Scanning electron microscope image resolution calculation method

Scanning electron microscope image resolution calculation method, Total:44 items.

The international standard classification for "Scanning electron microscope image resolution calculation method" includes: Optical equipment , Chemical analysis .

The Chinese standard classification for "Scanning electron microscope image resolution calculation method" includes: Magnifier and microscope , Crime judging technology , Basic standards and general methods .

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method
DB44/T 1833-2016 Electronic imaging office document scanning test target low resolution test target

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 27788-2011 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33838-2017 Microbeam analysis―Scanning electron microscopy―Methods of evaluating image sharpness

British Standards Institution (BSI)

BS ISO 16067-2:2004 Photography. Electronic scanners for photographic images. Spatial resolution measurements. Film scanners
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
BS ISO 16067-1:2003 Photography. Spatial resolution measurements for electronic scanners for photographic images. Scanners for reflective media
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

GSO

GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners
BH GSO ISO 16067-1:2016 Photography -- Spatial resolution measurements of electronic scanners for photographic images -- Part 1: Scanners for reflective media
GSO ISO 16067-1:2013 Photography -- Spatial resolution measurements of electronic scanners for photographic images -- Part 1: Scanners for reflective media
OS GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
BH GSO ISO 3334:2017 Micrographics -- ISO resolution test chart No. 2 -- Description and use
OS GSO ISO 3334:2015 Micrographics -- ISO resolution test chart No. 2 -- Description and use
GSO ISO 12233:2015 Photography -- Electronic still picture imaging -- Resolution and spatial frequency responses

Korean Agency for Technology and Standards (KATS)

KS A ISO 16067-2-2020 Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS A ISO 16067-1-2020 Photography－Spatial resolution measurements of electronic scanners for photographic image－Part 1：Scanners for reflective media
KS A ISO 16067-1-2005(2020) Photography－Spatial resolution measurements of electronic scanners for photographic image－Part 1：Scanners for reflective media
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D 2713-2021 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS A ISO 16067-2:2005 Photography-Electronic scanners for photographic images-Spatial resolution measurement-Part 2:Film scanners
KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS A ISO 16067-1:2005 Photography-Spatial resolution measurements of electronic scanners for photographic image-Part 1:Scanners for reflective media
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS A ISO 16067-2-2005(2020) Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners

KR-KS

KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

Association Francaise de Normalisation

XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.

SCC

13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness

International Organization for Standardization (ISO)

ISO 16067-2:2004 Photography - Electronic scanners for photographic images - Spatial resolution measurements - Part 2: Film scanners
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 16067-1:2003 Photography - Spatial resolution measurements of electronic scanners for photographic images - Part 1: Scanners for reflective media
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

Japanese Industrial Standards Committee (JISC)

JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

Others: