Scanning Probe Atomic Force
Scanning Probe Atomic Force, Total:24 items.
The international standard classification for "Scanning Probe Atomic Force" includes: Other standards related to optics and optical measurements , Chemical analysis .
The Chinese standard classification for "Scanning Probe Atomic Force" includes: Optical Measurement , Basic standards and general methods .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
- GB/T 42659-2023 Surface chemical analysis―Scanning probe microscopy―Determination of geometric quantities using SPM:Calibration of measuring systems
National Metrological Technical Specifications of the People's Republic of China
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
Professional Standard - Education
- JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
Fujian Provincial Standard of the People's Republic of China
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
Group Standards of the People's Republic of China
- T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy
RU-GOST R
- GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
- GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
- GOST R 8.700-2010 State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope
Korean Agency for Technology and Standards (KATS)
- KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2006 Scanning probe microscope-Method for lateral force microscope
International Organization for Standardization (ISO)
- ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
- ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
GSO
- GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
- BH GSO ISO 11039:2015 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
- OS GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
British Standards Institution (BSI)
- BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
- 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
American Society for Testing and Materials (ASTM)
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
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