XRD equatorial scan and meridional scan

XRD equatorial scan and meridional scan, Total:172 items.

The international standard classification for "XRD equatorial scan and meridional scan" includes: Chemical analysis , Photographic paper, films and cartridges , Protection against crime , Physics. Chemistry .

The Chinese standard classification for "XRD equatorial scan and meridional scan" includes: Basic standards and general methods , Basic standards and general methods for photosensitive material , Electron optics and other physical optics instrument , Chemical Measurement , Oil shale , Crime judging technology , Artificial lens .

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33838-2017 Microbeam analysis―Scanning electron microscopy―Methods of evaluating image sharpness
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Professional Standard - Chemical Industry

HG/T 3640-1999 Photography - Film dimensions - Film for electronic scanner use

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Machinery

JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification

National Metrological Verification Regulations of the People's Republic of China

JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary

Professional Standard - Education

JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 010-1996 General rules for analytical scanning electron microscopy

Taiwan Provincial Standard of the People's Republic of China

CNS 14197-1998 Electric linear scanining ultrasonic diagnostic equipment

未注明发布机构

GOST R 58396-2019 Medical mask. Drive and method of scanning
DIN 51007-2 E:2020-11 Thermal analysis - Differential thermal analysis (DTA) and Differential scanning calorimetry (DSC) - Part 2: Fast differential scanning calorimetry (f-DSC); Chip calorimetry

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

Group Standards of the People's Republic of China

T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/SAS 0003-2018 Bismuth germanate scintillation crystals for positron emission tomography
T/SPSTS 030-2023 Graphene material sheet size measurement using scanning electron microscopy

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Zhejiang Provincial Standard of the People's Republic of China

DB33/T 1308-2023 Three-dimensional laser scanning technical specifications for urban rail transit engineering

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 39867-2021 Bismuth germanate scintillation crystal for positron emission tomography

Professional Standard - Commodity Inspection

SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

Professional Standard - Military and Civilian Products

WJ 2299-1995 Inductively Coupled Plasma Sequential Scanning Spectrometer Verification Regulations

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

Inner Mongolia Provincial Standard of the People's Republic of China

DB15/T 1341-2018 Specification for calibration of electronic scanner for carded cashmere hand row length chart

American Society for Testing and Materials (ASTM)

ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy

SCC

AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
AENOR UNE 57083:1974 Paper. Paper tapes, for use in electronic scanning equipment.
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
AWWA QTC97119 Laser Scanning Device for Detecting Cryptosporidium
13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
BS PD IEC/TR 61948-3:2005 Nuclear medicine instrumentation. Routine tests-Positron emission tomographs
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
BS PD IEC/TR 61948-3:2018 Nuclear medicine instrumentation. Routine tests-Positron emission tomographs
DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
NACE AMPP TM21610-2022 Potentiodynamic Scans: Material Preparation, Data Acquisition and Analysis
BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
DIN 44030 Supplement 1:1991 Control technology; light barriers and light scanners; used symbols
DANSK DS/EN ISO 9220:1994 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 7542:1993 Dimensions of photographic film for electronic scanner use
JIS T 1507:1989 Electronic linear scanning ultrasonic diagnostic equipment

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 16067-2:2004 Photography - Electronic scanners for photographic images - Spatial resolution measurements - Part 2: Film scanners
ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO/DIS 17097:2023 3-D human body scan data — Part 1: Terminologies and methodologies for processing of human scan data
ISO 11312:1993 Photography; film dimensions; film for electronic scanner use
ISO 16067-1:2003 Photography - Spatial resolution measurements of electronic scanners for photographic images - Part 1: Scanners for reflective media
ISO/CD 17097 3-D digital human body scan data — Part 1: Terminologies and methodologies for processing of human scan data
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 21550:2004 Photography - Electronic scanners for photographic images - Dynamic range measurements
ISO 4593:1979 Plastics; Film and sheeting; Determination of thickness by mechanical scanning
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO 4593:1993 Plastics; film and sheeting; determination of thickness by mechanical scanning
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method

British Standards Institution (BSI)

BS ISO 16067-2:2004 Photography. Electronic scanners for photographic images. Spatial resolution measurements. Film scanners
BS ISO 16067-1:2003 Photography. Spatial resolution measurements for electronic scanners for photographic images. Scanners for reflective media
BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
23/30461186 DC BS ISO 17097. 3-D human body scan data - Part 1. Terminologies and methodologies for processing of human scan data
24/30457668 DC BS ISO/IEC 16466. Information Technology. 3D Printing and scanning. Assessment methods of 3D scanned data for 3D printing model
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS ISO 21550:2004 Photography - Electronic scanners for photographic images - Dynamic range measurements
PD IEC/TR 61948-3:2018 Nuclear medicine instrumentation. Routine tests. Positron emission tomographs
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 12653-1:2001 Electronic imaging. Test target for the black-and-white scanning of office documents. Characteristics
BS ISO 12653-1:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Characteristics
BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method

Korean Agency for Technology and Standards (KATS)

KS A ISO 16067-2-2005(2020) Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS A ISO 16067-2-2020 Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS A ISO 16067-2:2005 Photography-Electronic scanners for photographic images-Spatial resolution measurement-Part 2:Film scanners
KS A ISO 16067-1:2005 Photography-Spatial resolution measurements of electronic scanners for photographic image-Part 1:Scanners for reflective media
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS A ISO 16067-1-2020 Photography－Spatial resolution measurements of electronic scanners for photographic image－Part 1：Scanners for reflective media
KS A ISO 16067-1-2005(2020) Photography－Spatial resolution measurements of electronic scanners for photographic image－Part 1：Scanners for reflective media
KS A ISO 21550-2020 Photography－Electronic scanners for photographic images－Dynamic range measurements
KS X ISO/IEC 15780:2013 Information technology－8 mm wide magnetic tape cartridge－Helical scan recording－AIT－1 format
KS A ISO 21550:2005 Photography－Electronic scanners for photographic images－Dynamic range measurements
KS A ISO 21550-2005(2020) Photography－Electronic scanners for photographic images－Dynamic range measurements
KS M ISO 4593-2022 Plastics－Film and sheeting－Determination of thickness by mechanical scanning
KS M ISO 4593:2002 Plastics-Film and sheeting-Determination of thickness by mechanical scanning
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2022 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS M ISO 4593-2002(2022) Plastics－Film and sheeting－Determination of thickness by mechanical scanning
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification

GSO

GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 16067-1:2016 Photography -- Spatial resolution measurements of electronic scanners for photographic images -- Part 1: Scanners for reflective media
GSO ISO 16067-1:2013 Photography -- Spatial resolution measurements of electronic scanners for photographic images -- Part 1: Scanners for reflective media
OS GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners
GSO ISO 21550:2013 Photography -- Electronic scanners for photographic images -- Dynamic range measurements
GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
OS GSO ISO 21550:2013 Photography -- Electronic scanners for photographic images -- Dynamic range measurements
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness

BE-NBN

NBN Z 01-002-1991 Classification and typing of documents

RO-ASRO

STAS 6523-1989 lLLUSTRATION ORIGINAL COP IES FOl? P0I.YGRAPH1C REPRODUC- T ION

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS A 5555-2-2023 3-D digital human body scan data — Part 2: Methods and considerations for an analysis of human scan data
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

Society of Motion Picture and Television Engineers (SMPTE)

SMPTE ST 295M-1997 1920 X 1080 50 HZ - Scanning and Interfaces
SMPTE 2016-5-2009 KLV Coding for Active Format Description, Bar Data and Pan-Scan Information

Association Francaise de Normalisation

NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
NF Z42-010-1:1992 Electronic imaging - Scanning of office documents - part1:Subcontracting of scanning - Guide to detailed technical instructions for bureaux
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy

German Institute for Standardization

DIN SPEC 91127:2011 Recommendation for Temperature Calibration of Fast Scanning Calorimeters (FSCs) for Sample Mass and Scan Rate; Text in English
DIN 44030-1:1992 Control technology; light barriers and light scanners; definitions
DIN 44030-2:1992 Control technology; light barriers and light scanners; method of measurement
DIN 44030 Bb.1:1991 Control technology; light barriers and light scanners; used symbols
DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN 51007-2:2021-10 Thermal analysis - Differential thermal analysis (DTA) and Differential scanning calorimetry (DSC) - Part 2: Fast differential scanning calorimetry (f-DSC); Chip calorimetry
DIN 51007-2:2021 Thermal analysis - Differential thermal analysis (DTA) and Differential scanning calorimetry (DSC) - Part 2: Fast differential scanning calorimetry (f-DSC); Chip calorimetry

NEMA - National Electrical Manufacturers Association

NEMA NU 2-2012 Performance Measurements of Positron Emission Tomographs
NEMA NU 2-2018 Performance Measurements of Positron Emission Tomographs (PET)
NEMA XR 26-2012 Access Controls for Computed Tomography: Identification@ Interlocks@ and Logs

VDI - Verein Deutscher Ingenieure

VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method

RU-GOST R

GOST R 56109-2014 Medical electrical equipment. Positron emission tomographs together with X-ray equipment for computed tomography. Technical requirements for governmental purchases
GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification

SE-SIS

SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

Danish Standards Foundation

DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy

European Committee for Standardization (CEN)

EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
DD ENV 12 646-1997 Bar Coding - Test Specifications for Bar Code Scanners and Decoders

GOST

GOST R 70689-2023 Automobile roads of general use. Laser scanning. General requirements for work

Institute of Electrical and Electronics Engineers (IEEE)

IEEE Std 1149.1-1990 IEEE Standard Test Access Port and Boundary-Scan Architecture
IEEE Std 1149.1-2001 IEEE Standard Test Access Port and Boundary Scan Architecture

ES-UNE

UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

Association of German Mechanical Engineers

VDI/VDE 2630 Blatt 1.2-2010 Computed tomography in dimensional measurement - Influencing variables on measurement results and recommendations for computed tomography dimensional measurements

AENOR

UNE-ISO 4593:2010 Plastics -- Film and sheeting -- Determination of thickness by mechanical scanning

US-FCR

FCR 21 CFR PART 212-2014 CURRENT GOOD MANUFACTURING PRACTICE FOR POSITRON EMISSION TOMOGRAPHY DRUGS
FCR 21 CFR PART 212-2015 CURRENT GOOD MANUFACTURING PRACTICE FOR POSITRON EMISSION TOMOGRAPHY DRUGS
FCR 21 CFR PART 212-2013 CURRENT GOOD MANUFACTURING PRACTICE FOR POSITRON EMISSION TOMOGRAPHY DRUGS

Others: