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electronic hybridization

electronic hybridization, Total:193 items.

The international standard classification for "electronic hybridization" includes: IT applications in transport and trade , Other products of the chemical industry , Other non-ferrous metals and their alloys , Chemical analysis of metals , Titanium and titanium alloys , Nickel, chromium and their alloys , Testing of metals in general , Inorganic chemicals in general , Aluminium and aluminium alloys , Chemical analysis , Lifts. Escalators , Testing of metals .

The Chinese standard classification for "electronic hybridization" includes: Technical Management , Metal physical property test method , Light metals and their alloys analysis method , Semimetal and semiconductor material analysis method , Rare metals and their alloys analysis method , Rare refractory metals and their compounds , Rare light metals and their alloys , Heavy metals and their alloys analysis method , Inorganic chemicals in general , Electron optics and other physical optics instrument , Hygiene, safety and labor protection , Elevator , Economic forest and byproduct .


Hebei Provincial Standard of the People's Republic of China

Professional Standard - Civil Aviation

Professional Standard - Electron

  • SJ/T 10633-2022 Atomic absorption spectrophotometry of impurities in alumina, the raw material for electronic ceramics
  • SJ/T 10553-2021 Method of emission specthchemical analysis of impurities in ZrO2 for use in electron ceramics
  • SJ/T 10552-1994 Method of emission specthochemical analysis of impurities in TiO2 for use in electron ceramics
  • SJ/T 10553-1994 Method of emission spectrochemical analysis of impurities in ZrO2 for use in electron ceramics
  • SJ/T 10551-2021 The measurement of emission spectrum analysis for aluminium oxide used in electronic ceramics
  • SJ/T 10552-2021 Method of emission specthchemical analysis of impurities in TiO2 for use in electron ceramics
  • SJ/T 10551-1994 Method of emission spectrochemical analysis of impurities in AL203 for use in electron ceramics
  • SJ/T 10633-1995 Atomic-absorption spectrophotometry of impurties in alumina for electron ceramic raw materials

Professional Standard - Non-ferrous Metal

  • YS/T 34.1-2011 Method for chemical analysis of the high-purity arsenic—Inductive coupling plasma mass spectrum (ICP-MS) for determinating the concentration of elements in the high-purity arsenic
  • YS/T 244.9-2008 Chemical analysis methods of high purity aluminum Part 9: Determination of trace impurities in high pruity aluminumby inductively coupled mass spectrometry
  • YS/T 892-2013 Methods for Chemical Analysis of High Purity Titanium - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
  • YS/T 473-2015 Methods for chemical analysis industrial gallium―Determination of impurity elements―ICP-MS analytical method
  • YS/T 980-2014 Determination of impurities of high purity gallium oxide—Inductively coupled plasma-mass spectrmetry
  • YS/T 898-2013 Methods for Chemical Analysis of The High Purity Tantalum - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
  • YS/T 870-2013 Chemical Analysis of High Purity Aluminium-Determination of Trace Impurities Inductively Coupled Plasma Mass Spectrometry
  • YS/T 900-2013 Methods for Chemical Analysis of The High Purity Tungsten - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
  • YS/T 742-2010 Methods for chemical analysis of gallium oxide Determination of impurities Inductively coupled plasma mass spectrometer method
  • YS/T 896-2013 Methods for Chemical Analysis of High Purity Niobium - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
  • YS/T 473-2005 Determination of impurity elements in gallium for industrial use - ICP-MS analytical method
  • YS/T 666-2008 Chemical analysis emthods of gallium for industrial use - Determination of impurity elements - Inductively coupled plasma atomic emission spectrometric method
  • YS/T 630-2007 Chemical analysis methods of alumina Determination of impurities in Alumina inductively coupled plasma atomic emission spectrometric method

Liaoning Provincial Standard of the People's Republic of China

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 14849.4-2014 Methods for chemical analysis of silicon metal - Part 4:Determination of impurity contents - Inductively coupled plasma atomic emission spectrometric method
  • GB/T 13747.26-2022 Methods for chemical analysis of zirconium and zirconium alloys—Part 26:Determination of alloying and impurity elements content—Inductively coupled plasma atomic emission spectrometry
  • GB/T 12690.13-2003 Chemical analysis methods for non-rare earth impurities of rare earth metals and their oxides - Determination of molybdenum and tungsten content - Inductively coupled plasma atomic
  • GB/T 20176-2006 Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials
  • GB/T 30902-2014 Inorganic chemicals for industrial use—Determination of impurity element—Inductively coupled plasma optical emission spectrometry(ICP-OES)
  • GB/T 12690.16-2010 Chemical analysis methods of non-rare earth impurities in rare earth metals and the oxides—Part 16:Determination of fluorine content—Ion selective electrode analysis
  • GB/T 30903-2014 Inorganic chemicals for industrial use―Determination of impurity element―Inductively coupled plasma mass spectrometry(ICP-MS)
  • GB/T 31197-2014 Inorganic chemicals for industrial use-Determination of impurity anions - Ion chromatography method

Group Standards of the People's Republic of China

  • T/HZLSH 0012-2021 Huxiang miscellaneous grain biscuits
  • T/CASME 971-2023 Technical code of practice for hybrid seed breeding of bitter gourd
  • T/CATAGS 35.3-2022 Electronic Miscellaneous Bill Part 3: Ground Agents
  • T/CNIA 0116-2021 Determination of impurity content in activated carbon for purification of tail gas from polysilicon production by inductively coupled plasma atomic emission spectrometry
  • T/CNIA 0061-2020 Determination of Impurity Content in Silicon Tetrachloride for Silicon Epitaxy by Inductively Coupled Plasma Mass Spectrometry
  • T/SATA 073-2024 Determination of Nicotine, Atomization Agent, Menthol, Impurities and Nicotine- free Dry Particulate Matter in E-liquids and Vapour Emissions
  • T/CATAGS 35.2-2022 Electronic Miscellaneous Bill Part 2: Sales Agent
  • T/SHZZY 0004-2024 Seed quality requirements for Shihezi corn seed hybrids
  • T/CNIA 0020-2019 Determination of Impurity Content in Resin Catalysts for the Disproportionation of Chlorosilanes by Inductively Coupled Plasma-Atomic Emission Spectrometry
  • T/CATAGS 35.1-2022 Electronic Miscellaneous Bill Part 1: Airline
  • T/CMSTA 002-2021 Specifications of general cargo electronic warehouse receipt
  • T/ZYLM 0006-2023 Seed quality requirements for Changji corn seed hybrids
  • T/CATAGS 39-2022 Data exchange of intermodal electronic miscellaneous bills in additional services
  • T/GXAS 205-2021 Specification for technical of hybrid rice seed processing
  • T/GDVIA 005-2022 Technical regulations for hybrid seed production of Chinese flowering cabbage
  • T/CSTC 02-2024 Technical code of practice for coconut hybrid seed production
  • T/HBXX 006-2020 grain crop seeds summer sowing millet hybrids
  • T/CMES 08002-2020 Determination of Ferroniobium Impurity Elements by Inductively Coupled Plasma Atomic Emission Spectrometry

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 35925-2018 Determination of impurity fluorine ion in water soluble chemicals—Ion chromatography method

工业和信息化部

  • XB/T 623.1-2018 Chemical analysis methods for cerium-ferro alloy. Part 1-Determination of rare earth impurity contents. Inductively coupled plasma atomic emission spectrometry
  • XB/T 624.1-2018 Chemical analysis methods for yttrium-ferro alloy. Part 1-Determination of rare earth impurity contents. Inductively coupled plasma atomic emission spectrometry
  • XB/T 623.2-2018 Chemical analysis methods for cerium-ferro alloy. Part 2-Determination of aluminum, silicon and nickel contents. Inductively coupled plasma atomic emission spectrometry
  • YS/T 540.5-2018 Methods for chemical analysis of vanadium-Part 5:Determination of impurity contents-Inductively coupled plasma atomic emission spectrometry
  • YS/T 1441-2021 Doped cobalt tetroxide
  • YS/T 1497-2021 Analysis method for platinum compounds Determination of impurity anion content Ion chromatography
  • YS/T 1261-2018 Method for chemical analysis of hafnium-Determination of impurity element contents-Inductively coupled plasma atomic emission spectrometry
  • YS/T 1496-2021 Analysis method for palladium compounds Determination of impurity anion content Ion chromatography
  • YS/T 630-2016 Chemical analysis method of alumina-Determination of impurities in alumina一 ICP-AES analytical method
  • YS/T 870-2020 Method for chemical analysis of aluminium - Determination of trace impurities contents - Inductively coupled plasma mass spectrometry

Jilin Provincial Standard of the People's Republic of China

Shanxi Provincial Standard of the People's Republic of China

邢台市市场监督管理局

Chongqing Provincial Standard of the People's Republic of China

  • DB50/T 1151-2021 Technical Regulations for the Production of Brassica napus Chemical andricide Hybrid Seeds

Shanghai Provincial Standard of the People's Republic of China

Gansu Provincial Standard of the People's Republic of China

Hubei Provincial Standard of the People's Republic of China

Xinjiang Provincial Standard of the People's Republic of China

Professional Standard - Construction Industry

Anhui Provincial Standard of the People's Republic of China

  • DB34/T 2271-2014 Determination of cold miscellaneous copper copper, arsenic, lead, bismuth, antimony, zinc, nickel electrolytic-inductively coupled plasma atomic emission spectrometry
  • DB34/T 2772-2016 Technical Regulations for the Production of Cucumber Hybrid Seeds
  • DB34/T 3308-2018 Molecular Marker Method for Detecting Purity of Two-line Hybrid Rice Seeds
  • DB34/T 271-2002 Watermelon Hybrid Seed Storage Technical Regulations
  • DB34/T 269-2002 Purchasing Standards for Watermelon Hybrid Seeds
  • DB34/T 272-2002 Watermelon Hybrid Seed Inspection Regulations

Henan Provincial Standard of the People's Republic of China

Inner Mongolia Provincial Standard of the People's Republic of China

Qinghai Provincial Standard of the People's Republic of China

  • DB63/T 1611-2017 Determination of Impurity Content in Silicon Tetrachloride as Raw Material of Optical Fiber Preform by Inductively Coupled Plasma Mass Spectrometry

Shaanxi Provincial Standard of the People's Republic of China

Guangxi Provincial Standard of the People's Republic of China

Professional Standard - Commodity Inspection

  • SN/T 2669-2010 Molecular identification of three-line hybrid rice seeds
  • SN/T 2698-2010 Elemental analysis of impurities in tungsten products—Inductively coupled plasma atomic emission spectrometric method

Guangdong Provincial Standard of the People's Republic of China

  • DB44/T 1939-2016 Chemical Analysis Method of Scrap Copper
  • DB44/T 1306-2014 Technical regulations for the production of kale hybrid seeds
  • DB44/T 434-2007 The technique rules of the filial first generation seeds of three parents of hybid long-grained non-glutionous rice

Professional Standard - Forestry

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 41153-2021 Determination of boron,aluminum and nitrogen impurity content in silicon carbide single crystal―Secondary ion mass spectrometry
  • GB/T 37049-2018 Test method for the content of metal impurity in electronic grade polysilicon—Inductively coupled-plasma mass spectrometry method

Professional Standard - Rare Earth

  • XB/T 616.2-2012 Chemical analysis methods of gadolinium ferroalloy—Part 2:Determination of rare earth impurity contents—Inductively coupled plasma atomic emission spectrometry
  • XB/T 621.2-2016 Chemical analysis methods for holmium ferroalloy. Part 2: Determination of rare earth impurity contents. Inductively coupled plasma atomic emission spectrometry

Professional Standard - Nuclear Industry

  • EJ/T 20163-2018 Determination of silver i.e 28 trace elements in reprocessed uranium trioxide powder by inductively coupled plasma atomic emission spectrophotometry
  • EJ/T 1220-2007 Determination of metallic impurities in natural uranium hexafluoride by ICP-AES

Ningxia Provincial Standard of the People's Republic of China

Sichuan Provincial Standard of the People's Republic of China

Jiangsu Provincial Standard of the People's Republic of China

PL-PKN

SCC

  • AWWA WQTC69251 Virus Inactivation by Silver Doped Titanium Dioxide Nanoparticles
  • CEI 15-16:1997 Test methods for the determination of ionic impurities in electrical insulating materials by liquid extraction
  • BS ISO 14237:2000 Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
  • MIL MIL-STD-1837B-1991 MISCELLANEOUS ELECTRICAL AND ELECTRONIC COMPONENTS, SELECTION GUIDE (SUPERSEDING MIL-STD-1837A) (NO S/S DOCUMENT)
  • AWWA JAW19475 Journal AWWA — Nitrification and Nitrosation on the Surface of GAC
  • AWWA JAW46258 Journal AWWA — DE Filtration to Remove Cryptosporidium
  • 10/30239062 DC BS EN 60917-2-5. Mechanical structures for electronic equipment-Modular order for the development of mechanical structures for electronic equipment practices. Part 2-5. Cabinet interface dimensions for miscellaneous equipment

RU-GOST R

  • GOST R 50233.5-1992 Niobium pentoxide. Chemical-atomic-emission method for determination of impurity metals
  • GOST R 55845-2013 Reagents and high purity substances. Determination of impurities of chemical elements by atomic-emission spectrometry with inductively coupled plasma
  • GOST 24933.1-1981 Seed of flowers. Methods for determination of purity and seed lot impurity
  • GOST 27566-1987 Superpure substances. Method of atomic emission spectroscopy for determination of chemical elements impurities in liquid-phase substances

Military Standards (MIL-STD)

Indonesia Standards

GB-REG

ET-QSAE

Korean Agency for Technology and Standards (KATS)

  • KS K 0195-2006 Non-ionic surface active agents-Determination of cloud point index-Volumetric method
  • KS L 1627-2014(2019) Testing method of impurities in high purity cobalt ingot by inductively coupled plasma spectrometric

SE-SIS

  • SIS SS-ISO 1265:1987 Plastics - Polyvinyl chloride resins - Determination of number of impurities and foreign particles

(U.S.) Ford Automotive Standards

GSO

  • GSO ISO 14237:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials

American Society for Testing and Materials (ASTM)

  • ASTM C1287-95(2001) Standard Test Method for Determination of Impurities in Uranium Dioxide by Inductively Coupled Plasma Mass Spectrometry
  • ASTM C1287-18 Standard Test Method for Determination of Impurities in Nuclear Grade Uranium Compounds by Inductively Coupled Plasma Mass Spectrometry
  • ASTM D8149-20 Standard Practice for Optimization, Calibration, and Validation of Ion Chromatographic Determination of Heteroatoms and Anions in Petroleum Products and Lubricants
  • ASTM D8149-17 Standard Practice for Optimization, Calibration, and Validation of Ion Chromatographic Determination of Heteroatoms and Anions in Petroleum Products and Lubricants

GOSTR

  • PNST 499-2020 Nanotechnologies. Сarbon nanotubes. Determination of chemical element impurities by inductively coupled plasma mass spectrometry method
  • GOST 27566-2020 Superpure substances. Determination of impurities of chemical elements by atomic emission spectrometry methods in liquid-phase substances

Association Francaise de Normalisation

  • NF L09-030:1988 Aerospace equipment - Complex electronic equipment - Identification and marking
  • NF T51-046*NF EN ISO 1265:2007 Plastics - Poly(vinyl chloride) resins - Determination of number of impurities and foreign particles.
  • NF V03-904:1995 Oilseeds. Determination of impurities content.
  • NF X21-070*NF ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials.

CZ-CSN

German Institute for Standardization

  • DIN EN ISO 1265:2007 Plastics - Poly(vinyl chloride) resins - Determination of number of impurities and foreign particles (ISO 1265:2007) English version of DIN EN ISO 1265:2007-05
  • DIN 50456-2:1995 Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 2: Determination of ionic impurities using pressure cooker test
  • DIN 44402-16:1972-03 Measurements of the electrical properties of electronic tubes and valves; methods of measurement of spurious and unwanted electrode currents

International Organization for Standardization (ISO)

  • ISO 658:1988 Oilseeds; determination of impurities content
  • ISO 14237:2000 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
  • ISO 658:1980 Oilseeds — Determination of impurities content
  • ISO 658:2002 Oilseeds - Determination of content of impurities
  • ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials

HU-MSZT

European Committee for Standardization (CEN)

  • EN ISO 658:1995 Oilseeds - Determination of Impurities Content ISO 658: 1988

British Standards Institution (BSI)

  • BS ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
  • BS EN ISO 658:2002 Oilseeds - Determination of content of impurities

Japanese Industrial Standards Committee (JISC)

  • JIS K 0143:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials
  • JIS K 0143:2000 Surface chemical analysis -- Secondary ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials

VN-TCVN

  • TCVN 2315-1978 Reagents.Method for the determination of anions impurities