GB/T 33838-2017 in English

VALID

Microbeam analysis―Scanning electron microscopy―Methods of evaluating image sharpness

Issued on:2017-05-31
Implemented on:2018-04-01
File Format:PDF
Delivery:Via email within 10 business days

Price(USD)： $990.00
$961.00

Standard No:	GB/T 33838-2017
Document status:	VALID
Title in English:	Microbeam analysis―Scanning electron microscopy―Methods of evaluating image sharpness
Title in Chinese:	微束分析扫描电子显微术图像锐度评估方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 10 business days
Issued on:	2017-05-31
Implemented on:	2018-04-01
ICS Classification:	71.040.40-Chemical analysis
Chinese Classification:	G04-Basic standards and general methods
Professional Classification:	GB-National Standard
Related Keywords:	microbeam analysis ― scanning electron microscopy ― methods electron microscopy image sharpness scopethis standard specifies microscopy methods
Related Topics:	electron microscope scanning analysis technique Scanning Electron Microscopy Scanning Electron Microscopy Evaluation How to use before scanning bundle microbeam analysis derivative method microarray scanner semi-microanalysis Image Analysis Microscopy Scanning Electron Microscopy small scanning electronics Scan version scanning electron Microscopy and Image Analysis Secondary Electron Microscopy secondary scanning electron scanning secondary electrons Microscopy and Image Analysis microbeam xrf How SEM images are analyzed SEM image scanning electron electronic scanning work How to analyze SEM images picture sharp electron micrograph electron microscope Secondary Electron Microscopy in vitro electronic scanning Electron Microscopic Characterization Methods pixel pixel Image Analysis of SEM electron micrograph How to analyze SEM images Micro scan secondary electron scanning sharpness Analysis of SEM images gold scan image Scanning Electron Microscopy and Image Analysis in Electron Microsystem Scanning electron microscope image scanning volume analysis Scanning Electron Microscopy Image Analysis About scanning electron microscope image analysis SEM image analysis microarray scanner Micro scan Electron microscope image analysis basis TEM image analysis electron microscope electron microscope SEM image beam scan electron microscope sharp general microscopic electron image particle scanning method Microanalysis inspection Electron Microanalysis 1 scanning analysis Electron Microscopy Image Analysis Sharp Electron Microsystem particle scanning method Transmission electron micrograph Other Microanalysis Methods scanning electron microscope microsphere image How a Scanning Electron Microscope Analyzes Its Images Yan Microelectronics Electron Microanalysis - 2012 microbeam Microscanning system Inorganic Microanalysis electron micrograph scan density Electron Microscopy Image Method scan english microbeam xrf field electron microscopy Scanning electron microscope image analysis microbeam method image scanning microscope Differential Hot Pressure Analysis Microfracture Analysis Veteran Image Scanner Scanning Electron Microscopy differential analysis technique scan english GBT33838 GB/T 33838-2017 digital microscope scanner scanning XRD equatorial scan and meridional scan Equatorial scan and meridional scan XRD Microscopy Scanning image analysis system related High-resolution electron microscopy analysis method What method is used to detect microsegregation? Microplastic Analysis Methods Electronic nose analysis method What are the microscopy techniques? Scanning electron microscope image resolution calculation method Dual assessment analysis method Principles of scanning electron microscopy analysis method Electromyography Analysis Methods Microscopic analysis method validation Analytical Methods of Electronic Tongue Technology Electronic nose analysis method? Analysis methods of scanning electron microscope pictures Semiconductor Photocurrent Image Analysis Method Are there any testing standards for microscopic imaging? How to adjust the microscope image when it is too dark

《GB/T 33838-2017微束分析扫描电子显微术图像锐度评估方法》由TC38（全国微束分析标准化技术委员会）归口，主管部门为国家标准化管理委员会。

Scope

This standard specifies three methods for evaluating the sharpness of digital images generated by scanning electron microscopy (SEMD): Fourier transform (FT) method, contrast-gradient (CG) method. Derivative (DR) method.

More samples: GB 50021-2001(2009) QC/T 942-2021 JGJ 94-2008

Sample only — not a preview of GB/T 33838-2017

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