YS/T 474-2005 in English
SUPERSEDEDDetermination of trace elements in high-purity gallium--ICP-MS analytical method
- Issued on:2005-05-18
- Implemented on:-
- File Format:PDF
- Delivery:Via email within 1~3 business days
$68.00
本标准规定了高纯镓中的铜、铅、锌、铟、铁、锡、镍、镁、钴、铬、锰、钛、铷、钼、铋等痕量素的测定方法。本标准适用于高纯镓中铜、铅、锌、铟、铁、锡、镍、镁、钴、铬、锰、钛、铷、钼、铋等痕量素含量的同时测定。
Scope
This standard specifies the determination method for the content of trace elements such as copper, lead, zinc, indium, iron, tin, nickel, magnesium, cobalt, chromium, manganese, titanium, rubidium, molybdenum, and bismuth in high-purity gallium. This standard applies to copper, lead, zinc, indium, iron, tin, nickel, magnesium, cobalt, chromium, manganese, titanium, rubidium, molybdenum, and bismuth in high-purity gallium (99.999% <ω (Ga) ≤ 99.999 99%) Simultaneous determination of trace element contents.

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