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Ionization Methods for Mass Spectrometry

Ionization Methods for Mass Spectrometry, Total:431 items.

The international standard classification for "Ionization Methods for Mass Spectrometry" includes: Chemical reagents , Chemical analysis , Other non-ferrous metals and their alloys , Organic chemicals in general , Copper and copper alloys , Lead, zinc, tin and their alloys , Products of non-ferrous metals in general , Biology. Botany. Zoology , Metalliferous minerals , Powder metallurgy , Other standards related to analytical chemistry , Advanced ceramics , Aluminium and aluminium alloys , Cadmium, cobalt and their alloys , Nickel, chromium and their alloys , Non-ferrous metals , Chemical analysis of metals , Titanium and titanium alloys , Testing of metals in general , Other products of the chemical industry .

The Chinese standard classification for "Ionization Methods for Mass Spectrometry" includes: chromatograph , Chemical reagent in general , Basic standards and general methods , Rare metals and their alloys analysis method , Organic chemicals in general , Heavy metals and their alloys analysis method , Precious metal ore , Basic Subject in general , Powder metallurgy analysis method , Precious metals and its alloy analysis method , Material composition analysis instrument and environment detection instrument in general , Rare refractory metals and their compounds , Special ceramics , Light metals and their alloys analysis method , Non-ferrous metal ores in general , Rare metals and their alloys , Basic standards and general methods for water treatment agent , Rare scattered metals and their alloys , Rare light metals and their alloys , Heavy metal ore , Semimetal and semiconductor material analysis method , Basic standard and general method , Metal physical property test method , Technical Management .


Professional Standard - Education

  • JY/T 0567-2020 General rules for inductively coupled plasma optical emission spectrometry
  • JY/T 003-1996 General principles for organic mass spectrometry
  • JY/T 0568-2020 General rules for inductively coupled plasma-mass spectrometry
  • JY/T 020-1996 General rules for ion chromatograpy
  • JY/T 004-1996 General rules for surface thermal ionisation isotope mass spectrometry
  • JY/T 0575-2020 General rules of analytical methods for ion chromatography

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 36402-2018 Thermal analysis-mass spectrometry coupling method for ceramics materials
  • GB/T 43604.1-2023 Methods for chemical analysis of gallium-based liquid metals—Part 1:Determination of lead|| cadmium|| mercury and arsenic contents—Inductively coupled plasma mass spectrometry
  • GB/T 39486-2020 Chemical reagent—General rules for inductively coupled plasma mass spectrometry
  • GB/T 12690.13-2003 Chemical analysis methods for non-rare earth impurities of rare earth metals and their oxides - Determination of molybdenum and tungsten content - Inductively coupled plasma atomic
  • GB/T 11848.12-2025 Method for the analysis of uranium ore concentrates - Part 12: Determination of boron - Inductively coupled plasma mass spectrometry
  • GB/T 25934.3-2010(英文版) "Methods for chemical analysis of high purity gold—Part 3:Ethyl ether extraction separation inductively coupled plasma atomic emission spectrometry—Determination of impurity elements contents"
  • GB/T 6041-2002 General rules for mass spectrometric analysis
  • GB/T 25934.1-2010(英文版) Methods for chemical analysis of high purity gold—Part 1: Ethyl acetate extraction separationinductively coupled plasmaatomic emission spectrometry—Determination of impurity elements contents
  • GB/T 12690.12-2024 Chemical analysis methods for non-rare earth impurities of rare earth metals and their oxides—Part 12: Determination of thorium and uranium contents—Inductively coupled plasma mass spectrum method
  • GB/T 36590-2018(英文版) Method for chemical analysis of high purity silver—Determination of trace impurity elements contents—Glow discharge mass spectrometry
  • GB/T 14849.4-2014 Methods for chemical analysis of silicon metal - Part 4:Determination of impurity contents - Inductively coupled plasma atomic emission spectrometric method
  • GB/T 8151.21-2017 Methods for chemical analysis of zinc concentrates - Part 21: Determination of thallium content - Inductively coupled plasma mass spectrometry and inductively coupled plasma-atomic emission spectrometry
  • GB/T 43663-2024 Surface chemical analysis—Secondary-ion mass spectrometry—Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • GB/T 20931.12-2025 Methods for chemical analysis of lithium—Part 12:Determination of impurity element contents—Inductively coupled plasma atomic emission spectrometry
  • GB/T 36590-2018 Method for chemical analysis of high purity silver—Determination of trace impurity elements contents—Glow discharge mass spectrometry
  • GB/T 5123-1985 Nickel-Method of spectral analysis
  • GB/T 5124.5-2024 Methods for chemical analysis of hardmetals—Part 5:Determination of tantalum and niobium content—Inductively coupled plasma emission spectrometry
  • GB/T 14352.24-2022 Methods for chemical analysis of tungsten ores and molybdenum ores—Part 24: Determination of germanium conten—Inductively coupled plasma mass spectrometry
  • GB/T 12690.12-2003 Neodymium and samarium-Determination of oxygen content-Impulse-infrared absorption method
  • GB/T 37211.3-2022 Method for chemical analysis of metal germanium—Part 3: Determination of trace impurity elements content—Glow discharge mass spectrometry
  • GB/T 22572-2008 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • GB/T 37847-2019 General rules for isotope composition analysis by mass spectrometry
  • GB/T 45768-2025 Surface chemical analysis—Secondary ion mass spectrometry—Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • GB/T 26416.2-2010 Chemical analysis methods of dysprosium ferroalloy—Part 2:Determination of rare earth impurity contents—Inductively coupled plasma atomic emission spectrometry
  • GB/T 33682-2017 General microganism identification method with matrix-assisted laser desorption/ionization time of flight mass spectrometry
  • GB/T 12690.5-2003 Chemical analysis methods for non-rare earth impurities of rare earth metals and their oxides Determination of Al、Cr、Mn、Fe、Co、Ni、Cu、Zn、Pb content by inductively coupled plasma atomic emission spectrographic method Determination of Co、Mn、Pb、Ni
  • GB/T 11067.4-2006 Methods for chemical analysis of silver - Determination of antimony content - The inductively coupled plasma atomic emission spectrometric method
  • GB/T 8152.13-2017 Methods for chemical analysis of lead concentrates - Part 13: Determination of thallium content - Inductively coupled plasma mass spectrometry and inductively coupled plasma-atomic emission spectrometry
  • GB/T 7739.14-2019 Methods for chemical analysis of gold concentrates—Part 14:Determination of thallium content—Inductively coupled plasma atomic emission spectrometry and inductively coupled plasma mass spectrometry
  • GB/T 11848.11-2025 Method for the analysis of uranium ore concentrates - Part 11: Determination of thorium - Inductively coupled plasma mass spectrometry
  • GB/T 25934.2-2010(英文版) Methods for chemical analysis of high purity gold—Part 2: Inductively coupled plasma mass spectrometry standard enter emendation innerstandard method—Determination of impurity elements contents
  • GB/T 23362.4-2009 Methods for chemical analysis of high purity indium hydroxide - Part 4: Determination of aluminum iron copper zinc cadmium lead and thallium content - Inductively coupled plasma mas
  • GB/T 32495-2016 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon
  • GB/T 20899.14-2017 Methods for chemical analysis of gold ores - Part 14: Determination of thallium content - Inductively coupled plasma atomic emission spectrometry and inductively coupled plasma mass spectrometry
  • GB/T 45020-2024 Methods for chemical analysis of niobium hafnium alloys—Determination of trace impurity elements content—Inductively coupled plasma mass spectrometry
  • GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • GB/T 23364.4-2009 Methods for chemical analysis of high purity indium oxide - Part 4: Determination of aluminum iron copper zinc cadmium lead and thallium content - Inductively coupled plasma mass spectrometry
  • GB/T 37837-2019 General rules for quadrupole inductively coupled plasma mass spectrometry
  • GB/T 40374-2021 Hardmetals—Determination of lead and cadmium content—Flame atomic absorption spectrometric method and inductively coupled plasma atomic emission spectrometry
  • GB/T 8647.11-2019 Methods for chemical analysis of nickel-Part 11:Determination of magnesium,aluminum,manganese,cobalt,copper,zinc,cadmium,tin,antimony,lead,bismuth contents-Inductively coupled plasma mass spectrometry
  • GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • GB/T 14353.20-2019 Methods for chemical analysis of copper ores, lead ores and zinc ores—Part 20 : Determination of rhenium content—Inductively coupled plasma mass spectroscopy
  • GB/T 16484.2-2009 Chemical analysis methods of rare earth chloride and light rare earth carbonate—Part 2:Determination of europium oxide content—Inductively coupled plasma mass spectrometry
  • SPC GB/T 37211.2-2018 Methods for chemical analysis of germanium metal -- Part 2:Determination of aluminium,iron,copper,nickle,lead,cadmium,magnesium,cobalt,indium,zinc content -- Inductively coupled plasma mass spectrometry method (TEXT OF DOCUMENT IS IN CHINESE)
  • GB/T 4324.13-2008 Methods for chemical analysis of tungsten - Determination of calcium content - The inductively coupled plasma atomic emission spectrometry
  • GB/T 39285-2020 Method for chemical analysis of palladium compounds—Determination of chlorine content—Ion chromatography
  • GB/T 3884.19-2017 Methods for chemical analysis of copper concentrates - Part 19: Determination of thallium content - Inductively coupled plasma mass spectrometry
  • GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • GB/T 12690.12-2024(英文版) Non-rare earth impurities in rare earth metals and their oxides Chemical analysis methods Part 12: Determination of thorium and uranium content Inductively coupled plasma mass spectrometry
  • GB/T 13747.27-2020 Methods for chemical analysis of zirconium and zirconium alloys—Part 27:Determination of trace impurities content—Inductively coupled plasma mass spectrometry
  • GB/T 43098.2-2023 Analysis of water treatment chemicals—Part 2: Determination of arsenic, mercury, cadmium, chromium, lead, nickel and copper—Inductively coupled plasma mass spectrometry(ICP-MS)
  • GB/Z 35959-2018 General rule for liquid chromatography-mass spectrometry
  • GB/T 6041-2020 General rules for mass spectrometric analysis
  • GB/T 40798-2021 Chemical analysis method of ion-adsorption rare earth ore—Determination of total rare earth contents—Inductively coupled plasma mass spectrometry
  • GB/T 26416.2-2022 Chemical analysis method for rare earth ferroalloy—Part 2: Determination of rare earth impurity contents—Inductively coupled plasma emission spectrometry

Professional Standard - Non-ferrous Metal

  • YS/T 281.17-2011 Methods for chemical analysis of cobalt- Part 17:Determination of aluminum,manganese nickel copper zinc,cadmium tin arsenic antimony lead and bismuth content-Inductively coupled plasma mass spectrometery
  • YS/T 1072-2015 Chemical analysis methods of palladium-carbon―Determination of palladium contents―Inductively coupled plasma-atomic emission spectrometry
  • YS/T 276.11-2011 Methods for chemical analysis of indium Part 11:Determination of arsenic aluminium lead iron copper cadmium tin thallium zinc and bismuth content-Inductively coupled plasma mass spectrometry
  • YS/T 666-2008 Chemical analysis emthods of gallium for industrial use - Determination of impurity elements - Inductively coupled plasma atomic emission spectrometric method
  • YS/T 445.14-2019 Methods for chemical analysis of silver concentrates - Part 14: Determination of thallium content Inductively coupled plasma-mass spectrometry and inductively coupled plasma atomic emission spectrometry
  • YS/T 891-2013 Methods for Chemical Analysis of High Purity Titanium - Determination of Trace Impurity Element Content - Glow Discharge Mass Spectrometry
  • YS/T 1506-2021 Chemical analysis method of high-purity iridium Determination of impurity element content Glow discharge mass spectrometry
  • YS/T 1473-2021 Chemical analysis method of high purity molybdenum Determination of trace impurity elements Glow discharge mass spectrometry
  • YS/T 540.5-2018 Methods for chemical analysis of vanadium-Part 5:Determination of impurity contents-Inductively coupled plasma atomic emission spectrometry
  • YS/T 897-2013 Methods for Chemical Analysis of High Purity Niobium - Determination of Trace Impurity Element Content - Glow Discharge Mass Spectrometry
  • YS/T 917-2013 Chemical Analysis Methods for High Purity Cadmium Determination of Trace Impurity Elements Content Glow Discharge Mass Spectrometry
  • YS/T 461.12-2016 Methods for chemical analysis of lead and zinc bulk concentrates-Part 12:Determination of thallium content-Inductively coupled plasma mass spectrometry and inductively coupled plasma atomic emission spectrometry
  • YS/T 1012-2014 Methods for chemical analysis of high purity nickel—Determination of trace impurity elements content—Glow discharge mass spectrometry
  • YS/T 1654-2023 Methods for chemical analysis of high purity gallium nitride —Determination of trace impurity elements contents —Glow discharge mass spectrometry
  • YS/T 1495-2021 Chemical analysis method for high purity rhodium Determination of impurity element content Glow discharge mass spectrometry
  • YS/T 473-2005 Determination of impurity elements in gallium for industrial use - ICP-MS analytical method
  • YS/T 922-2013 Methods for Chemical Analysis of High Purity Copper Determination of Trace Impurity Elements Content Glow Discharge Mass Spectrometry
  • YS/T 981.2-2014 Methods for chemical analysis of high purity indium—Determination of magnesium,aluminum,iron,nickel,copper,zinc,silver,cadmium,tin and lead—Inductively coupled plasma mass spectrometry
  • YS/T 900-2024 Methods for chemical analysis of high purity tungsten —— Determination of trace impurity element content —— Inductively coupled plasma mass spectrometry
  • YS/T 1494-2021 Chemical analysis method for high purity gold Determination of impurity element content Glow discharge mass spectrometry
  • YS/T 892-2013 Methods for Chemical Analysis of High Purity Titanium - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
  • YS/T 1593.4-2023 Methods for chemical analysis of crude lithium carbonate— Part 4:Determination of anion contents— Ion chromatography
  • YS/T 244.9-2008 Chemical analysis methods of high purity aluminum Part 9: Determination of trace impurities in high pruity aluminumby inductively coupled mass spectrometry
  • YS/T 1603.3-2023 Methods for chemical analysis of tungsten-based high specific gravity alloys Part 3: Determination of aluminum, magnesium and calcium contents by inductively coupled plasma mass spectrometry
  • YS/T 1563.4-2022 Methods for chemical analysis of molybdenum rhenium alloy- Part 4: Determination of aluminum, calcium, copper, iron, magnesium, manganese, nickel, tin and tungsten contents- Inductively coupled plasma mass spectrometry
  • YS/T 1011-2014 Methods for chemical analysis of high purity cobalt—Determination of impurity elements content—Glow discharge mass spectrometry
  • YS/T 870-2013 Chemical Analysis of High Purity Aluminium-Determination of Trace Impurities Inductively Coupled Plasma Mass Spectrometry
  • YS/T 896-2024 Methods for chemical analysis of high purity niobium —— Determination of trace impurity elements content —— Inductively coupled plasma mass spectrometry
  • YS/T 1347-2020 Method for chemical analysis of high purity hafnium-Determination of trace impurity elements content-Glow discharge mass spectrometry
  • YS/T 898-2013 Methods for Chemical Analysis of The High Purity Tantalum - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
  • YS/T 473-2015 Methods for chemical analysis industrial gallium―Determination of impurity elements―ICP-MS analytical method
  • YS/T 539.9-2024 Methods for chemical analysis of nickel base alloy powder—Part9: Determination of impurity elements contents—Inductively coupled plasma atomic emission spectrometry
  • YS/T 474-2005 Determination of trace elements in high-purity gallium--ICP-MS analytical method
  • YS/T 1599-2023 Method for chemical analysis of high purity zirconium —— Determination of trace impurity elements content —— Glow discharge mass spectrometry
  • YS/T 34.1-2011 Method for chemical analysis of the high-purity arsenic—Inductive coupling plasma mass spectrum (ICP-MS) for determinating the concentration of elements in the high-purity arsenic
  • YS/T 895-2013 Methods for Chemical Analysis of High Purity Rhenium - Determination of Trace Impurity Element Content - Glow Discharge Mass Spectrometry
  • YS/T 1122.2-2016 Methods for chemical analysis of(hydro) chloroplatinic acid--Part 2: determination of palladium, rhodium, iridium, gold, silver, chromium, copper, iron, nickel, lead, tin contents--Inductivity coupled plasma mass spectrometry
  • YS/T 1075.14-2023 Methods for chemical analysis of vanadium-aluminium and molybdenum-aluminium master alloys— Part 14:Determination of trace impurities content— Inductively coupled plasma mass spectrometry
  • YS/T 899-2013 Methods for Chemical Analysis of High Purity Tantalum - Determination of Trace Impurity Element Content - Glow Discharge Mass Spectrometry
  • YS/T 745.10-2023 Methods for chemical analysis of copper anode?slime- Part 10: Determination of iridium?and rhodium?contents- Nickel sulphide fire assay -inductively coupled plasma mass spectrometry
  • YS/T 742-2010 Methods for chemical analysis of gallium oxide Determination of impurities Inductively coupled plasma mass spectrometer method
  • YS/T 892-2024 Method for chemical analysis of high purity titanium —— Determination of trace impurity elements content —— Inductively coupled plasma mass spectrometry
  • YS/T 1530-2022 Method for chemical analysis of high purity tin—Determination of impurity elements contents—Glow discharge mass spectrometry
  • YS/T 871-2013 Chemical analysis of high purity aluminium—Determination of trace impurities—Glow discharge mass spectrometry
  • YS/T 630-2016 Chemical analysis method of alumina-Determination of impurities in alumina一 ICP-AES analytical method
  • YS/T 1505-2021 Chemical analysis method of high purity ruthenium Determination of impurity element content Glow discharge mass spectrometry
  • YS/T 820.9-2012 Methods for Chemical Analysis of Lateritic Nickel Ore - Part 9: Determination of Scandium and Cadmium Contents - Inductively Coupled Plasma Mass Spectrometry
  • YS/T 1493-2021 Chemical analysis method for high purity platinum Determination of impurity element content Glow discharge mass spectrometry
  • YS/T 1497-2021 Analysis method for platinum compounds Determination of impurity anion content Ion chromatography
  • YS/T 630-2007 Chemical analysis methods of alumina Determination of impurities in Alumina inductively coupled plasma atomic emission spectrometric method
  • YS/T 871-2023 Method for chemical analysis of pure aluminium- Determination of trace impurity elements content- Glow discharge mass spectrometry
  • YS/T 1261-2018 Method for chemical analysis of hafnium-Determination of impurity element contents-Inductively coupled plasma atomic emission spectrometry
  • YS/T 474-2021 Chemical analysis methods of high purity gallium-Determination of trace element-Inductively coupled plasma mass spectrometry
  • YS/T 1287-2018 Method for chemical analysis of high purity cadium- Determination of magnesium, aluminum, calium, chromium, iron nickel, copper, zinc, silver, tin, antimony, lead, bismuth contents- Inductively coupled plasma-mass spectrum method
  • YS/T 1171.13-2021 Methods for chemical analysis of recycled zinc raw materials Part 13: Determination of thallium content by inductively coupled plasma mass spectrometry and inductively coupled plasma atomic emission spectrometry
  • YS/T 901-2013 Methods for Chemical Analysis of High Purity Tungsten - Determination of Trace Impurity Element Content - Glow Discharge Mass Spectrometry
  • YS/T 1380-2020 Method for chemical analysis of rhodium compounds. Determination of the chloride ion and nitrate ion contents. Ion chromatography method
  • YS/T 1050.10-2016 Methods for chemical analysis of lead-antimony concentrate. Part 10: Determanation of thallium. Inductively coupled plasma mass spectrometry and inductively coupled plasma atomic emission spectrometry
  • YS/T 896-2013 Methods for Chemical Analysis of High Purity Niobium - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
  • YS/T 1496-2021 Analysis method for palladium compounds Determination of impurity anion content Ion chromatography
  • YS/T 900-2013 Methods for Chemical Analysis of The High Purity Tungsten - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
  • YS/T 1781.4-2025 Methods for chemical analysis of high temperature shape memory alloys —— Part 4: Determination of trace impurity elements —— Inductively coupled plasma mass spectrometry
  • YS/T 1504-2021 High purity palladium chemical analysis method Determination of impurity element content Glow discharge mass spectrometry
  • YS/T 1198-2017 Silver chemical analysis method Determination of copper, bismuth, iron, lead, antimony, palladium, selenium, tellurium, arsenic, cobalt, manganese, nickel, tin, zinc, cadmium by inductively coupled plasma mass spectrometry
  • YS/T 739.3-2020 Methods for chemical analysis of aluminium electrolyte - Part 3:Determination of sodium, calcium, magnesium, potassium and lithium elements contents - Inductively coupled plasma atomic emission spectrometric method
  • YS/T 953.11-2014 Methods for chemical analysis of fire smelting nickel substrate material―Part 11:Determination of Lead,Arsenic,Cadmium and Mercury contents―Inductively coupled plasma-mass spectrometric method
  • YS/T 1115.13-2016 Methods for chemical analysis of copper ores and tailings Part 13: Determination of fluorine content Ion-selective electrode method and ion chromatography
  • YS/T 898-2024 Method for chemical analysis of high purity tantalum —— Determination of trace impurity elements content —— Inductively coupled plasma mass spectrometry
  • YS/T 928.5-2013 Methods for Chemical Analysis of Nickel Cobalt Manganese Composite Hydroxide Part 5: Determination of Lead Contents Inductively Coupled Plasma Mass Spectrometry
  • YS/T 870-2020 Method for chemical analysis of aluminium - Determination of trace impurities contents - Inductively coupled plasma mass spectrometry

Professional Standard - Petroleum

  • SY/T 5258-1991 Chromatography-mass spectrometry identification method for biomarkers
  • SY/T 7361-2017 Quadrupole mass spectrometry for rare gas separation and component content analysis
  • SY/T 6404-2018 Analytical method for metal elements in rock by ICP-AES and ICP-MS
  • SY/T 6242-1996 Gas Chromatography Analysis Method of Oleaginous Colloid Wax Content in Crude Oil

Professional Standard - Geology

  • DZ/T 0279.8-2016 Analysis methods for regional geochemical sample. Part 8: Determination of thallium contents by inductively coupled plasma mass spectrometry
  • DZ/T 0064.54-2021 Methods for analysis of groundwater quality- Part 54: Determination of fluoride- Ion-selective electrode method
  • DZ/T 0279.6-2016 Analysis methods for regional geochemical sample. Part 6: Determination of uranium contents by inductively coupled plasma mass spectrometry
  • DZ/T 0279.30-2016 Analysis methods for regional geochemical sample. Part 30: Determination of tungsten contents by alkali fusion-inductively coupled plasma mass spectrometry
  • DZ/T 0184.2-2024 Isotope analysis methods for geological samples - Part 2: Determination of isotope ages of zircon uranium-lead system using thermal ionization mass spectrometry
  • DZ/T 0279.7-2016 Analysis methods for regional geochemical sample. Part 7: Determination of molybdenum contents by inductively coupled plasma mass spectrometry
  • DZ/T 0279.5-2016 Analysis methods for regional geochemical sample. Part 5: Determination of cadmium contents by inductively coupled plasma mass spectrometry
  • DZ/T 0064.80-2021 Methods for analysis of groundwater quality- Part 80: Determination of forty elements (lithium, rubidium, cesium, etc)contents- Inductively coupled plasma mass spectrometry
  • DZ/T 0184.7-2024 Isotope analysis methods for geological samples Part 7: Determination of isotope age of molybdenite with the rhenium-osmium system by inductively coupled plasma mass spectrometry
  • DZ/T 0184.4-2024 Isotope analysis methods for geological samples - Part 4: Determination of isotopic ages of samarium-neodymium system and neodymium isotope ratios of geological samples - Thermal ionization mass spectrometry
  • DZ/T 0279.16-2016 Analysis methods for regional geochemical sample. Part 16: Determination of germanium contents by inductively coupled plasma mass spectrometry
  • DZ/T 0279.24-2016 Analysis methods for regional geochemical sample. Part 24: Determination of iodine contents by inductively coupled plasma mass spectrometry
  • DZ/T 0064.42-2021 Methods for analysis of groundwater quality - Part 42: Determination of calcium, magnesium, potassium, sodium, aluminum, iron, strontium, barium and manganese by inductively coupled plasma emission spectrometry
  • DZ/T 0184.6-2024 Isotope analysis methods for geological samples - Part 6: Determination of isotope age of vein quartz using the rubidium-strontium system - Thermal ionization mass spectrometry
  • DZ/T 0184.16-2024 Isotope analysis methods for geological samples Part 16: Determination of lead isotope composition of geological samples by multi-collector inductively coupled plasma mass spectrometry
  • DZ/T 0184.15-2024 Isotope analysis methods for geological samples. Part 15: Determination of lead isotope composition of geological samples by thermal ionization mass spectrometry
  • DZ/T 0184.5-2024 Isotope analysis methods for geological samples. Part 5: Determination of isotope ages of rubidium-strontium systems and strontium isotope ratios of geological samples by thermal ionization mass spectrometry
  • DZ/T 0184.17-2024 Isotope analysis methods for geological samples Part 17: Determination of osmium isotope composition of rocks by negative thermal ionization mass spectrometry
  • DZ/T 0064.28-2021 Methods for analysis of groundwater quality- Part28: Determination of potassium, sodium lithium and ammonium contents- Ion chromatography

Anhui Provincial Standard of the People's Republic of China

  • DB34/T 3368.2-2019 Analytical methods of hazardous substances in printed circuit boards - Part 2: Determination of halogens (chlorine and bromine) by ion chromatography
  • DB34/T 3368.4-2019 Analytical methods of hazardous substances in printed circuit boards - Part 4: Determination of lead and cadmium by inductively coupled plasma atomic emission spectrometry
  • DB34/T 2127.4-2014 Methods of Analytical Samples for Regional Geochemical Surveys Part 4: Determination of Multielement Content by Plasma Mass Spectrometry
  • DB34/T 3368.5-2019 Methods of analysis of hazardous substances in printed circuit boards - Part 5: Determination of mercury content by inductively coupled plasma spectrometry

Professional Standard - Commodity Inspection

  • SN/T 4501.3-2017 Chemical analysis of nickel concentrate—Part 3:Determination of gold,platinum,palladium—Inductively coupled plasma mass spectrometry method
  • SN/T 2698-2010 Elemental analysis of impurities in tungsten products—Inductively coupled plasma atomic emission spectrometric method
  • SN/T 4501.2-2017 Chemical analysis of nickel concentrate - Part 2: Determination of gallium, germanium, selenium, cadmium, indium, tellurium, lanthanum, thallium - Inductively coupled plasma mass spectrometry method
  • SN/T 4025-2014 Determination of total rare earth content in rare earth ferrosilicon alloy and rare earth ferrosilicon magnesium alloy - Inductively coupled plasma mass spectrometry method (ICP-MS)
  • SN/T 5055.1-2018 Analysis of biodiesel - Part 1: Determination of sodium, potassium, calcium, and magnesium cations - Ion chromatography method

Professional Standard - Hygiene

  • WS/T 549-2017 Methods for analysis of total uranium and uranium-235/uranium-238 isotope ratio in urine. Inductively coupled plasma-mass spectrometry (ICP-MS)

Professional Standard - Energy

  • NB/T 11608-2024 Methods for Spectral Analysis of Extracted Materials from Shale

Taiwan Provincial Standard of the People's Republic of China

  • CNS 12509-1989 General Rules Analytical Methods in Gas Chromatography/Mass Spectrometry
  • CNS 12511-1989 General Rules for Mass Spectrometric Analysis

Professional Standard - Ferrous Metallurgy

  • YB/T 4304-2012 General Rule for Fusion Extraction- Mass Spectrometric Analysis Method

Jiangxi Provincial Standard of the People's Republic of China

  • DB36/T 814.2-2014 Methods for chemical analysis of holmium-iron alloys part 2: Determination of rare earth impurity content by inductively coupled plasma emission spectrometry

Group Standards of the People's Republic of China

  • T/QAS 082.14-2023 Chemical Analysis of Rock Salt and Glauber's Salt - Part 14: Determination of Bromine by Inductively Coupled Plasma Mass Spectrometry
  • T/HNNMIA 8-2023 Chemical analysis methods for secondary aluminium ash - Determination of total fluorine content - Ion chromatography
  • T/CSTM 00780.3-2023 Methods for chemical analysis of sodium vanadate—Part 3: Determination of silicon,aluminum,etc. 12 impurity elements content —Inductively coupled plasma
  • T/QAS 082.6-2023 Chemical Analysis of Rock Salt and Glauber's Salt Part 6: Determination of Iodine by Inductively Coupled Plasma Mass Spectrometry
  • T/NXCL 006-2021 High-purity beryllium chemical analysis method Determination of iron, chromium, magnesium, copper, aluminum, manganese, nickel, zinc and silver content Inductively coupled plasma mass spectrometry
  • T/ZJATA 0023-2024 Determination of perchlorate in water Ion chromatography-mass spectrometry/mass spectrometry
  • T/HNNMIA 62-2023 Chemical analysis methods for aluminum hydroxide seeds - Determination of oxalate - Ion chromatography
  • T/SDAS 4-2016 Methods for chemical analysis of high purity gold—Determination of impurity elements contents—Glow discharge mass spectrometry

Professional Standard - Nuclear Industry

  • EJ/T 1212.2-2008 Test methods for analysis of sintered gadolinium oxide-uranium dioxide pellets.Part2: Determination of isotopic uramium composition by thermal ionization mass spectrometry

Professional Standard - Rare Earth

  • XB/T 630.3-2023 Chemical analysis methods of recyclable materials from rare earth pyrometallurgical process -Part 3: Determination of aluminum, chromium,nickel and zinc contents-inductively coupled plasma mass spectrometry
  • XB/T 624.1-2018 Chemical analysis methods for yttrium-ferro alloy. Part 1-Determination of rare earth impurity contents. Inductively coupled plasma atomic emission spectrometry
  • XB/T 633-2023 Method for chemical analysis of impurity elements contents in rare earth oxides - Glow discharge mass spectrometry
  • XB/T 623.1-2018 Chemical analysis methods for cerium-ferro alloy. Part 1-Determination of rare earth impurity contents. Inductively coupled plasma atomic emission spectrometry
  • XB/T 621.2-2016 Chemical analysis methods for holmium ferroalloy. Part 2: Determination of rare earth impurity contents. Inductively coupled plasma atomic emission spectrometry
  • XB/T 623.2-2018 Chemical analysis methods for cerium-ferro alloy. Part 2-Determination of aluminum, silicon and nickel contents. Inductively coupled plasma atomic emission spectrometry
  • XB/T 616.2-2012 Chemical analysis methods of gadolinium ferroalloy—Part 2:Determination of rare earth impurity contents—Inductively coupled plasma atomic emission spectrometry

Professional Standard - Electron

  • SJ/T 10553-1994 Method of emission spectrochemical analysis of impurities in ZrO2 for use in electron ceramics
  • SJ/T 10551-1994 Method of emission spectrochemical analysis of impurities in AL203 for use in electron ceramics
  • SJ/T 10552-2021 Method of emission specthchemical analysis of impurities in TiO2 for use in electron ceramics
  • SJ/T 11698-2018 Lead-free solder chemical analysis method Inductively coupled plasma atomic emission spectrometry
  • SJ 2656-1986 Method for defermination of Tungsten by spectrometry
  • SJ 2657-1986 Mothod of molybdeuum spectral analysis
  • SJ/T 10551-2021 The measurement of emission spectrum analysis for aluminium oxide used in electronic ceramics
  • SJ/T 10553-2021 Method of emission specthchemical analysis of impurities in ZrO2 for use in electron ceramics
  • SJ/T 10552-1994 Method of emission specthochemical analysis of impurities in TiO2 for use in electron ceramics

International Organization for Standardization (ISO)

  • ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
  • ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
  • ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
  • ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 17109:2015/DAmd 1 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films — A...
  • ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • ISO 22125-2:2019 Water quality — Technetium-99 — Part 2: Test method using inductively coupled plasma mass spectrometry (ICP-MS)
  • ISO 12010:2012 Water quality - Determination of short-chain polychlorinated alkanes (SCCPs) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • ISO 20341:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • ISO 23166:2018 Nickel alloys — Determination of tantalum — Inductively coupled plasma optical emission spectrometric method
  • ISO 23812:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
  • ISO 22863-5:2021 Fireworks - Test methods for determination of specific chemical substances - Part 5: Analysis of lead and lead compounds by inductively coupled plasma spectrometry (ICP)

British Standards Institution (BSI)

  • BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
  • 10/30199169 DC BS ISO 12406. Surface chemical analysis. Secondary ion mass spectrometry. Method for depth profiling of arsenic in silicon
  • BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • BS ISO 23812:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
  • 25/30500395 DC BS ISO 13084 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • BS ISO 17862:2013 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • BS ISO 12010:2012 Water quality. Determination of short-chain polychlorinated alkanes (SCCPs) in water. Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
  • BS EN 17050:2017 Animal feeding stuffs: Methods of sampling and analysis. Determination of iodine in animal feed by ICP-MS
  • BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • BS DD ENV 13800:2000 Lead and lead alloys - Analysis by flame atomic absorption spectromerty (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), without separation of the lead matrix
  • BS ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
  • BS ISO 17560:2014 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
  • BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
  • BS ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • BS ISO 22415:2019 Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
  • BS PD ISO/TS 17951-1:2016 Water quality. Determination of fluoride using flow analysis (FIA and CFA). Method using flow injection analysis (FIA) and spectrometric detection after off-line distillation
  • 19/30376495 DC BS EN 17374. Animal feeding stuffs: Methods of sampling and analysis. Determination of inorganic arsenic in animal feed by anion-exchange HPLC-ICPMS
  • 21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
  • PD CEN/TS 17197:2018(2019) Building Products: Hazardous Release Assessment Mineral Analysis Inductively Coupled Plasma Optical Emission Spectrometry (ICP-OES) Analysis
  • BS ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • BS PD CEN/TS 17200:2018 Construction products. Assessment of release of dangerous substances. Analysis of inorganic substances in digests and eluates. Analysis by Inductively Coupled Plasma. Mass Spectrometry (ICP-MS)
  • BS ISO 22863-5:2021 Fireworks. Test methods for determination of specific chemical substances. Analysis of lead and lead compounds by inductively coupled plasma spectrometry (ICP)
  • BS EN ISO 12010:2014 Water quality. Determination of short-chain polychlorinated alkanes (SCCPs) in water. Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • 07/30138812 DC BS ISO 23830. Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • BS ISO 21045:2018 Tobacco and tobacco products. Determination of ammonia. Method using ion chromatographic analysis
  • BS EN ISO 12010:2019 Water quality. Determination of short-chain polychlorinated alkanes (SCCP) in water. Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • 20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • BS ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
  • PD CEN/TS 17200:2018 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by Inductively Coupled Plasma - Mass Spectrometry (ICP-MS)
  • BS ISO 20341:2003(2010) Surface chemical analysis — Secondary - ion mass spectrometry — Method for estimating depth resolution parameters with multiple delta - layer reference materials
  • BS ISO 20341:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • BS PD CEN/TS 17197:2018 Construction products: Assessment of release of dangerous substances. Analysis of inorganic substances in digests and eluates. Analysis by Inductively Coupled Plasma. Optical Emission Spectrometry (ICP-OES). Analysis by Inductive Coupled Plasma. Optical E
  • BS EN ISO 22125-2:2019 Water quality. Technetium-99 - Test method using inductively coupled plasma mass spectrometry (ICP-MS)
  • BS 6337-4:1984 General methods of chemical analysis. Method for determination of chloride ions by potentiometry
  • BS ISO 17858:2007 Water quality - Determination of dioxin-like polychlorinated Biphenyls - Method using gas-chromatography/mass spectrometry

Korean Agency for Technology and Standards (KATS)

  • KS D ISO 17560-2025 Surface chemical analysis — Secondary ion mass spectrometry — Method for depth profiling of boron in silicon
  • KS L 1627-2024 Testing method of impurities in high purity cobalt ingot by inductively coupled plasma spectrometric analysis — Matrix matching method
  • KS L 1627-2014(2024) Testing method of impurities in high purity cobalt ingot by inductively coupled plasma spectrometric analysis — Matrix matching method
  • KS M 0027-1993 General Rules for Analytical Methods in Gas Chromatography Mass Spectrometry
  • KS M 0027-2008(2023) General rules for analytical methods in gas chromatography mass spectrometry
  • KS M 0027-2023 General rules for analytical methods in gas chromatography mass spectrometry
  • KS M 0027-2008(2018) General rules for analytical methods in gas chromatography mass spectrometry
  • KS I ISO 17294-2014 Water quality — Application of inductively coupled plasma mass spectrometry(ICP-MS)
  • KS D ISO 14237-2003(2023) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon
  • KS D 1673-2007(2022) Methods for inductively coupled plasma emission spectrochemical analysis of steel
  • KS D 1674-2019(2024) Methods for inductively coupled plasma spectrometric analysis of trace elements in gold
  • KS D 1674-2024 Methods for inductively coupled plasma spectrometric analysis of trace elements in gold
  • KS D ISO 20341-2005(2020) Surface chemical analysis-Secondary-ion mass spectrometry-Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • KS D ISO 17560:2003 Surface chemical analysis-Secondary-on mass spectrometry- Method for depth profiling of boron in silicon
  • KS D 1674-2019 Methods for inductively coupled plasma spectrometric analysis of trace elements in gold
  • KS D ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
  • KS D 1678-2022 Methods for inductively coupled plasma emission spectrometric analysis of aluminum and aluminium alloys
  • KS D 1673-2007(2017) Methods for inductively coupled plasma emission spectrochemical analysis of steel
  • KS D ISO 20341-2020 Surface chemical analysis-Secondary-ion mass spectrometry-Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • KS I ISO 12010-2014 Water quality — Determination of short-chain polychlorinated alkanes(SCCPs) in water — Method using gas chromatography-mass spectrometry(GC-MS) and negative-ion chemical ionization(NCI)
  • KS D ISO 17560-2003(2023) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
  • KS D ISO 18114-2020 Surface chemical analysis-Secondary-ion mass spectrometry-Determination of relative sensitivity factors from ion-implanted reference materials
  • KS D ISO 18114-2005(2020) Surface chemical analysis-Secondary-ion mass spectrometry-Determination of relative sensitivity factors from ion-implanted reference materials
  • KS D 1702-2020 Platium-Determination of trace-element content by inductively coupled plasma spectrometric analysis-Matrix matching method
  • KS D ISO 20341:2005 Surface chemical analysis-Secondary-ion mass spectrometry-Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • KS D 1673-2007 Methods for inductively coupled plasma emission spectrochemical analysis of steel
  • KS D 1678-2012(2017) Methods for inductively coupled plasma emission spectrometric analysis of aluminum and alumnium alloys
  • KS D 1899-2003 Methods for emission spectrochemical analysis of electrolytic cathode copper

The Directorate General of Specifications and Metrology (DGSM)

  • OS GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
  • OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • OS GSO ISO 23812:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
  • OS GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry

American Society for Testing and Materials (ASTM)

  • ASTM RR-E01-1115 2011 E2823-Test Method for Analysis of Nickel Alloys by Inductively Coupled Plasma Mass Spectrometry
  • ASTM D2786-91(2006) Standard Test Method for Hydrocarbon Types Analysis of Gas-Oil Saturates Fractions by High Ionizing Voltage Mass Spectrometry
  • ASTM D3239-91(2016) Standard Test Method for Aromatic Types Analysis of Gas-Oil Aromatic Fractions by High Ionizing Voltage Mass Spectrometry
  • ASTM D323-15a Standard Test Method for Vapor Pressure of Petroleum Products (Reid Method)
  • ASTM D2786-91(2016) Standard Test Method for Hydrocarbon Types Analysis of Gas-Oil Saturates Fractions by High Ionizing Voltage Mass Spectrometry
  • ASTM D2786-91(1996) Standard Test Method for Hydrocarbon Types Analysis of Gas-Oil Saturates Fractions by High Ionizing Voltage Mass Spectrometry
  • ASTM D2786-91(2011) Standard Test Method for Hydrocarbon Types Analysis of Gas-Oil Saturates Fractions by High Ionizing Voltage Mass Spectrometry
  • ASTM D323-90 Standard Test Method for Vapor Pressure of Petroleum Products (Reid Method)
  • ASTM D323-15 Standard Test Method for Vapor Pressure of Petroleum Products (Reid Method)
  • ASTM D2786-91(2001)e1 Standard Test Method for Hydrocarbon Types Analysis of Gas-Oil Saturates Fractions by High Ionizing Voltage Mass Spectrometry
  • ASTM D3239-91(2011) Standard Test Method for Aromatic Types Analysis of Gas-Oil Aromatic Fractions by High Ionizing Voltage Mass Spectrometry
  • ASTM D323-94 Standard Test Method for Vapor Pressure of Petroleum Products (Reid Method)
  • ASTM C1379-10 Standard Test Method for Analysis of Urine for Uranium-235 and Uranium-238 Isotopes by Inductively Coupled Plasma-Mass Spectrometry
  • ASTM D3239-91(2006) Standard Test Method for Aromatic Types Analysis of Gas-Oil Aromatic Fractions by High Ionizing Voltage Mass Spectrometry
  • ASTM D3239-91(2001) Standard Test Method for Aromatic Types Analysis of Gas-Oil Aromatic Fractions by High Ionizing Voltage Mass Spectrometry
  • ASTM D3239-91(1996) Standard Test Method for Aromatic Types Analysis of Gas-Oil Aromatic Fractions by High Ionizing Voltage Mass Spectrometry
  • ASTM STP 125-1952 Bibliography on methods for photoelectric spectroscopy analysis of inorganic ions
  • ASTM C1476-00 Standard Test Method for Analysis of Urin for Technetium-99 by Inductively Coupled Plasma-Mass Spectrometry
  • ASTM D846-84 Standard Test Method for Analysis of Multiple Elements in Cannabis Matrices by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
  • ASTM D8469-22 Standard Test Method for Analysis of Multiple Elements in Cannabis Matrices by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
  • ASTM E1504-11 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
  • ASTM C1637-13 Standard Test Method for the Determination of Impurities in Plutonium Metal: Acid Digestion and Inductively Coupled Plasma-Mass Spectroscopy (ICP-MS) Analysis
  • ASTM C1637-21 Standard Test Method for Determination of Impurities in Plutonium Materials—Acid Digestion and Inductively Coupled Plasma-Mass Spectroscopy (ICP-MS) Analysis
  • ASTM C1476-06 Standard Test Method for Analysis of Urine for Technetium-99 by Inductively Coupled Plasma-Mass Spectrometry
  • ASTM E2823-17 Standard Test Method for Analysis of Nickel Alloys by Inductively Coupled Plasma Mass Spectrometry (Performance-Based)
  • ASTM RR-D37-2001 2022 D8469-Test Method for Analysis of Multiple Elements in Cannabis Matrices by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
  • ASTM C1845-24 Standard Practice for The Separation of Lanthanide Elements from Uranium Matrices Using High Pressure Ion Chromatography (HPIC) for Isotopic Analyses by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
  • ASTM C1379-97 Standard Test Method for Analysis of Urine for Uranium-235 and Uranium-238 Isotopes by Inductively Coupled Plasma-Mass Spectrometry
  • ASTM C1637-06 Standard Test Method for the Determination of Impurities in Plutonium Metal: Acid Digestion and Inductively Coupled Plasma-Mass Spectroscopy (ICP-MS) Analysis
  • ASTM D5542-04(2009) Standard Test Methods for Trace Anions in High Purity Water by Ion Chromatography
  • ASTM C791-83(2000) Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Boron Carbide
  • ASTM D8110-25 Standard Test Method for Elemental Analysis of Distillate Products by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
  • ASTM D8110-17 Standard Test Method for Elemental Analysis of Distillate Products by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
  • ASTM C1413-99 Standard Test Method for Isotopic Analysis of Hydrolyzed Uranium Hexafluoride and Uranyl Nitrate Solutions by Thermal Ionization Mass Spectrometry
  • ASTM C1413-18 Standard Test Method for Isotopic Analysis of Hydrolyzed Uranium Hexafluoride and Uranyl Nitrate Solutions by Thermal Ionization Mass Spectrometry
  • ASTM UOP1037-20 Trace Metals Analysis in Liquefied Petroleum Gases by Inductively Coupled Plasma-Mass Spectrometry
  • ASTM E1881-12 Standard Guide for Cell Culture Analysis with SIMS
  • ASTM RR-C26-1000 1976 C0791-Methods for Chemical, Mass Spectrometric, Spectrochemical Analysis of Nuclear-Grade Boron Carbide
  • ASTM D3612-02 Standard Test Method for Analysis of Gases Dissolved in Electrical Insulating Oil by Gas Chromatography
  • ASTM C1474-00(2011) Standard Test Method for Analysis of Isotopic Composition of Uranium in Nuclear-Grade Fuel Material by Quadrupole Inductively Coupled Plasma-Mass Spectrometry
  • ASTM C1345-96(2001) Standard Test Method for Analysis of Total and Isotopic Uranium and Total Thorium in Soils by Inductively Coupled Plasma-Mass Spectrometry
  • ASTM RR-D15-1025 2009 D5827-Test Method for Analysis of Engine Coolant for Chloride and Other Anions by Ion Chromatography
  • ASTM C1413-05 Standard Test Method for Isotopic Analysis of Hydrolyzed Uranium Hexafluoride and Uranyl Nitrate Solutions by Thermal Ionization Mass Spectrometry
  • ASTM D3612-02(2009) Standard Test Method for Analysis of Gases Dissolved in Electrical Insulating Oil by Gas Chromatography
  • ASTM E1881-06 Standard Guide for Cell Culture Analysis with SIMS
  • ASTM E2040-25 Standard Test Method for Mass Scale Calibration of Thermogravimetric Analyzers
  • ASTM E2040-19 Standard Test Method for Mass Scale Calibration of Thermogravimetric Analyzers
  • ASTM C1474-00(2006)e1 Standard Test Method for Analysis of Isotopic Composition of Uranium in Nuclear-Grade Fuel Material by Quadrupole Inductively Coupled Plasma-Mass Spectrometry
  • ASTM C1474-00 Standard Test Method for Analysis of Isotopic Composition of Uranium in Nuclear-Grade Fuel Material by Quadrupole Inductively Coupled Plasma-Mass Spectrometry
  • ASTM C1379-04 Standard Test Method for Analysis of Urine for Uranium-235 and Uranium-238 Isotopes by Inductively Coupled Plasma-Mass Spectrometry
  • ASTM C1845-16 Standard Practice for The Separation of Lanthanide Elements from Uranium Matrices Using High Pressure Ion Chromatography (HPIC) for Isotopic Analyses by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
  • ASTM C1432-15 Standard Test Method for Determination of Impurities in Plutonium: Acid Dissolution, Ion Exchange Matrix Separation, and Inductively Coupled Plasma-Atomic Emission Spectroscopic (ICP/AES) Analysis
  • ASTM E10-08 Standard Test Method for Brinell Hardness of Metallic Materials
  • ASTM E10-15 Standard Test Method for Brinell Hardness of Metallic Materials
  • ASTM UOP1031-19 Chromium (III) and Chromium (VI) Speciation in Water by IC-ICP-MS (Ion Chromatography- Inductively Coupled Plasma Mass Spectrometry)
  • ASTM E1097-97 Standard Guide for Direct Current Plasma Emission Spectrometry Analysis
  • ASTM RR-E01-1110 2009 E2594-Standard Test Method for Analysis of Nickel Alloys by Inductively Coupled Plasma Atomic Emission Spectrometry
  • ASTM C1432-03 Standard Test Method for Determination of Impurities in Plutonium: Acid Dissolution, Ion Exchange Matrix Separation, and Inductively Coupled Plasma-Atomic Emission Spectroscopic (ICP/AES) Analysis
  • ASTM C1477-00 Standard Test Method for Isotopic Abundance Analysis of Uranium Hexafloride by Multi-Collector, Inductively Coupled Plasma-Mass Spectrometry
  • ASTM C1432-99 Standard Test Method for Determination of Impurities in Plutonium: Acid Dissolution, Ion Exchange Matrix Separation, and Inductively Coupled Plasma-Atomic Emission Spectroscopic (ICP/AES) Analysis
  • ASTM C1432-03(2008) Standard Test Method for Determination of Impurities in Plutonium: Acid Dissolution, Ion Exchange Matrix Separation, and Inductively Coupled Plasma-Atomic Emission Spectroscopic (ICP/AES) Analysis

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

Japanese Industrial Standards Committee (JISC)

  • JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • JIS K 0127:2001 General rules for ion chromatographic analysis
  • JIS K 0127:2013 General rules for ion chromatography
  • JIS K 0153:2015 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers
  • JIS K 0164:2010 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
  • JIS K 0156:2018 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials

Kingdom of Bahrain Testing and Metrology Directorate

  • BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • BH GSO ISO 23812:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
  • BH GSO ISO 12010:2016 Water quality -- Determination of short-chain polychlorinated alkanes (SCCPs) in water -- Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)

Gosstandart of Russia

  • GOST R 56240-2014 Copper. Spectral methods of impurity analysis
  • GOST 10671.0-2016 Reagents. General requirements for methods of analysis of anions impurities
  • GOST ISO 13161-2023 Water quality. Polonium-210. Test method using alpha spectrometry
  • GOST 33616-2015 Food products, food raw materials. Method for determination of residues of arsenic containing growth stimulators using high performance liquid chromatography-mass spectrometry with inductively coupled plasma
  • GOST ISO 21392-2023 Perfumery and cosmetic products. Analytical methods. Determination of trace amounts of heavy metals by inductively coupled plasma mass spectrometry..

Association Francaise de Normalisation

  • NF X21-066*NF ISO 23812:2009 Surface chemical analysis - Secondary ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
  • NF T90-046:2014 Water quality - Determination of short-chain polychlorinated alkanes (SCCPs) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • NF X21-051*NF ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • NF V03-155:2010 Food analysis - Determination of patuline by High performance liquid chromatography - Mass spectrometry/Mass spectrometry method (HPLC-MS/MS).
  • NF X21-064*NF ISO 23830:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry.
  • NF P01-036*NF EN 17200:2023 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in eluates and digests - Analysis by inductively coupled plasma mass spectrometry (ICP-MS)
  • XP A06-422*XP ENV 14029:2001 Lead and lead alloys - Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), after separation of the lead matrix
  • NF ISO 17560:2006 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron in silicon by thickness profiling

Ente Nazionale Italiano di Unificazione

  • EC 1-2021 UNI EN 17374:2020 Animal feeding stuffs: Methods of sampling and analysis - Determination of inorganic arsenic in animal feed by anion-exchange HPLC-ICP-MS
  • UNI EN 17374:2020 Animal feeding stuffs: Methods of sampling and analysis - Determination of inorganic arsenic in animal feed by anion-exchange HPLC-ICP-MS
  • UNI EN 17050:2017 Animal feeding stuffs: Methods of sampling and analysis - Determination of iodine in animal feed by ICP-MS
  • UNI 9813:1991 Ionic chromatography procedures. Anions analysis by ionic chromatography and high pressure liquid chromatography.
  • UNI EN ISO 22125-2:2024 Water quality - Technetium-99 - Part 2: Test method using inductively coupled plasma mass spectrometry (ICP-MS)
  • UNI EN 17200:2024 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in eluates and digests - Analysis by inductively coupled plasma mass spectrometry (ICP-MS)
  • UNI ENV 14029:2002 Lead and lead alloys - Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), after separation of the lead matrix
  • UNI EN ISO 26845:2008 Chemical analysis of refractories - General requirements for wet chemical analysis, atomic absorption spectrometry (AAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES) methods

Institute of Electrical and Electronics Engineers (IEEE)

German Institute for Standardization

  • DIN EN ISO 12010 E:2018-03 Water quality Determination of short-chain polychlorinated triphenylane (SCCP) in water by gas chromatography mass spectrometry (GC-MS) and negative ion chemical ionization (NCI) (draft)
  • DIN EN ISO 12010 E:2013-12 Water quality Determination of short-chain polychlorinated triphenylane (SCCP) in water by gas chromatography mass spectrometry (GC-MS) and negative ion chemical ionization (NCI) (draft)
  • DIN V ENV 13800:2000 Lead and lead alloys - Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES) without separation of the lead matrix; German version ENV 13800:2000
  • DIN V ENV 14029 DIN:2001-12 Analysis of lead and lead alloys by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma optical emission spectrometry (ICP-ES) after separation of the lead matrix
  • DIN EN ISO 17294-1:2022-07 Water quality - Application of inductively coupled plasma mass spectrometry (ICP-MS) - Part 1: General guidelines (ISO/DIS 17294-1:2022); German and English version prEN ISO 17294-1:2022 / Note: Date of issue 2022-06-17*Intended as replacement for DIN ...
  • DIN EN 17200:2024 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in eluates and digests - Analysis by inductively coupled plasma mass spectrometry (ICP-MS); German version EN 17200:2023
  • DIN EN 17200:2022 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by inductively coupled plasma mass spectrometry (ICP-MS); German and English version prEN 17200:2022
  • DIN CEN/TS 17200:2019*DIN SPEC 18484:2019 Construction products - Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by Inductively Coupled Plasma - Mass Spectrometry (ICP-MS)
  • DIN CEN/TS 17200:2019-03*DIN SPEC 18484:2019-03 Construction products - Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by Inductively Coupled Plasma - Mass Spectrometry (ICP-MS); German version CEN/TS 17200:2018+AC:2018 / Note: To b...
  • DIN EN ISO 12010:2019-09 Water quality - Determination of short-chain polychlorinated alkanes (SCCP) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2019); German version EN ISO 12010:2019
  • DIN EN 17200:2024-05 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in eluates and digests - Analysis by inductively coupled plasma mass spectrometry (ICP-MS)
  • DIN EN ISO 12010:2014 Water quality - Determination of short-chain polychlorinated alkanes (SCCPs) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2012); German version EN ISO 12010:2014
  • DIN EN ISO 12010:2019 Water quality - Determination of short-chain polychlorinated alkanes (SCCP) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2019)
  • DIN EN 17200 E:2022 Draft Document - Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by inductively coupled plasma mass spectrometry (ICP-MS); German and English version prEN 17200:2022

GCC Standardization Organization

  • GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
  • GSO ISO 17560:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • GSO ISO 12010:2013 Water quality -- Determination of short-chain polychlorinated alkanes (SCCPs) in water -- Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • GSO ISO 23812:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
  • GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry

Semiconductor Equipment and Materials International (SEMI)

  • SEMI F33-0708-2008 TEST METHOD FOR CALIBRATION OF ATMOSPHERIC PRESSURE IONIZATION MASS SPECTROMETER (APIMS)

Standard Association of Australia (SAA)

  • AS ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon

European Committee for Standardization (CEN)

  • EN ISO 22125-2:2019 Water quality - Technetium-99 - Part 2: Test method using inductively coupled plasma mass spectrometry (ICP-MS) (ISO 22125-2:2019)
  • CEN/TS 17200:2018+AC:2018 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by Inductively Coupled Plasma - Mass Spectrometry (ICP-MS)
  • FprEN 17200 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by inductively coupled plasma mass spectrometry (ICP-MS)

American Water Works Association (AWWA)

  • AWWA WQTC58783 Liquid Chromatography Mass Spectrometry (LC-MS) Based Method for the Analysis of Algal Toxins
  • AWWA QTC98245 Analysis of Metals by Inductively Coupled Plasma-Mass Spectrometry: Effect of Concentration on Accuracy and Precision
  • AWWA WQTC58858 Liquid Chromatography of Bromate and Bromoacetic Acids with Inductively Coupled Plasma Mass Spectrometry Detection

Spanish Association for Standardization (UNE)

  • UNE-EN ISO 12010:2020 Water quality - Determination of short-chain polychlorinated alkanes (SCCP) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2019)
  • UNE-EN ISO 22125-2:2019 Water quality - Technetium-99 - Part 2: Test method using inductively coupled plasma mass spectrometry (ICP-MS) (ISO 22125-2:2019) (Endorsed by Asociación Española de Normalización in January of 2020.)

Danish Standards Foundation

  • DANSK DS/ISO 12010:2019 Water quality – Determination of short-chain polychlorinated alkanes (SCCP) in water – Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • DS/ISO 12010:2012 Water quality - Determination of short-chain polychlorinated alkanes (SCCPs) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • DANSK DS/EN 17200:2023 Construction products: Assessment of release of dangerous substances – Analysis of inorganic substances in eluates and digests – Analysis by inductively coupled plasma mass spectrometry (ICP-MS)
  • DS/ENV 14029:2001 Lead and lead alloys - Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), after separation of the lead matrix
  • DANSK DS/ISO 22125-2:2019 Water quality – Technetium-99 – Part 2: Test method using inductively coupled plasma mass spectrometry (ICP-MS)
  • DANSK DS/EN ISO 12010:2019 Water quality – Determination of short-chain polychlorinated alkanes (SCCP) in water – Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2019)

Austrian Standards

  • ONORM M 6253 Teil.1-1985 Water analysis; determination ofanionic Surfactants by the methylene blue spectrometric method
  • ONORM M 6236-1993 Water analysis - Determination of easily volatile halogenated hydrocarbons - Head space gas Chromatographie method

Yugoslav Association for Standardization

  • JUS C.A1.650-1987 Methodes of chemical analysis of silver. Determination of impurities contents. Spectrographic metod".

Swedish Institute for Standards

  • SS-EN 14242:2023 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectrometric analysis
  • SS-EN ISO 17294-2:2005 Water quality - Application of inductively coupled plasma mass spectrometry (ICP-MS) - Part 2: Determination of 62 elements (ISO 17294-2:2003)

Standards Norway

  • SN-CEN/TS 17200:2018 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by Inductively Coupled Plasma - Mass Spectrometry (ICP-MS)
  • NS-ENV 14029:2001 Lead and lead alloys — Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), after separation of the lead matrix

Bureau of Indian Standards

  • IS 7658-1975 Spectral analysis method of aluminum
  • IS 2600-5-2022 Methods of Chemical Analysis of Zinc and Zinc Base Alloys for Die Castings - Part 5 Analysis by Inductively Coupled Plasma Optical Emission Spectrometry