Atomic Force Scanning Probe Microscope
Atomic Force Scanning Probe Microscope, Total:3 items.
The international standard classification for "Atomic Force Scanning Probe Microscope" includes: .
The Chinese standard classification for "Atomic Force Scanning Probe Microscope" includes: .
RU-GOST R
- GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
- GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
- GOST R 8.700-2010 State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope
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