GB/T 32055-2015 in English
VALIDMicrobeam analysis―Electron probe microanalysis―Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
- Issued on:2015-10-09
- Implemented on:2016-09-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
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《GB/T 32055-2015微束分析 电子探针显微分析 波谱法元素面分析》由TC38(全国微束分析标准化技术委员会)归口,TC38SC3(全国微束分析标准化技术委员会新材料微束分析分会)执行,主管部门为国家标准化管理委员会。
本标准规定了使用电子探针波谱法进行元素面分析的方法。本标准规范了移动电子束对试样扫描的面分析(电子束面分析)和移动试样台的面分析(大面积面分析)两种模式的选择,给出了五种数据处理的方式:原始X射线强度法、K值法、校正曲线法、对比法和基体校正法。
Scope
This standard specifies the method for element surface analysis using electron probe spectroscopy. This standard regulates the selection of two modes of surface analysis (electron beam surface analysis) and moving sample table surface analysis (large area surface analysis) of the moving electron beam scanning the sample, and gives five data processing methods: Original X-ray intensity method, K value method, calibration curve method, contrast method and matrix correction method.

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