Microelectronics
Microelectronics, Total:34 items.
The international standard classification for "Microelectronics" includes: Chemical technology (Vocabularies) , Other standards related to analytical chemistry , Physicochemical methods of analysis .
The Chinese standard classification for "Microelectronics" includes: Basic standards and general methods , Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 32055-2015 Microbeam analysis―Electron probe microanalysis―Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
- GB/T 21636-2008 Microbeam analysis - Electron Probe Micro Analysis (EPMA) - Vocabulary
- GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 21638-2008 Guide for electron beam microananlysis of defect in steel materials
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
National Metrological Verification Regulations of the People's Republic of China
- JJG(电子) 18004-1989 HP4140B Picoampere Ammeter/DC Voltage Source Verification Regulations
- JJG(电子) 02009-1995 Verification Regulations for Analog Electronic Voltmeter
- JJG(电子) 18003-1988 261 type picoampere current source trial verification regulations
- JJG(电子) 12022-1989 VS13 type black and white TV electronic test card generator verification regulations
- JJG(电子) 11005-1988 18.6MHz and above frequency band electronic oscillator trial verification regulations
National Metrological Technical Specifications of the People's Republic of China
- JJF(电子) 01-1982 Verification method of general electronic counter
- JJF(电子) 19-1982 Verification method of GS-5A electronic tube tester
Professional Standard - Machinery
- JB/T 5481-1991 Lamp Filament of Electron Microscope
- JB/T 5480-1991 Diaphragm of Electron Microscope
Association of German Mechanical Engineers
- DVS 2803-1974 Electron-beam welding in microscopy (survey)
GSO
- GSO ISO 24639:2024 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
British Standards Institution (BSI)
- BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
- BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- 20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
- 21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
KR-KS
- KS D ISO TR 17270-2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
Korean Agency for Technology and Standards (KATS)
- KS D ISO TR 17270:2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
International Organization for Standardization (ISO)
- ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
electron microscope,Scanning Electron Microscopy,Electron Microanalysis,Microelectronics,Electron Microscopic Inspection,electron microprobe epma,Scanning Electron Microscopy,electron microscopy,Electron Microscopy,electron microscope,electron micrograph,electron microstructure,Electron Microsystem,Electron Microelectronics,electron microscope,Electron Microanalysis,electron microscope,electron microprobe,electron microtransmission,Transmission Electron Microscopy
