YS/T 473-2005 in English

SUPERSEDED

Determination of impurity elements in gallium for industrial use - ICP-MS analytical method

Issued on:2005-05-18
Implemented on:2005-12-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $220.00
$214.00

Standard No:	YS/T 473-2005
Document status:	SUPERSEDED
Superseded by:	YS/T 473-2015 Methods for chemical analysis industrial gallium―Determination of impurity elements―ICP-MS analytical method
Superseded on:	2015-10-01
Title in English:	Determination of impurity elements in gallium for industrial use - ICP-MS analytical method
Title in Chinese:	工业镓化学分析方法杂质素的测定电感耦合等离子体质谱法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2005-05-18
Implemented on:	2005-12-01
ICS Classification:	77.040.30-Chemical analysis of metals
Chinese Classification:	H14-Rare metals and their alloys analysis method
Professional Classification:	YS-Non-ferrous Metal
Related Keywords:	impurity elements industrial gallium determination method icp-ms analytical method scopethis standard industrial use
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Scope

This standard specifies the determination method for the content of impurity elements such as copper, lead, zinc, aluminum, indium, calcium, iron, tin, nickel, magnesium, cobalt, chromium, manganese, titanium, rubidium, molybdenum, and bismuth in industrial gallium. This standard applies to copper, lead, zinc, aluminum, indium, calcium, iron, tin, nickel, magnesium, cobalt, chromium, manganese, titanium, rubidium, and molybdenum in industrial gallium (99.99% ≤ ω (Ga) ≤ 99.999%) Simultaneous determination of the content of impurity elements such as , bismuth and so on.

More samples: GB 18306-2015 JC/T 2453-2018 JJG 21-2008

Sample only — not a preview of YS/T 473-2005

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