used in scanning-probe microscopy

GSO

  • BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
  • GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
  • GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
  • GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
  • OS GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
  • BH GSO ISO 11039:2015 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
  • GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
  • OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness

SCC

  • BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
  • 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
  • 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
  • 10/30199182 DC BS ISO 11039. Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
  • VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
  • 08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness

Korean Agency for Technology and Standards (KATS)

KR-KS

  • KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
  • KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

British Standards Institution (BSI)

  • 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
  • BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • BS ISO 18115-2:2010 Surface chemical analysis - Vocabulary - Terms used in scanning-probe microscopy
  • BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
  • BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
  • BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy

Association Francaise de Normalisation

  • NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
  • XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
  • XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness

Japanese Industrial Standards Committee (JISC)

  • JIS K 0132:1997 General rules for scanning electron microscopy
  • JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

Association of German Mechanical Engineers

  • VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method