electron microscope

electron microscope, Total:124 items.

The international standard classification for "electron microscope" includes: Optical equipment , Physicochemical methods of analysis , Optics and optical measurements in general , Other standards related to analytical chemistry , Chemical technology (Vocabularies) , Laboratory medicine , Chemical analysis , Protection against crime .

The Chinese standard classification for "electron microscope" includes: Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Chemical Measurement , Crime judging technology .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 30543-2014 Nanotechnologies - Characterization of Single-Wall Carbon Nanotubes Using Transmission Electron Microscopy
GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary
GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM and XEDS
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 21636-2008 Microbeam analysis - Electron Probe Micro Analysis (EPMA) - Vocabulary
GB/T 43610-2023 Microbeam analysis—Analytical electron microscopy—Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
GB/T 21638-2008 Guide for electron beam microananlysis of defect in steel materials

Professional Standard - Machinery

JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 5383-1991 Specification for Transmission Electron Microscope
JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
JB/T 5480-1991 Diaphragm of Electron Microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
GB/T 33838-2017 Microbeam analysis―Scanning electron microscopy―Methods of evaluating image sharpness

Professional Standard - Education

JY/T 0581-2020 General analysis rules for transmission electron microscope
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 011-1996 General rules for transmission electron microscopy
JY/T 010-1996 General rules for analytical scanning electron microscopy

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary
GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy

National Metrological Verification Regulations of the People's Republic of China

JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy

Group Standards of the People's Republic of China

T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/CSTM 00162-2020 Calibration methods for transmission electron microscope

Professional Standard - Petroleum

SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope

Shanghai Provincial Standard of the People's Republic of China

DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

工业和信息化部

YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS H 7804:2005 Method for particle size determination in metal catalysts by electron microscope
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

GSO

OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness

British Standards Institution (BSI)

BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 15932:2013 Microbeam analysis. Analytical electron microscopy. Vocabulary
BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM

CN-STDBOOK

图书 a-4565 Practical Methods for Electron Microanalysis

Korean Agency for Technology and Standards (KATS)

KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS I 0051-1999 General rules for scanning electron microscopy
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method

SCC

BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method

Association Francaise de Normalisation

NF X21-016*NF ISO 15932:2014 Microbeam analysis - Analytical electron microscopy - Vocabulary
NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

American Society for Testing and Materials (ASTM)

ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization

RU-GOST R

GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols

VDI - Verein Deutscher Ingenieure

VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method