SEM high magnification
SEM high magnification, Total:17 items.
The international standard classification for "SEM high magnification" includes: Optical equipment .
The Chinese standard classification for "SEM high magnification" includes: Magnifier and microscope , Electron optics and other physical optics instrument .
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 27788-2011 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
Group Standards of the People's Republic of China
- T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
Professional Standard - Commodity Inspection
- SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
Professional Standard - Machinery
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
American Society for Testing and Materials (ASTM)
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
SCC
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
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