scanning probe microscope
scanning probe microscope, Total:6 items.
The international standard classification for "scanning probe microscope" includes: Other standards related to optics and optical measurements .
The Chinese standard classification for "scanning probe microscope" includes: Optical Measurement .
National Metrological Technical Specifications of the People's Republic of China
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
Professional Standard - Education
- JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
Korean Agency for Technology and Standards (KATS)
- KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
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