mass spectrometry molecular weight

mass spectrometry molecular weight, Total:333 items.

The international standard classification for "mass spectrometry molecular weight" includes: Chemical analysis , Powder metallurgy , Organic chemicals , Products of non-ferrous metals in general , Chemical reagents , Laboratory medicine , Metrology and measurement. Physical phenomena (Vocabularies) , Cadmium, cobalt and their alloys , Other standards related to analytical chemistry , Organic chemicals in general , Chemical analysis of metals , Physicochemical methods of analysis , Textiles in general , Woodworking machines , Non-metalliferous minerals , Testing of metals in general , Titanium and titanium alloys , Other non-ferrous metals and their alloys , Nickel, chromium and their alloys , Copper and copper alloys , Lead, zinc, tin and their alloys , Quality management and quality assurance .

The Chinese standard classification for "mass spectrometry molecular weight" includes: Basic standards and general methods , Rare refractory metals and their compounds , Coal tar processed products , Precious metal ore , Chemical reagent in general , Medical laboratory equipment , Basic standards and general methods , Precious metals and its alloy analysis method , Electrochemical, thermochemistry and optical profile type analyzer , Organic chemicals in general , Powder metallurgy analysis method , Basic standards and general methods , Other non-metal ore , chromatograph , Light metals and their alloys analysis method , Rare light metals and their alloys , Heavy metals and their alloys analysis method , Rare metals and their alloys analysis method , Standardization and Quality Management .

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
GB/T 40374-2021 Hardmetals—Determination of lead and cadmium content—Flame atomic absorption spectrometric method and inductively coupled plasma atomic emission spectrometry
GB/T 40798-2021 Chemical analysis method of ion-adsorption rare earth ore—Determination of total rare earth contents—Inductively coupled plasma mass spectrometry
GB/T 7739.14-2019 Methods for chemical analysis of gold concentrates—Part 14:Determination of thallium content—Inductively coupled plasma atomic emission spectrometry and inductively coupled plasma mass spectrometry
GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
GB/T 38397-2019 Coal tar—Determination of component content—Gas chromatography-mass spectrometry and thermogravimetry
GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
GB/T 39486-2020 Chemical reagent—General rules for inductively coupled plasma mass spectrometry

国家药监局

YY/T 1795-2021 Sperm quality analyzer

工业和信息化部

YS/T 1496-2021 Analysis method for palladium compounds Determination of impurity anion content Ion chromatography
YS/T 474-2021 Chemical analysis methods of high purity gallium-Determination of trace element-Inductively coupled plasma mass spectrometry
YS/T 1261-2018 Method for chemical analysis of hafnium-Determination of impurity element contents-Inductively coupled plasma atomic emission spectrometry
YS/T 870-2020 Method for chemical analysis of aluminium - Determination of trace impurities contents - Inductively coupled plasma mass spectrometry
YS/T 1497-2021 Analysis method for platinum compounds Determination of impurity anion content Ion chromatography

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 29732-2013 Surface chemical analysis—Medium resolution Auger electron spectrometers—Calibration of energy scales for elemental analysis
GB/T 32055-2015 Microbeam analysis―Electron probe microanalysis―Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
GB/T 13747.27-2020 Methods for chemical analysis of zirconium and zirconium alloys—Part 27：Determination of trace impurities content—Inductively coupled plasma mass spectrometry
GB/T 6041-2020 General rules for mass spectrometric analysis
GB/T 15249.5-1994 Crude Gold-Determination of mercury content-Cold atomic absorption spectrometric method
GB/T 6041-2002 General rules for mass spectrometric analysis
GB/T 15337-2008 General rules for atomic absorption spectrometric analysis
GB/T 28634-2012 Microbeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
GB/T 42699.1-2023 Textiles—Qualitative and quantitative proteomic analysis of some animal hair fibres—Part 1:Peptide detection using LC-ESI-MS with protein reduction
GB/T 17359-2023 Microbeam analysis—Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
GB/T 29858-2013 Standard guidelines for molecular spectroscopy multivariate calibration quantitative analysis
GB/T 20255.5-2006 Methods for chemical analysis of hardmetals - Determination of chromium content - Flame atomic absorption spectrometric method
GB/T 43663-2024 Surface chemical analysis—Secondary-ion mass spectrometry—Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
GB/T 17359-2012 Microbeam analysis - Quantitative analysis using energy dispersive spectrometry
GB/T 15337-1994 General rules for atomic absorption spectrometric analysis
GB/T 32495-2016 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon
GB/Z 35959-2018 General rule for liquid chromatography-mass spectrometry
GB/T 25186-2010 Surface chemical analysis—Secondary-ion mass spectrometry—Determination of relative sensitivity factors from ion-implanted reference materials
GB/T 15249.5-2009 Methods for chemical analysis of crude gold - Part 5: Determination of mercury content - Cold atomic absorption spectrometry

Professional Standard - Geology

DZ/T 0064.80-2021 Methods for analysis of groundwater quality- Part 80: Determination of forty elements (lithium, rubidium, cesium, etc)contents- Inductively coupled plasma mass spectrometry
DZ/T 0064.81-2021 Methods for analysis of groundwater quality- Part 81: Determination of mercury content- Atomic fluorescence spectrometry
DZ/T 0064.38-2021 Methods for analysis of groundwater quality- Part 38: Determination of selenium content- Hydride generation-atomic fluorescence spectrophotometry
DZ/T 0064.11-2021 Methods for analysis of groundwater quality- Part 11: Determination of arsenic content- Hydride generation atomic fluorescence spectrometry
DZ/T 0064.28-2021 Methods for analysis of groundwater quality- Part28: Determination of potassium, sodium lithium and ammonium contents- Ion chromatography
DZ/T 0279.7-2016 Analysis methods for regional geochemical sample. Part 7: Determination of molybdenum contents by inductively coupled plasma mass spectrometry

Taiwan Provincial Standard of the People's Republic of China

CNS 12509-1989 General Rules Analytical Methods in Gas Chromatography/Mass Spectrometry
CNS 12416-2006 General rules for atomic emission spectrometry
CNS 12013-1987 Method of Test for Lead in Gasoline by Atomic Absorption Spectrometry
CNS 11209-1995 General Rules for Chemical Analysis by Atomic Absorption Spectrophotometry
CNS 14896-14-2005 Titanium - Method for atomic emission spectrometric analysis
CNS 12511-1989 General Rules for Mass Spectrometric Analysis
CNS 14896.14-2005 Titanium - Method for atomic emission spectrometric analysis

Professional Standard - Education

JY/T 020-1996 General rules for ion chromatograpy
JY/T 0568-2020 General rules for inductively coupled plasma-mass spectrometry
JY/T 0575-2020 General rules of analytical methods for ion chromatography
JY/T 003-1996 General principles for organic mass spectrometry

Professional Standard - Petroleum

SY/T 6242-1996 Gas Chromatography Analysis Method of Oleaginous Colloid Wax Content in Crude Oil

Professional Standard - Non-ferrous Metal

YS/T 896-2013 Methods for Chemical Analysis of High Purity Niobium - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
YS/T 870-2013 Chemical Analysis of High Purity Aluminium-Determination of Trace Impurities Inductively Coupled Plasma Mass Spectrometry
YS/T 892-2013 Methods for Chemical Analysis of High Purity Titanium - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
YS/T 898-2013 Methods for Chemical Analysis of The High Purity Tantalum - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
YS/T 244.9-2008 Chemical analysis methods of high purity aluminum Part 9: Determination of trace impurities in high pruity aluminumby inductively coupled mass spectrometry
YS/T 474-2005 Determination of trace elements in high-purity gallium--ICP-MS analytical method
YS/T 900-2013 Methods for Chemical Analysis of The High Purity Tungsten - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry

国家能源局

SY/T 7361-2017 Quadrupole mass spectrometry for rare gas separation and component content analysis
SY/T 6404-2018 Analytical method for metal elements in rock by ICP-AES and ICP-MS

Professional Standard - Aviation

HB 6731.9-1993 Determination of Chromium Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB 5219.20-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Silver Content with Atomical Absorption Spectrometry Method
HB 6731.2-1993 Determination of Magnesium Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB 6731.3-1993 Determination of Zinc Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB 6731.8-1993 Determination of Nickel Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB 5219.3-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Copper Content with Atomical Absorption Spectrometry Method
HB 5219.8-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Manganese Content with Atomical Absorption Spectrometry Method
HB 6731.6-1993 Determination of Iron Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB 5219.11-1998 Methods for Chemical Analysis of Magnesium Alloy- Determination of Nickel Content Through Atomical Absorption Spectrometry
HB 5219.13-1998 Methods for Chemical Analysis Ofmagnesium Alloy - Determination of Zinc Content Through Atomical Absorption Spectrometry
HB 5219.5-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Iron Content with Atomical Absorption Spectrometry Method

Group Standards of the People's Republic of China

T/ZPP 017-2023 Mass Cytometry Analyzer
T/SCS 000022-2024 Molybdenum alloys – Analysis of trace elements – Glow discharge mass spectrometry method

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 8151.21-2017 Methods for chemical analysis of zinc concentrates - Part 21: Determination of thallium content - Inductively coupled plasma mass spectrometry and inductively coupled plasma-atomic emission spectrometry
GB/T 35655-2017 Guideline for verification and validation of chemical analysis method and internal quality control—Chromatography
GB/T 3884.19-2017 Methods for chemical analysis of copper concentrates - Part 19: Determination of thallium content - Inductively coupled plasma mass spectrometry
GB/T 33236-2016 Polycrystalline silicon―Determination of trace elements―Glow discharge mass spectrometry method
GB/T 20899.14-2017 Methods for chemical analysis of gold ores - Part 14: Determination of thallium content - Inductively coupled plasma atomic emission spectrometry and inductively coupled plasma mass spectrometry
GB/T 8152.13-2017 Methods for chemical analysis of lead concentrates - Part 13: Determination of thallium content - Inductively coupled plasma mass spectrometry and inductively coupled plasma-atomic emission spectrometry

Liaoning Provincial Standard of the People's Republic of China

DB21/T 2070-2013 Chemical Analysis of Aluminosilicate Refractories by Atomic Absorption Spectrometry

Military Standard of the People's Republic of China-General Armament Department

GJB 5168-2003 Lithium isotope abundance mass spectrometry

International Organization for Standardization (ISO)

ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
ISO 16564:2004 Rubber, raw natural - Determination of average molecular mass and molecular-mass distribution by size exclusion chromatography (SEC)
ISO/DIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 18118:2004 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 18118:2015 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO/FDIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
ISO 22048:2004 Surface chemical analysis — Information format for static secondary-ion mass spectrometry
ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
ISO 16014-4:2012 Plastics - Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography - Part 4: High-temperature method
ISO 16014-4:2003 Plastics - Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography - Part 4: High-temperature method
ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
ISO 16564:2004/Amd 1:2006 Rubber, raw natural — Determination of average molecular mass and molecular-mass distribution by size exclusion chromatography (SEC) — Amendment 1
ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
ISO 16014-2:2012 Plastics - Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography - Part 2: Universal calibration method
ISO 13321:1996 Particle size analysis - Photon correlation spectroscopy
ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
ISO 16014-2:2003 Plastics - Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography - Part 2: Universal calibration method

British Standards Institution (BSI)

BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
BS ISO 17862:2013 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS ISO 17560:2014 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
BS ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS ISO 16564:2004 Rubber, raw natural - Determination of average molecular mass and molecular-mass distribution by size exclusion chromatography (SEC)
BS ISO 18118:2024 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
BS EN 12938:2000(2001) Methods for the analysis of pewter. Determination of alloying and impurity element contents by atomic spectrometry
BS ISO 22415:2019 Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
BS EN 12938:2000 Methods for the analysis of pewter. Determination of alloying and impurity element contents by atomic spectrometry
BS ISO 18118:2015 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
BS ISO 16564:2004(2006) Rubber, raw natural — Determination of averagemolecularmass and molecular - mass distribution by size exclusion chromatography (SEC)
BS ISO 16014-2:2012 Plastics. Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography. Universal calibration method
23/30461294 DC BS ISO 18118. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
BS DD ENV ISO 13530:1999 Water quality - Guide to analytical quality control for water analysis
BS DD ENV 13800:2000 Lead and lead alloys - Analysis by flame atomic absorption spectromerty (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), without separation of the lead matrix
BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
BS EN 16274:2021 Method for analysis of allergens. Quantification of an extended list of 57 suspected allergens in ready to inject fragrance materials by gas chromatography mass spectrometry
BS ISO 22048:2004 Surface chemical analysis. Information format for static secondary-ion mass spectrometry
BS ISO 22048:2004(2005) Surface chemical analysis — Information format for static secondary - ion mass spectrometry
BS ISO 18118:2005 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
BS ISO 16014-4:2012 Plastics. Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography. High-temperature method
BS EN 15111:2007 Foodstuffs - Determination of trace elements - Determination of iodine by ICP-MS (inductively coupled plasma mass spectrometry)
DD ENV ISO 13530:1999 Water quality. Guide to analytical quality control for water analysis
BS ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
BS ISO 19463:2018 Microbeam analysis. Electron probe microanalyser (EPMA). Guidelines for performing quality assurance procedures
BS ISO 16014-3:2012 Plastics. Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography. Low-temperature method
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
BS ISO 17973:2016 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
BS ISO 17858:2007 Water quality - Determination of dioxin-like polychlorinated Biphenyls - Method using gas-chromatography/mass spectrometry
BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
PD ISO/TR 23173:2021 Surface chemical analysis. Electron spectroscopies. Measurement of the thickness and composition of nanoparticle coatings
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures

GSO

GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
GSO ISO 24639:2024 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
OS GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
GSO ISO 18118:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
BH GSO ISO 17470:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
OS GSO ISO 18118:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
BH GSO ISO 18118:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
GSO ISO 18114:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
BH GSO ISO 13321:2016 Particle size analysis -- Photon correlation spectroscopy
GSO ISO 13321:2013 Particle size analysis -- Photon correlation spectroscopy
GSO ISO 22489:2015 Microbeam analysis -- Electron probe microanalysis -- Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
OS GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
BH GSO ISO 22048:2016 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
BH GSO ISO 22489:2017 Microbeam analysis -- Electron probe microanalysis -- Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
OS GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BH GSO ISO 14594:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
GSO ISO 10927:2013 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS)
OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
BH GSO ISO 11938:2017 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
BH GSO ISO 23830:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
OS GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

Association Francaise de Normalisation

NF ISO 17560:2006 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron in silicon by thickness profiling
NF T51-241:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).
NF ISO 14237:2010 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron atoms in silicon using uniformly doped materials
NF X11-672:1996 Particle size analysis. Photon correlation spectroscopy.
NF T30-711:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).
NF EN 13615:2002 Methods for the analysis of tin ingots - Determination of impurity contents in 99.90% and 99.85% quality tin by atomic spectrometry
NF EN ISO 22892:2011 Soil quality - Guidelines for the identification of target compounds by gas chromatography and mass spectrometry
NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
NF EN 1784:2003 Produits alimentaires - Détection d'aliments ionisés contenant des lipides - Analyse par chromatographie en phase gazeuse des hydrocarbures
NF X21-051*NF ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
NF EN 26777:1993 Water quality - Nitrite dosage - Molecular absorption spectrometry method
NF U44-145:1984 FERTILIZERS AND SOILS CONDITIONERS. DETERMINATION OF MAGNESIUM BY ATOMIC ABSORPTION SPECTROMETRIC METHOD.
NF X43-025:1988 Air quality. Ambient air. Determination of polycyclic aromatic hydrocarbons. High pressure liquid chromatography and gaz chromatography determination.
NF X31-439*NF EN ISO 22892:2011 Soil quality - Guidelines for the identification of target compounds by gas chromatography and mass spectrometry.
NF X21-004*NF ISO 22309:2012 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above.
NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire
NF ISO 23830:2009 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Repeatability and constancy of the scale of relative intensities in static mass spectrometry of secondary ions

Japanese Industrial Standards Committee (JISC)

JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers
JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
JIS K 0127:2001 General rules for ion chromatographic analysis
JIS K 0118:1979 General rules for mass spectrometric analysis
JIS K 0127:1992 General rules for ion chromatographic analysis
JIS K 0127:2013 General rules for ion chromatography
JIS K 0123:1995 General rules for analytical methods in gas chromatography mass spectrometry
JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
JIS K 0133:2022 General rules for ICP-mass spectrometry
JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
JIS H 1630:1995 Method for atomic emission spectrometric analysis of titanium
JIS K 7252-4:2008 Plastics -- Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography -- Part 4: High-temperature method
JIS K 7252-3:2008 Plastics -- Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography -- Part 3: Low-temperature method
JIS K 7252-3:2016 Plastics -- Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography -- Part 3: Low-temperature method
JIS K 0164:2010 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon

Korean Agency for Technology and Standards (KATS)

KS M 0027-2008 General rules for analytical methods in gas chromatography mass spectrometry
KS D ISO 7627-6-2022 Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 6：Determination of chromium in contents from 0.01 to 2 % (mass fraction)
KS D ISO 7627-6-2012(2017) Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 6：Determination of chromium in contents from 0.01 to 2 % (mass fraction)
KS D ISO 7627-6-2012(2022) Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 6：Determination of chromium in contents from 0.01 to 2 % (mass fraction)
KS D ISO 7627-4-2022 Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 4：Determination of molybdenum, titanium and vanadium in contents from 0.01 to 0.5 % (mass fraction)
KS D ISO 7627-2-2022 Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 2：Determination of calcium, potassium, magnesium and sodium in contents from 0.001 % to 0.02 % (mass fraction)
KS D ISO 7627-4-2012(2017) Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 4：Determination of molybdenum, titanium and vanadium in contents from 0.01 to 0.5 % (mass fraction)
KS M 0035-1993 General rules for ion chromatographic analysis
KS M 0025-2008(2018) General rules for mass spectrometric analysis
KS D ISO 7627-3-2022 Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 3：Determination of cobalt, iron, manganese and nickel in contents from 0.01 to 0.5 % (mass fraction)
KS M ISO 16564:2007 Rubber, raw natural－Determination of average molecular mass and molecular－mass distribution by size exclusion chromatography(SEC)
KS D ISO 18118-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
KS D ISO 7627-3-2012(2017) Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 3：Determination of cobalt, iron, manganese and nickel in contents from 0.01 to 0.5 % (mass fraction)
KS D ISO 7627-4-2012(2022) Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 4：Determination of molybdenum, titanium and vanadium in contents from 0.01 to 0.5 % (mass fraction)
KS D ISO 7627-2-2012(2017) Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 2：Determination of calcium, potassium, magnesium and sodium in contents from 0.001 % to 0.02 % (mass fraction)
KS M ISO 16564-2007(2022) Rubber, raw natural－Determination of average molecular mass and molecular－mass distribution by size exclusion chromatography(SEC)
KS M 0027-1993 General Rules for Analytical Methods in Gas Chromatography Mass Spectrometry
KS M ISO 16564-2007(2017) Rubber, raw natural－Determination of average molecular mass and molecular－mass distribution by size exclusion chromatography(SEC)
KS M 0027-2023 General rules for analytical methods in gas chromatography mass spectrometry
KS D ISO 7627-3-2012(2022) Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 3：Determination of cobalt, iron, manganese and nickel in contents from 0.01 to 0.5 % (mass fraction)
KS M 0025-2023 General rules for mass spectrometric analysis
KS D ISO 18118:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
KS D ISO 7627-2-2012(2022) Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 2：Determination of calcium, potassium, magnesium and sodium in contents from 0.001 % to 0.02 % (mass fraction)
KS D 1702-2020 Platium－Determination of trace-element content by inductively coupled plasma spectrometric analysis－Matrix matching method
KS D ISO 17560-2003(2018) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS M 0025-1993 General rules for mass spectrometric analysis
KS D ISO 7627-5-2022 Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 5：Determination of cobalt, iron, manganese, molybdenum, nickel, titanium and vanadium in contents from 0.5 to 2 % (mass fraction)
KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
KS M 0035-2023 General rules for ion chromatographic analysis
KS D 2553-2015 Tantalum－Method for atomic absorption spectrometric analysis
KS D ISO 7627-5-2012(2017) Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 5：Determination of cobalt, iron, manganese, molybdenum, nickel, titanium and vanadium in contents from 0.5 to 2 % (mass fracti
KS D ISO 22048-2020 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS I ISO 13530-2008(2018) Water quality－Guide to analytical quality control for water analysis
KS D ISO 17560:2003 Surface chemical analysis－Secondary-on mass spectrometry－ Method for depth profiling of boron in silicon
KS M 0035-2008 General rules for ion chromatographic analysis
KS D ISO 22048-2005(2020) Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 7627-5-2012(2022) Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 5：Determination of cobalt, iron, manganese, molybdenum, nickel, titanium and vanadium in contents from 0.5 to 2 % (mass fracti
KS M 0012-2009(2019) General rules for molecular absorptiometric analysis
KS D ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS E 3030-2007(2012) Atomic absorption spectrochemical analysis for iron ores
KS D 2553-2015(2020) Tantalum－Method for atomic absorption spectrometric analysis
KS D ISO 22489-2023 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS E 3030-1982 Atomic absorption spectrochemical analysis for iron ores
KS D ISO 14594-2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS M 0027-2008(2018) General rules for analytical methods in gas chromatography mass spectrometry
KS D ISO TR 17270:2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
KS D ISO 7627-3:2012 Hardmetals－Chemical analysis by flame atomic absorption spectrometry－Part 3：Determination of cobalt, iron, manganese and nickel in contents from 0.01 to 0.5 % (mass fraction)
KS D ISO 14237-2003(2018) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon
KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 18114-2020 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS D ISO 18114-2005(2020) Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials

Standard Association of Australia （SAA）

AS ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
AS ISO 22048:2006 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
AS ISO 22048:2006(R2016) Surface chemical analysis - Information format for static secondary-ion mass spectrometry
AS ISO 18118:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

SCC

10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
DANSK DS/EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry
NS-EN 12938:1999 Methods for the analysis of pewter — Determination of alloying and impurity element contents by atomic spectrometry
NS-EN 13615:2001 Methods for the analysis of ingot tin — Determination of impurity element contents in tin grades 99,90 % and 99,85 % by atomic spectrometry
BS ISO 18118:2004 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 17109:2015/DAmd 1 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films — A...
DANSK DS/EN 13615:2002 Methods for the analysis of ingot tin - Determination of impurity element contents in tin grades 99,90% and 99,85% by atomic spectrometry
BS ISO 22489:2006 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
VDI/VDE 2631 BLATT 11-2020 Shape measurement technology - spectral analysis (Fourier analysis, harmonic analysis)
BS PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
BS ISO 17973:2002 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis

KR-KS

KS M 0025-2008(2023) General rules for mass spectrometric analysis
KS D ISO 17560-2003(2023) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
KS M 0035-2008(2023) General rules for ion chromatographic analysis
KS M 0027-2008(2023) General rules for analytical methods in gas chromatography mass spectrometry
KS D ISO 14237-2003(2023) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon
KS I ISO 17294-2014 Water quality — Application of inductively coupled plasma mass spectrometry(ICP-MS)
KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 14595-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS I ISO 13530-2008(2023) Water quality－Guide to analytical quality control for water analysis
KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO TR 17270-2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy

AT-ON

ONORM M 6603-1-1997 Water analysis - Determination of potassium and sodium by atomic absorption spectrometry
ONORM M 6604-1995 Water analysis - Determination of selenium by atomic absorption spectrometry (hydride technique)
ONORM M 6253 Teil.1-1985 Water analysis; determination ofanionic Surfactants by the methylene blue spectrometric method

American Society for Testing and Materials (ASTM)

ASTM E1504-11 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM D2567-68(1978) Standard Method for MOLECULAR DISTRIBUTION ANALYSIS FOR MONOALKYLBENZENES BY MASS SPECTROMETRY
ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM UOP1037-20 Trace Metals Analysis in Liquefied Petroleum Gases by Inductively Coupled Plasma-Mass Spectrometry
ASTM C791-83(2000) Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Boron Carbide

Spanish Association for Standardization (UNE)

UNE-EN 12938:1999 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry
UNE-EN 13615:2001 Methods for the analysis of ingot tin - Determination of impurity element contents in tin grades 99,90 % and 99,85 % by atomic spectrometry
UNE-EN 13615:2001/AC:2002 Methods for the analysis of ingot tin - Determination of impurity element contents in tin grades 99,90 % and 99,85 % by atomic spectrometry (Endorsed by AENOR in February of 2003.)

RO-ASRO

STAS SR 12271-18-1996 Uranium dioxide. Uranium isotopic analysis by mass spectrometry

German Institute for Standardization

DIN EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry (includes AC:2000); German version EN 12938:1999 + AC:2000
DIN V ENV 13800:2000 Lead and lead alloys - Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES) without separation of the lead matrix; German version ENV 13800:2000
DIN 51009:2001 Optical atomic spectral analysis - Principles and definitions

SE-SIS

SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers

YU-JUS

JUS C.A1.546-1990 Hardmetals. Chemical analysis by flame atomic absorption spectrometry. Determi- natlon of chromium In ctmtents from 0,01 to 2 % (m/m)
JUS C.A1.650-1987 Methodes of chemical analysis of silver. Determination of impurities contents. Spectrographic metod".

RU-GOST R

GOST R 56240-2014 Copper. Spectral methods of impurity analysis
GOST 17261-2008 Zinc. Methods of atomic-emission spectral analysis
GOST R 57061-2016 Copper. Measurement of impurities mass fraction in copper by an inductively coupled plasma mass spectrometry method

Lithuanian Standards Office

LST EN 12938-2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry
LST EN 12938-2000/AC-2003 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry

Danish Standards Foundation

DS/EN 12938/AC:2001 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry
DS/EN 12938:2001 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry

NL-NEN

NEN-ISO 7627-6:1993 Hardmetals. Chemical analysis by flame atomic absorption spectrometry. Part 6: Determination of chromium in contents from 0,01 to 2 % (m/m) (ISO 7627-6:1985)

US-ACEI

IPC TM-650 2.3.28-1995 Ionic Analysis of Circuit Boards Ion Chromatography Method

IPC - Association Connecting Electronics Industries

IPC TM-650 2.3.28A-2004 Ionic Analysis of Circuit Boards@ Ion Chromatography Method
IPC TM-650 2.3.28B-2012 Ionic Analysis of Circuit Boards@ Ion Chromatography Method

European Committee for Standardization (CEN)

EN 15111:2007 Foodstuffs - Determination of trace elements - Determination of iodine by ICP-MS (inductively coupled plasma mass spectrometry)

TH-TISI

TIS 2250.4-2005 Plastics.determination of average molecular mass and molecular mass distribution of polymers using size.exclusion chromatography.part 4: high.temperature method
TIS 2250.3-2005 Plastics.determination of average molecular mass and molecular mass distribution of polymers using size.exclusion chromatography.part 3: low.temperature method
TIS 2250.1-2005 Plastics.determination of average molecular mass and molecular mass distribution of polymers using size.exclusion chromatography.part 1: general principles

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