Electron microscope image analysis basis

Electron microscope image analysis basis, Total:89 items.

The international standard classification for "Electron microscope image analysis basis" includes: Chemical analysis , Physicochemical methods of analysis .

The Chinese standard classification for "Electron microscope image analysis basis" includes: Basic standards and general methods .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 33838-2017 Microbeam analysis―Scanning electron microscopy―Methods of evaluating image sharpness
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Professional Standard - Education

JY/T 0581-2020 General analysis rules for transmission electron microscope
JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

Professional Standard - Ferrous Metallurgy

YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method

British Standards Institution (BSI)

BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness
BS ISO 25498:2025 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
BS ISO 20263:2017 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
BS ISO 20263:2024 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
24/30479444 DC BS ISO 20263 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
BS ISO 29301:2017 Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
BS ISO 29301:2023 Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
09/30179503 DC BS ISO 29301. Microbeam analysis. Analytical transmission electron microscopy. Methods for calibrating image magnification by using reference materials giving a periodic diffraction pattern
18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS 3406-4:1993(1999) Methods for determination of particle size distribution — Part 4 : Guide to microscope and image analysis methods
BS ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures

Association Francaise de Normalisation

NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique
NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging

International Organization for Standardization (ISO)

ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2025 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 20263:2023 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO 19012-1:2011 Microscopes - Designation of microscope objectives - Part 1: Flatness of field/Plan
ISO 19012-1:2013 Microscopes.Designation of microscope objectives .Part 1: Flatness of field/Plan
ISO 20263:2024 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
ISO 20263:2017 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 29301:2017 Microbeam analysis - Analytical electron microscopy - Methods for calibrating image magnification by using reference materials with periodic structures
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO/FDIS 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
ISO 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy

Korean Agency for Technology and Standards (KATS)

KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS B ISO 19012-1:2011 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
KS B ISO 19012-1:2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan

GCC Standardization Organization

GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 29301:2016 Microbeam analysis -- Analytical transmission electron microscopy -- Methods for calibrating image magnification by using reference materials having periodic structures

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
OS GSO ISO 29301:2016 Microbeam analysis -- Analytical transmission electron microscopy -- Methods for calibrating image magnification by using reference materials having periodic structures

Japanese Industrial Standards Committee (JISC)

JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 29301:2017 Microbeam analysis -- Analytical transmission electron microscopy -- Methods for calibrating image magnification by using reference materials having periodic structures

American Society for Testing and Materials (ASTM)

ASTM MNL46-2007 Metal and material preparation for microscopic analysis, optical microscopy, image analysis and hardness testing

Others: Scanning Electron Microscopy Image Analysis,Electron microscope image analysis basis,TEM image analysis,Electron Microscopy Image Analysis,How a Scanning Electron Microscope Analyzes Its Images