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Database: 365,228(8 Aug 2026)

MS ionization method

MS ionization method, Total:272 items.

The international standard classification for "MS ionization method" includes: Metalliferous minerals , Other non-ferrous metals and their alloys , Lead, zinc, tin and their alloys , Other road vehicle systems , Chemical analysis , Fertilizers , Testing of metals , Cadmium, cobalt and their alloys , Man-made fibres , Measuring instruments , Products of non-ferrous metals in general , Chemical reagents , Copper and copper alloys , Chemical analysis of metals , Other products of the chemical industry , Nickel, chromium and their alloys , Titanium and titanium alloys , Testing of metals in general , Other standards related to analytical chemistry , Powder metallurgy , Electronic components in general , Protection against crime , Alcoholic beverages , Other standards related to optics and optical measurements , Farming and forestry .

The Chinese standard classification for "MS ionization method" includes: Heavy metal ore , Light metals and their alloys analysis method , Heavy metals and their alloys analysis method , Analysis methods for toxic substances in water , Others , Basic standards and general methods , Basic standards and general methods on chemical fertilizers , Rare metals and their alloys analysis method , Semimetal and semiconductor material analysis method , Chemical fibre in general , Special electronic technology material , Industrial gas and chemical gas , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Hygiene, safety and labor protection , Precious metal ore , Hydrogeological survey , Engineering geophysical exploration and remote sensing exploration survey , Metal physical property test method , Rare refractory metals and their compounds , Rare light metals and their alloys , Chemical reagent in general , Basic standards and general methods for water treatment agent , Material composition analysis instrument and environment detection instrument in general , Precious metals and its alloy analysis method , Electronic element in general , chromatograph , Crime judging technology , Fermented wines , Basic standard and general method on forestry .


工业和信息化部

  • YS/T 630-2016 Chemical analysis method of alumina-Determination of impurities in alumina一 ICP-AES analytical method
  • YS/T 1380-2020 Method for chemical analysis of rhodium compounds. Determination of the chloride ion and nitrate ion contents. Ion chromatography method
  • YS/T 870-2020 Method for chemical analysis of aluminium - Determination of trace impurities contents - Inductively coupled plasma mass spectrometry
  • SJ/T 11637-2016 General principles of inductively coupled plasma mass spectrometry for electronic chemicals
  • YS/T 1171.13-2021 Methods for chemical analysis of recycled zinc raw materials Part 13: Determination of thallium content by inductively coupled plasma mass spectrometry and inductively coupled plasma atomic emission spectrometry
  • YS/T 474-2021 Chemical analysis methods of high purity gallium-Determination of trace element-Inductively coupled plasma mass spectrometry
  • YS/T 1496-2021 Analysis method for palladium compounds Determination of impurity anion content Ion chromatography
  • YS/T 540.5-2018 Methods for chemical analysis of vanadium-Part 5:Determination of impurity contents-Inductively coupled plasma atomic emission spectrometry
  • YS/T 1050.10-2016 Methods for chemical analysis of lead-antimony concentrate. Part 10: Determanation of thallium. Inductively coupled plasma mass spectrometry and inductively coupled plasma atomic emission spectrometry
  • YS/T 445.14-2019 Methods for chemical analysis of silver concentrates - Part 14: Determination of thallium content Inductively coupled plasma-mass spectrometry and inductively coupled plasma atomic emission spectrometry
  • YS/T 461.12-2016 Methods for chemical analysis of lead and zinc bulk concentrates-Part 12:Determination of thallium content-Inductively coupled plasma mass spectrometry and inductively coupled plasma atomic emission spectrometry
  • YS/T 1261-2018 Method for chemical analysis of hafnium-Determination of impurity element contents-Inductively coupled plasma atomic emission spectrometry
  • YS/T 1497-2021 Analysis method for platinum compounds Determination of impurity anion content Ion chromatography

Professional Standard - Environmental Protection

  • HJ 84-2016 Water Quality-Determination of Inorganic Anions(F-、Cl-、NO2-、Br-、NO3-、PO43-、SO32-、SO42-)-Ion Chromatography
  • HJ/T 84-2001 Water quality -- Determination of inorangic anions -- Ion chromatography method
  • HJ 778-2015 Water quality - Determination of iodide - Ion chromatiography
  • HJ 509-2009 Determination of Platinum,Palladium and Rhodium loading in the vehicle-used ceramic catalytic converters Inductive Coupled Plasma-Optical Emission Spectrometry and Inductive Coupled Plasma-Mass Spectrometry
  • HJ 812-2016 Water Quality - Determination of Water Soluble Cations(Li+ 、Na+、NH4+、K+、Ca2+、Mg2+) - Ion Chromatography
  • HJ 669-2013 Water quality-Determination of phosphate-Ion chromatography

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 11446.7-2013 Test Method for Trace Anion in Electronic Grade Water by Ion Chromatography
  • GB/T 25186-2010 Surface chemical analysis—Secondary-ion mass spectrometry—Determination of relative sensitivity factors from ion-implanted reference materials
  • GB/T 42276-2022 Determination of fluorine ion and chloride ion in silicon nitride powder—Ion chromatography method
  • GB/T 28726-2012 Gas analysis—Gas chromatograph with helium ionization detector
  • GB/T 29400-2012 Determination of microamount of inorganic anions in fertilizers by ion chromatography
  • GB/T 12690.13-2003 Chemical analysis methods for non-rare earth impurities of rare earth metals and their oxides - Determination of molybdenum and tungsten content - Inductively coupled plasma atomic
  • GB/T 31197-2014 Inorganic chemicals for industrial use-Determination of impurity anions - Ion chromatography method
  • GB/T 43574-2023 Man-made fibers—Determination of heavy metal content—Inductively coupled plasma optical emission spectrometry(ICP-OES) and inductively coupled plasma mass spectrometry(ICP-MS)
  • GB/T 22572-2008 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • GB/T 8220.7-1998 Methods for chemical analysis of bismuth--Determination of arsenic content--Ion exchange separation-hydride generation-flame atomic absorption spectrophtometric method
  • GB/T 43663-2024 Surface chemical analysis—Secondary-ion mass spectrometry—Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • GB/T 32495-2016 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon
  • GB/T 11446.7-1997 Test method for trace chloride, nitrate, phosphate, sulfate in electronic grade water by ion-chromatography

Group Standards of the People's Republic of China

  • T/CIS 17004-2020 Ambient ionization device
  • T/CASAS 010-2019 Determination of Trace Impurities Concentration and Distribution in GaN Materials by Secondary Ion Mass Spectrometry
  • T/BPMA 32-2004 Determination of chlorate and perchlorate in leek by ion chromatography-mass spectrometry/mass spectrometry
  • T/NAIA 0169-2022 Water Quality Determination of Ammonia Nitrogen by Ion Chromatography
  • T/CASAS 009-2019 Determination of Trace Impurities Concentration and Distribution in Semi-insulating SiC Materials by Secondary Ion Mass Spectrometry
  • T/DLAS 004-2021 Determination of five kinds of selenium in selenium-enriched agricultural products by ion chromatography-inductively coupled plasma mass spectrometry
  • T/HNNMIA 62-2023 Chemical analysis methods for aluminum hydroxide seeds - Determination of oxalate - Ion chromatography
  • T/SXQCA 001-2023 Water quality-Determination of water soluble cations(Sr2+、Ba2+) -Ion chromatography
  • T/CAIA YQ006-2018 Performance testing method of Ion chromatography
  • T/NAIA 0168-2022 Water Quality Determination of Perchlorate by Ion Chromatography
  • T/ZJATA 0023-2024 Determination of perchlorate in water Ion chromatography-mass spectrometry/mass spectrometry

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 3884.19-2017 Methods for chemical analysis of copper concentrates - Part 19: Determination of thallium content - Inductively coupled plasma mass spectrometry
  • GB/T 8151.21-2017 Methods for chemical analysis of zinc concentrates - Part 21: Determination of thallium content - Inductively coupled plasma mass spectrometry and inductively coupled plasma-atomic emission spectrometry
  • GB/T 34672-2017 Chemical reagent-General rules for the ion chromatography
  • GB/T 20899.14-2017 Methods for chemical analysis of gold ores - Part 14: Determination of thallium content - Inductively coupled plasma atomic emission spectrometry and inductively coupled plasma mass spectrometry
  • GB/T 35925-2018 Determination of impurity fluorine ion in water soluble chemicals—Ion chromatography method
  • GB/T 8152.13-2017 Methods for chemical analysis of lead concentrates - Part 13: Determination of thallium content - Inductively coupled plasma mass spectrometry and inductively coupled plasma-atomic emission spectrometry

Professional Standard - Geology

  • DZ/T 0064.80-1993 Groundwater quality test methods - the determination of lithium and other 39 elements with plasma-mass spectroscopy
  • DZ/T 0064.42-1993 Groundwater quality test methods - the determination of strontium and barium with inductively couples plasma atomic emission spectromdtry
  • DZ/T 0064.51-1993 Groundwater quality test methods - the determination of chloridion, fluorinion, bromide ion, nitrate radical and sulfate radical with ion chromatography method
  • DZ/T 0064.28-1993 Groundwater quality test methods - the determination of potassium, sodium, lithium and ammonium with ion chromatography method

Professional Standard - Non-ferrous Metal

  • YS/T 900-2013 Methods for Chemical Analysis of The High Purity Tungsten - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
  • YS/T 630-2007 Chemical analysis methods of alumina Determination of impurities in Alumina inductively coupled plasma atomic emission spectrometric method
  • YS/T 898-2013 Methods for Chemical Analysis of The High Purity Tantalum - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
  • YS/T 244.9-2008 Chemical analysis methods of high purity aluminum Part 9: Determination of trace impurities in high pruity aluminumby inductively coupled mass spectrometry
  • YS/T 536.7-2006 Bismuth Chemical Analysis Method Ion Exchange Separation-Hydride Generation-Flame Atomic Absorption Spectrometry Determination of Arsenic
  • YS/T 666-2008 Chemical analysis emthods of gallium for industrial use - Determination of impurity elements - Inductively coupled plasma atomic emission spectrometric method
  • YS/T 896-2013 Methods for Chemical Analysis of High Purity Niobium - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
  • YS/T 34.1-2011 Method for chemical analysis of the high-purity arsenic—Inductive coupling plasma mass spectrum (ICP-MS) for determinating the concentration of elements in the high-purity arsenic
  • YS/T 980-2014 Determination of impurities of high purity gallium oxide—Inductively coupled plasma-mass spectrmetry
  • YS/T 742-2010 Methods for chemical analysis of gallium oxide Determination of impurities Inductively coupled plasma mass spectrometer method
  • YS/T 1593.4-2023 Methods for chemical analysis of crude lithium carbonate— Part 4:Determination of anion contents— Ion chromatography
  • YS/T 474-2005 Determination of trace elements in high-purity gallium--ICP-MS analytical method
  • YS/T 928.6-2013 Methods for Chemical Analysis of Nickel Cobalt Manganese Composite Hydroxide Part 6: Determination of Sulfate Ion Contents Ion Chromatography
  • YS/T 870-2013 Chemical Analysis of High Purity Aluminium-Determination of Trace Impurities Inductively Coupled Plasma Mass Spectrometry
  • YS/T 892-2013 Methods for Chemical Analysis of High Purity Titanium - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
  • YS/T 473-2015 Methods for chemical analysis industrial gallium―Determination of impurity elements―ICP-MS analytical method
  • YS/T 473-2005 Determination of impurity elements in gallium for industrial use - ICP-MS analytical method

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 37907-2019 Reclaimed water quality—Determination of sulfide and cyanide—Ion chromatography
  • GB/T 37837-2019 General rules for quadrupole inductively coupled plasma mass spectrometry
  • GB/T 40374-2021 Hardmetals—Determination of lead and cadmium content—Flame atomic absorption spectrometric method and inductively coupled plasma atomic emission spectrometry
  • GB/T 40798-2021 Chemical analysis method of ion-adsorption rare earth ore—Determination of total rare earth contents—Inductively coupled plasma mass spectrometry
  • GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • GB/T 7739.14-2019 Methods for chemical analysis of gold concentrates—Part 14:Determination of thallium content—Inductively coupled plasma atomic emission spectrometry and inductively coupled plasma mass spectrometry
  • GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • GB/T 39285-2020 Method for chemical analysis of palladium compounds—Determination of chlorine content—Ion chromatography
  • GB/T 39144-2020 Test method for magnesium content in gallium nitride materials—Secondary ion mass spectrometry
  • GB/T 41153-2021 Determination of boron,aluminum and nitrogen impurity content in silicon carbide single crystal―Secondary ion mass spectrometry
  • GB/T 40231-2021 Restricted substance in electrical and electronic products—Determination of hexavalent chromium—Ion chromatography method
  • GB/T 39486-2020 Chemical reagent—General rules for inductively coupled plasma mass spectrometry

Jiangxi Provincial Standard of the People's Republic of China

  • DB36/T 1839-2023 Determination of iodide in water quality by inductively coupled plasma mass spectrometry

Henan Provincial Standard of the People's Republic of China

  • DB41/T 778-2013 Determination of Chloride Ion Content in Chemical Fertilizers by Ion Chromatography

Professional Standard - Education

Professional Standard - Public Safety Standards

  • GA/T 1918-2021 Forensic Science Nitrite Ion Test Chemistry and Ion Chromatography
  • GA/T 1320-2016 GC-MS examination methods for fluoride ion in urine and blood in forensic science
  • GA/T 1628-2019 Forensic sciences—Examination methods for glyphosate in biological samples—IC-MS

Professional Standard - Agriculture

Professional Standard - Light Industry

  • QB/T 4711-2014 Determination of Inorganic Elements in Chinese Rice Wine - Inductive Coupled Plasma-mass Spectrometry and Inductively Coupled Plasma Atomic Emission Spectrometry
  • QB/T 4851-2015 Determination of inorganic elements in wine. Inductive coupled plasma mass spectrometry and inductive coupled plasma atomic emission spectrometry

Professional Standard - Machinery

  • JB/T 9361-1999 Test method for flame ionization detector of gas chromatography

Professional Standard - Electron

  • SJ 3237-1989 Method for determination of trace oxygen in electronic grade Argon--Argon ionization gas chromatography method
  • SJ/T 11498-2015 Test method for measuring oxygen contamination in heavily doped silicon substrates by secondary ion mass spectrometry
  • SJ/T 11493-2015 Test method for measuring nitrogen concentration in silicon substrates by secondary ion mass spectrometry
  • SJ 3238-1989 Method for determination of trace Nitrogen in electronic grade Argon--Argon ionization gas chromatography method

Professional Standard - Commodity Inspection

  • SN/T 3541-2013 Determination for multiple ether herbicides sesidues in foods for export-GC-MS/NCI method
  • SN/T 3821-2014 Determination of hexavalent chromium in cosmetics for export - Liquid chromatogram - Mass-spectrography of inductive coupling plasma
  • SN/T 2210-2008 Determination of hexavalent chromium in health foods - IC-ICP-MS method
  • SN/T 0736.14-2011 Test Method of Import and Export Fertilizers - Part 14: Determination of Trace Inorganic Anions by Ion Chromatography Method

Shandong Provincial Standard of the People's Republic of China

国家林业和草原局

  • LY/T 3013-2018 Determination of chloride and sulphate in wooden activated carbon - Ion chromatography method

Zhejiang Provincial Standard of the People's Republic of China

  • DB33/T 543-2005 Method for Determination of Multi-residue Pesticides in Fruits and Vegetables by Gas Chromatography Ion Trap Mass Spectrometry

Hunan Provincial Standard of the People's Republic of China

  • DB43/T 2957-2024 Water quality-Determination of perchlorate-Ion chromatography

国家能源局

  • SY/T 6404-2018 Analytical method for metal elements in rock by ICP-AES and ICP-MS

Sichuan Provincial Standard of the People's Republic of China

  • DB51/T 2112-2016 Determination of Gold in Geochemical Samples by Inductively Coupled Plasma Mass Spectrometry

International Organization for Standardization (ISO)

  • ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
  • ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
  • ISO 12010:2019 Water quality — Determination of short-chain polychlorinated alkanes (SCCP) in water — Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • ISO 14911:1998 Water quality - Determination of dissolved Li<(hoch)+>, Na<(hoch)+>, NH<(Index)4><(hoch)+>, K<(hoch)+>, Mn<(hoch)2+>, Ca<(hoch)2+>, Mg<(hoch)2+>, Sr<(hoch)2+> and Ba<(hoch)2+> using ion chromatography - Method for water and waste water
  • ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • ISO 18114:2021 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
  • ISO 11632:1998 Stationary source emissions - Determination of mass concentration of sulfur dioxide - Ion chromatography method
  • ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
  • ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon

Japanese Industrial Standards Committee (JISC)

  • JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • JIS K 0153:2015 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • JIS K 0133:2000 General rules for high frequency plasma mass spectrometry
  • JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
  • JIS K 0133:2007 General rules for high frequency plasma mass spectrometry
  • JIS K 0163:2010 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
  • JIS K 0400-35-30:1999 Water quality -- Determination of dissolved fluoride, chrolide, nitrite, orthophosphate, bromide, nitrate and sulfate ions, using liquid chromatography of ions Part 1: Method for water with low contamination
  • JIS K 0164:2010 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers

British Standards Institution (BSI)

  • BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • BS EN ISO 12010:2019 Water quality. Determination of short-chain polychlorinated alkanes (SCCP) in water. Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • BS ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • BS ISO 12010:2012 Water quality. Determination of short-chain polychlorinated alkanes (SCCPs) in water. Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • BS ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
  • BS DD ENV 12142:1997 Method for determination of stable hydrogen isotope ratio ( 2H/ 1H) of water from fruit juices, using isotope ratio mass spectrometry
  • BS ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
  • BS ISO 17862:2013 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • BS DD ENV 12140:1997 Method for determination of stable carbon isotope ratio ( 1 3C/ 1 2C) of sugars from fruit juices, using isotope ratio mass spectrometry
  • BS DD ENV 12141:1997 Method for determination of stable oxygen isotope ratio ( 1 8O/ 1 6O) of water from fruit juices, using isotope ratio mass spectrometry
  • BS ISO 11632:1998(1999) Stationary source emissions — Determination of mass concentration of sulfur dioxide — Ion chromatography method
  • BS ISO 11632:1998 Stationary source emissions - Determination of mass concentration of sulfur dioxide - Ion chromatography method
  • BS EN ISO 22125-2:2019 Water quality. Technetium-99 - Test method using inductively coupled plasma mass spectrometry (ICP-MS)
  • BS EN ISO 19340:2017 Water quality. Determination of dissolved perchlorate. Method using ion chromatography (IC)
  • BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon

KR-KS

  • KS I ISO 12010-2014 Water quality — Determination of short-chain polychlorinated alkanes(SCCPs) in water — Method using gas chromatography-mass spectrometry(GC-MS) and negative-ion chemical ionization(NCI)
  • KS I ISO 12010-2022 Water quality — Determination of short-chain polychlorinated alkanes(SCCPs) in water — Method using gas chromatography-mass spectrometry(GC-MS) and negative-ion chemical ionization(NCI)
  • KS K ISO 22818-2023 Textiles — Determination of short-chain chlorinated paraffins(SCCP) and middle-chain chlorinated paraffins(MCCP) in textile products out of different matrices by use of gas chromatography negative ion

GSO

  • BH GSO ISO 12010:2016 Water quality -- Determination of short-chain polychlorinated alkanes (SCCPs) in water -- Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • OS GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
  • GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • GSO ISO 12010:2013 Water quality -- Determination of short-chain polychlorinated alkanes (SCCPs) in water -- Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
  • GSO ISO 17560:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • GSO ISO 18114:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
  • BH GSO ISO 11632:2017 Stationary source emissions -- Determination of mass concentration of sulfur dioxide -- Ion chromatography method
  • GSO ISO 11632:2015 Stationary source emissions -- Determination of mass concentration of sulfur dioxide -- Ion chromatography method
  • BH GSO ISO 23830:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • OS GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • BH GSO ISO 23812:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
  • OS GSO ISO 23812:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials

American Society for Testing and Materials (ASTM)

  • ASTM D4327-97 Standard Test Method for Anions in Water by Chemically Suppressed Ion Chromatography
  • ASTM D4327-03 Standard Test Method for Anions in Water by Chemically Suppressed Ion Chromatography
  • ASTM D4327-17 Standard Test Method for Anions in Water by Chemically Suppressed Ion Chromatography
  • ASTM D4327-11 Standard Test Method for Anions in Water by Suppressed Ion Chromatography
  • ASTM C1287-95(2001) Standard Test Method for Determination of Impurities in Uranium Dioxide by Inductively Coupled Plasma Mass Spectrometry
  • ASTM D5996-05 Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography
  • ASTM C1287-10 Standard Test Method for Determination of Impurities in Nuclear Grade Uranium Compounds by Inductively Coupled Plasma Mass Spectrometry
  • ASTM C1287-18 Standard Test Method for Determination of Impurities in Nuclear Grade Uranium Compounds by Inductively Coupled Plasma Mass Spectrometry
  • ASTM D6357-21 Standard Test Methods for Determination of Trace Elements in Coal, Coke, and Combustion Residues from Coal Utilization Processes by Inductively Coupled Plasma Atomic Emission Spectrometry, Inductively
  • ASTM C1287-03 Standard Test Method for Determination of Impurities in Uranium Dioxide by Inductively Coupled Plasma Mass Spectrometry
  • ASTM E1504-11(2019) Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
  • ASTM C1625-19 Standard Test Method for Uranium and Plutonium Concentrations and Isotopic Abundances by Thermal Ionization Mass Spectrometry
  • ASTM D6357-19 Standard Test Methods for Determination of Trace Elements in Coal, Coke, and Combustion Residues from Coal Utilization Processes by Inductively Coupled Plasma Atomic Emission Spectrometry, Inductively
  • ASTM E1787-02 Standard Test Method for Anions in Caustic Soda and Caustic Potash (Sodium Hydroxide and Potassium Hydroxide) by Ion Chromatography
  • ASTM E1504-06 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
  • ASTM E1787-08 Standard Test Method for Anions in Caustic Soda and Caustic Potash (Sodium Hydroxide and Potassium Hydroxide) by Ion Chromatography
  • ASTM D5827-09e1 Standard Test Method for Analysis of Engine Coolant for Chloride and Other Anions by Ion Chromatography
  • ASTM E1787-96 Standard Test Method for Anions in Caustic Soda and Caustic Potash (Sodium Hydroxide and Potassium Hydroxide) by Ion Chromatography

SCC

  • 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
  • BS EN ISO 12010:2014 Water quality. Determination of short-chain polychlorinated alkanes (SCCPs) in water. Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • DANSK DS/ISO 12010:2019 Water quality – Determination of short-chain polychlorinated alkanes (SCCP) in water – Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • BS 6068-2-2.23:1986 Water quality. Physical, chemical and biochemical methods-Method for the determination of anionic surfactants by the methylene blue spectrometric method
  • NS-EN ISO 12010:2019 Water quality — Determination of short-chain polychlorinated alkanes (SCCP) in water — Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2019)
  • NS-EN ISO 12010:2014 Water quality — Determination of short-chain polychlorinated alkanes (SCCPs) in water — Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2012)
  • DANSK DS/EN ISO 12010:2019 Water quality – Determination of short-chain polychlorinated alkanes (SCCP) in water – Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2019)
  • AENOR UNE-EN ISO 12010:2020 Water quality - Determination of short-chain polychlorinated alkanes (SCCP) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2019)
  • SPC GB/T 37385-2019 Test method for chloride content of silicon -- Ion chromatography method (TEXT OF DOCUMENT IS IN CHINESE)
  • 10/30199169 DC BS ISO 12406. Surface chemical analysis. Secondary ion mass spectrometry. Method for depth profiling of arsenic in silicon
  • 07/30138812 DC BS ISO 23830. Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • DIN EN ISO 12010 E:2018 Draft Document - Water quality - Determination of short-chain polychlorinated alkanes (SCCP) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO/DIS 12010:2018); German and English versio...
  • AWWA WQTC65960 Fluoride Testing Method: Improving Ion Chromatography Accuracy
  • 10/30156236 DC BS ISO 12010. Water quality. Determination of short-chained polychlorinated alkanes (SCCP) in water. Method using gas chromatography/mass spectrometry (GC/MS) and negative-ion chemical ionization (NCI)
  • DIN EN ISO 18635 E:2014 Draft Document - Water quality - Determination of short-chain polychlorinated alkanes (SCCPs) in sediment and suspended (particulate) matter - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO/DIS...
  • AWWA WQTC50392 A New Approach to the Determination of Inorganic Anions in Environmental Waters by Ion Chromatography
  • BS 6068-2-2.38:1990 Water quality. Physical, chemical and biochemical methods-Methods for the determination of total chromium by atomic absorption spectrometry
  • BS 6068-45:1993 Water quality. Physical, chemical and biochemical methodsDetermination of selenium by atomic absorption spectrometry

Spanish Association for Standardization (UNE)

  • UNE-EN ISO 12010:2020 Water quality - Determination of short-chain polychlorinated alkanes (SCCP) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2019)
  • UNE-EN ISO 12010:2014 Water quality - Determination of short-chain polychlorinated alkanes (SCCPs) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2012)
  • UNE 77226:1999 STATIONARY SOURCE EMISSIONS. DETERMINATION OF MASS CONCENTRATION OF SULFUR DIOXIDE. ION CHROMATOGRAPHY METHOD.
  • UNE-EN ISO 19340:2018 Water quality - Determination of dissolved perchlorate - Method using ion chromatography (IC) (ISO 19340:2017)

Danish Standards Foundation

  • DS/ISO 12010:2012 Water quality - Determination of short-chain polychlorinated alkanes (SCCPs) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • DS/ISO 11632:1998 Stationary source emissions - Determination of mass concentration of sulfur dioxide - Ion chromatography method
  • DS/ISO 22818:2021 Textiles – Determination of short-chain chlorinated paraffins (SCCP) and middle-chain chlorinated paraffins (MCCP) in textile products out of different matrices by use of gas chromatography negative ion chemical ionization mass spectrometry (GC-NCI-MS)

Association Francaise de Normalisation

  • NF T90-048*NF EN ISO 14911:1999 Water quality - Determination of dissolved Li+, Na+, NH 4+, K+, Mn 2+, Ca 2+, Mg 2+, Sr 2+ and Ba 2+ using ion chromatography - Method for water and waste water.
  • NF X21-064*NF ISO 23830:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry.
  • NF EN ISO 22125-2:2019 Water quality - Technetium-99 - Part 2: test method by mass spectrometry coupled with induced plasma)
  • NF X21-051*NF ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • NF T90-046:2014 Water quality - Determination of short-chain polychlorinated alkanes (SCCPs) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • NF X31-130:1999 Soil quality - Chemical methods - Determination of cationic exchange capacity (CEC) and extractible cations
  • NF X43-338*NF ISO 11632:1998 Stationary source emissions. Determination of the mass concentration of sulfur dioxide. Ion chromatography method.
  • NF ISO 23830:2009 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Repeatability and constancy of the scale of relative intensities in static mass spectrometry of secondary ions
  • NF X31-130:1993 SOIL QUALITY. CHEMICAL METHODS. DETERMINATION OF CATIONIC EXCHANGE CAPACITY (CEC) AND EXTRACTIBLE CATIONS.
  • NF T90-042:1995 Water quality - Determination of dissolved fluoride, chloride, nitrite, orthophosphate, bromide, nitrate and sulfate ions, using liquid chromatography of ions - Part 1 : method for water with low contamination.

RO-ASRO

  • STAS SR 8662-1-1997 Water quality - Determination of manganese - Spectrometric method with manganese oxidation at the permanganic ion

Korean Agency for Technology and Standards (KATS)

  • KS D ISO 18114-2020 Surface chemical analysis-Secondary-ion mass spectrometry-Determination of relative sensitivity factors from ion-implanted reference materials
  • KS D ISO 18114-2005(2020) Surface chemical analysis-Secondary-ion mass spectrometry-Determination of relative sensitivity factors from ion-implanted reference materials
  • KS I ISO 12010:2014 Water quality — Determination of short-chain polychlorinated alkanes(SCCPs) in water — Method using gas chromatography-mass spectrometry(GC-MS) and negative-ion chemical ionization(NCI)
  • KS I ISO 12010:2022 Water quality — Determination of short-chain polychlorinated alkanes(SCCPs) in water — Method using gas chromatography-mass spectrometry(GC-MS) and negative-ion chemical ionization(NCI)
  • KS I ISO 14911:2009 Water quality-Determination of dissolved Li+, Na+,NH4+, K+, Mn2+, Ca2+, Mg2+, Sr2+ and Ba2+ using ion chromatography-Method for water and waste water
  • KS D ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
  • KS D ISO 17560:2003 Surface chemical analysis-Secondary-on mass spectrometry- Method for depth profiling of boron in silicon
  • KS D ISO 20341-2005(2020) Surface chemical analysis-Secondary-ion mass spectrometry-Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • KS D ISO 18114:2005 Surface chemical analysis-Secondary-ion mass spectrometry-Determination of relative sensitivity factors from ion-implanted reference materials
  • KS I ISO 11632:2004 Stationary source emissions-Determination of the massconcentration of sulfur dioxide(Ion chromatography method)
  • KS I ISO 11632-2019 Stationary source emissions — Determination of the mass concentration of sulfur dioxide(ion chromatography method)
  • KS M 0180-2019 Standard test method for halogen(F, Cl, Br) and sulfur content by oxidative pyrohydrolytic combustion followed by ion chromatography detection (Combustion ion chromatography-CIC)
  • KS I ISO 11632-2014(2019) Stationary source emissions — Determination of the mass concentration of sulfur dioxide(ion chromatography method)
  • KS I ISO 11632:2014 Stationary source emissions — Determination of the mass concentration of sulfur dioxide(ion chromatography method)
  • KS D ISO 20341-2020 Surface chemical analysis-Secondary-ion mass spectrometry-Method for estimating depth resolution parameters with multiple delta-layer reference materials

German Institute for Standardization

  • DIN EN ISO 12010:2019-09 Water quality - Determination of short-chain polychlorinated alkanes (SCCP) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2019); German version EN ISO 12010:2019
  • DIN EN ISO 12010:2019 Water quality - Determination of short-chain polychlorinated alkanes (SCCP) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2019)
  • DIN EN ISO 14911:1999 Water quality - Determination of dissolved Li<(hoch)+>, Na<(hoch)+>, NH<(Index)4><(hoch)+>, K<(hoch)+>, Mn<(hoch)2+>, Ca<(hoch)2+>, Mg<(hoch)2+>, Sr<(hoch)2+> and Ba<(hoch)2+> using ion chromatography - Method for water and waste water (ISO 14911:1998); G
  • DIN EN ISO 17294-1:2022-07 Water quality - Application of inductively coupled plasma mass spectrometry (ICP-MS) - Part 1: General guidelines (ISO/DIS 17294-1:2022); German and English version prEN ISO 17294-1:2022 / Note: Date of issue 2022-06-17*Intended as replacement for DIN ...
  • DIN EN ISO 19340:2019-01 Water quality - Determination of dissolved perchlorate - Method using ion chromatography (IC) (ISO 19340:2017); German version EN ISO 19340:2017
  • DIN EN ISO 12010 E:2013-12 Water quality Determination of short-chain polychlorinated triphenylane (SCCP) in water by gas chromatography mass spectrometry (GC-MS) and negative ion chemical ionization (NCI) (draft)
  • DIN EN ISO 12010 E:2018-03 Water quality Determination of short-chain polychlorinated triphenylane (SCCP) in water by gas chromatography mass spectrometry (GC-MS) and negative ion chemical ionization (NCI) (draft)

CEN - European Committee for Standardization

  • EN ISO 12010:2019 Water quality - Determination of short-chain polychlorinated alkanes (SCCP) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)

AT-ON

  • ONORM M 6253 Teil.1-1985 Water analysis; determination ofanionic Surfactants by the methylene blue spectrometric method

European Committee for Standardization (CEN)

  • EN ISO 12010:2014 Water quality - Determination of short-chain polychlorinated alkanes (SCCPs) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • EN ISO 14911:1999 Water Quality - Determination of Dissolved Li+, Na+, NH4+, K+, Mn2+, Ca2+, Mg2+, Sr2+ and Ba2+ Using Ion Chromatography - Method for Water and Waste Water ISO 14911:1998
  • EN ISO 22125-2:2019 Water quality - Technetium-99 - Part 2: Test method using inductively coupled plasma mass spectrometry (ICP-MS) (ISO 22125-2:2019)

American National Standards Institute (ANSI)

  • ANSI/ASTM D5827:1998 Test Method for Determination of Chloride in Engine Coolant by Ion Chromatography

VN-TCVN

  • TCVN 6750-2000 Stationary source emissions.Determination of mass concentration of sulfur dioxide.Ion chromatography method

Standard Association of Australia (SAA)

  • AS ISO 22048:2006 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
  • AS ISO 22048:2006(R2016) Surface chemical analysis - Information format for static secondary-ion mass spectrometry

US-ACEI

IPC - Association Connecting Electronics Industries