mass spectrometry ionization

mass spectrometry ionization, Total:296 items.

The international standard classification for "mass spectrometry ionization" includes: Chemical analysis , Chemical reagents , Products of non-ferrous metals in general , Metalliferous minerals , Lead, zinc, tin and their alloys , Organic chemicals in general , Other non-ferrous metals and their alloys , Textiles in general , Chemical analysis of metals , Testing of metals in general , Titanium and titanium alloys , Nickel, chromium and their alloys , Biology. Botany. Zoology , Copper and copper alloys , Laboratory medicine .

The Chinese standard classification for "mass spectrometry ionization" includes: chromatograph , Basic standards and general methods , Chemical reagent in general , Precious metal ore , Industrial gas and chemical gas , Heavy metal ore , Heavy metals and their alloys analysis method , Organic chemicals in general , Rare metals and their alloys analysis method , Electron optics and other physical optics instrument , Basic standards and general methods , Light metals and their alloys analysis method , Rare light metals and their alloys , Rare refractory metals and their compounds , Semimetal and semiconductor material analysis method , Basic standard and general method , Basic Subject in general , Medical laboratory equipment .

Professional Standard - Education

JY/T 0567-2020 General rules for inductively coupled plasma optical emission spectrometry
JY/T 020-1996 General rules for ion chromatograpy
JY/T 0568-2020 General rules for inductively coupled plasma-mass spectrometry
JY/T 003-1996 General principles for organic mass spectrometry
JY/T 0575-2020 General rules of analytical methods for ion chromatography

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
GB/T 37182-2018 Gas analysis--Gas chromatograph with plasma emission detector
GB/T 7739.14-2019 Methods for chemical analysis of gold concentrates—Part 14:Determination of thallium content—Inductively coupled plasma atomic emission spectrometry and inductively coupled plasma mass spectrometry
GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
GB/T 40798-2021 Chemical analysis method of ion-adsorption rare earth ore—Determination of total rare earth contents—Inductively coupled plasma mass spectrometry
GB/T 39486-2020 Chemical reagent—General rules for inductively coupled plasma mass spectrometry

国家能源局

SY/T 7361-2017 Quadrupole mass spectrometry for rare gas separation and component content analysis
SY/T 6404-2018 Analytical method for metal elements in rock by ICP-AES and ICP-MS

工业和信息化部

YS/T 461.12-2016 Methods for chemical analysis of lead and zinc bulk concentrates-Part 12:Determination of thallium content-Inductively coupled plasma mass spectrometry and inductively coupled plasma atomic emission spectrometry
YS/T 474-2021 Chemical analysis methods of high purity gallium-Determination of trace element-Inductively coupled plasma mass spectrometry
YS/T 1496-2021 Analysis method for palladium compounds Determination of impurity anion content Ion chromatography
YS/T 1050.10-2016 Methods for chemical analysis of lead-antimony concentrate. Part 10: Determanation of thallium. Inductively coupled plasma mass spectrometry and inductively coupled plasma atomic emission spectrometry
YS/T 1497-2021 Analysis method for platinum compounds Determination of impurity anion content Ion chromatography
YS/T 445.14-2019 Methods for chemical analysis of silver concentrates - Part 14: Determination of thallium content Inductively coupled plasma-mass spectrometry and inductively coupled plasma atomic emission spectrometry
YS/T 1171.13-2021 Methods for chemical analysis of recycled zinc raw materials Part 13: Determination of thallium content by inductively coupled plasma mass spectrometry and inductively coupled plasma atomic emission spectrometry
YS/T 870-2020 Method for chemical analysis of aluminium - Determination of trace impurities contents - Inductively coupled plasma mass spectrometry
YS/T 540.5-2018 Methods for chemical analysis of vanadium-Part 5:Determination of impurity contents-Inductively coupled plasma atomic emission spectrometry

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 42699.2-2023 Textiles―Qualitative and quantitative proteomic analysis of some animal hair fibres―Part 2:Peptide detection using MALDI-TOF-MS
GB/T 28726-2012 Gas analysis—Gas chromatograph with helium ionization detector
GB/T 20176-2006 Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials
GB/T 32495-2016 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon
GB/T 6041-2020 General rules for mass spectrometric analysis
GB/T 22572-2008 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
GB/T 6041-2002 General rules for mass spectrometric analysis
GB/T 25186-2010 Surface chemical analysis—Secondary-ion mass spectrometry—Determination of relative sensitivity factors from ion-implanted reference materials
GB/T 14352.24-2022 Methods for chemical analysis of tungsten ores and molybdenum ores—Part 24: Determination of germanium conten—Inductively coupled plasma mass spectrometry
GB/T 13747.27-2020 Methods for chemical analysis of zirconium and zirconium alloys—Part 27：Determination of trace impurities content—Inductively coupled plasma mass spectrometry
GB/T 12690.13-2003 Chemical analysis methods for non-rare earth impurities of rare earth metals and their oxides - Determination of molybdenum and tungsten content - Inductively coupled plasma atomic
GB/T 43663-2024 Surface chemical analysis—Secondary-ion mass spectrometry—Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
GB/Z 35959-2018 General rule for liquid chromatography-mass spectrometry

Professional Standard - Medicine

YY/T 1740.3-2024 Clinical mass spectrometer-Part 3 : Inductively coupled plasma mass spectrometry

Professional Standard - Non-ferrous Metal

YS/T 34.1-2011 Method for chemical analysis of the high-purity arsenic—Inductive coupling plasma mass spectrum (ICP-MS) for determinating the concentration of elements in the high-purity arsenic
YS/T 473-2015 Methods for chemical analysis industrial gallium―Determination of impurity elements―ICP-MS analytical method
YS/T 892-2013 Methods for Chemical Analysis of High Purity Titanium - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
YS/T 473-2005 Determination of impurity elements in gallium for industrial use - ICP-MS analytical method
YS/T 898-2013 Methods for Chemical Analysis of The High Purity Tantalum - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
YS/T 244.9-2008 Chemical analysis methods of high purity aluminum Part 9: Determination of trace impurities in high pruity aluminumby inductively coupled mass spectrometry
YS/T 896-2013 Methods for Chemical Analysis of High Purity Niobium - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
YS/T 820.9-2012 Methods for Chemical Analysis of Lateritic Nickel Ore - Part 9: Determination of Scandium and Cadmium Contents - Inductively Coupled Plasma Mass Spectrometry
YS/T 742-2010 Methods for chemical analysis of gallium oxide Determination of impurities Inductively coupled plasma mass spectrometer method
YS/T 900-2013 Methods for Chemical Analysis of The High Purity Tungsten - Determination of Trace Impurity Element Content - Inductively Coupled Plasma Mass Spectrometry
YS/T 870-2013 Chemical Analysis of High Purity Aluminium-Determination of Trace Impurities Inductively Coupled Plasma Mass Spectrometry
YS/T 474-2005 Determination of trace elements in high-purity gallium--ICP-MS analytical method

Taiwan Provincial Standard of the People's Republic of China

CNS 12509-1989 General Rules Analytical Methods in Gas Chromatography/Mass Spectrometry
CNS 12511-1989 General Rules for Mass Spectrometric Analysis

Professional Standard - Commodity Inspection

SN/T 2698-2010 Elemental analysis of impurities in tungsten products—Inductively coupled plasma atomic emission spectrometric method

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 8152.13-2017 Methods for chemical analysis of lead concentrates - Part 13: Determination of thallium content - Inductively coupled plasma mass spectrometry and inductively coupled plasma-atomic emission spectrometry
GB/T 33682-2017 General microganism identification method with matrix-assisted laser desorption/ionization time of flight mass spectrometry
GB/T 8151.21-2017 Methods for chemical analysis of zinc concentrates - Part 21: Determination of thallium content - Inductively coupled plasma mass spectrometry and inductively coupled plasma-atomic emission spectrometry
GB/T 20899.14-2017 Methods for chemical analysis of gold ores - Part 14: Determination of thallium content - Inductively coupled plasma atomic emission spectrometry and inductively coupled plasma mass spectrometry
GB/T 3884.19-2017 Methods for chemical analysis of copper concentrates - Part 19: Determination of thallium content - Inductively coupled plasma mass spectrometry

Group Standards of the People's Republic of China

T/ZJATA 0023-2024 Determination of perchlorate in water Ion chromatography-mass spectrometry/mass spectrometry
T/QAS 082.14-2023 Chemical Analysis of Rock Salt and Glauber's Salt - Part 14: Determination of Bromine by Inductively Coupled Plasma Mass Spectrometry
T/SCS 000022-2024 Molybdenum alloys – Analysis of trace elements – Glow discharge mass spectrometry method
T/ZPP 017-2023 Mass Cytometry Analyzer
T/QAS 082.6-2023 Chemical Analysis of Rock Salt and Glauber's Salt Part 6: Determination of Iodine by Inductively Coupled Plasma Mass Spectrometry

国家药监局

YY/T 1740.2-2021 Clinical mass spectrometer—Part 2:Matrix-assisted laser desorption ionization-time of flight mass spectrometer

国家卫生计生委

WS/T 549-2017 Methods for analysis of total uranium and uranium-235/uranium-238 isotope ratio in urine. Inductively coupled plasma-mass spectrometry (ICP-MS)

Professional Standard - Agriculture

73药典四部-2015 0412 Inductively coupled plasma mass spectrometry
53药典四部-2020 0412 Inductively coupled plasma mass spectrometry

Professional Standard - Geology

DZ/T 0279.16-2016 Analysis methods for regional geochemical sample. Part 16: Determination of germanium contents by inductively coupled plasma mass spectrometry
DZ/T 0064.80-2021 Methods for analysis of groundwater quality- Part 80: Determination of forty elements (lithium, rubidium, cesium, etc)contents- Inductively coupled plasma mass spectrometry
DZ/T 0279.7-2016 Analysis methods for regional geochemical sample. Part 7: Determination of molybdenum contents by inductively coupled plasma mass spectrometry
DZ/T 0279.24-2016 Analysis methods for regional geochemical sample. Part 24: Determination of iodine contents by inductively coupled plasma mass spectrometry
DZ/T 0064.28-2021 Methods for analysis of groundwater quality- Part28: Determination of potassium, sodium lithium and ammonium contents- Ion chromatography
DZ/T 0279.6-2016 Analysis methods for regional geochemical sample. Part 6: Determination of uranium contents by inductively coupled plasma mass spectrometry
DZ/T 0279.5-2016 Analysis methods for regional geochemical sample. Part 5: Determination of cadmium contents by inductively coupled plasma mass spectrometry
DZ/T 0279.8-2016 Analysis methods for regional geochemical sample. Part 8: Determination of thallium contents by inductively coupled plasma mass spectrometry

Anhui Provincial Standard of the People's Republic of China

DB34/T 3368.2-2019 Analytical methods of hazardous substances in printed circuit boards - Part 2: Determination of halogens (chlorine and bromine) by ion chromatography
DB34/T 3368.5-2019 Methods of analysis of hazardous substances in printed circuit boards - Part 5: Determination of mercury content by inductively coupled plasma spectrometry

National Metrological Technical Specifications of the People's Republic of China

JJF 1120-2004 Calibration Specification for Thermal ionization isotope mass spectrometers

国家质量监督检验检疫总局

SN/T 4501.3-2017 Chemical analysis of nickel concentrate—Part 3:Determination of gold,platinum,palladium—Inductively coupled plasma mass spectrometry method

British Standards Institution (BSI)

BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
BS ISO 17862:2013 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
BS ISO 12010:2012 Water quality. Determination of short-chain polychlorinated alkanes (SCCPs) in water. Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
BS ISO 22048:2004 Surface chemical analysis. Information format for static secondary-ion mass spectrometry
BS ISO 22048:2004(2005) Surface chemical analysis — Information format for static secondary - ion mass spectrometry
BS DD ENV 13800:2000 Lead and lead alloys - Analysis by flame atomic absorption spectromerty (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), without separation of the lead matrix
BS ISO 17560:2014 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
BS ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
BS ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
BS PD CEN/TS 17197:2018 Construction products: Assessment of release of dangerous substances. Analysis of inorganic substances in digests and eluates. Analysis by Inductively Coupled Plasma. Optical Emission Spectrometry (ICP-OES). Analysis by Inductive Coupled Plasma. Optical E
BS EN 14242:2023 Aluminium and aluminium alloys — Chemical analysis — Inductively coupled plasma optical emission spectrometric analysis
BS PD CEN/TS 17200:2018 Construction products. Assessment of release of dangerous substances. Analysis of inorganic substances in digests and eluates. Analysis by Inductively Coupled Plasma. Mass Spectrometry (ICP-MS)
BS ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
BS EN 17200:2023 Tracked Changes. Construction products: Assessment of release of dangerous substances. Analysis of inorganic substances in eluates and digests. Analysis by inductively coupled plasma mass spectrometry (ICP-MS)
22/30419108 DC BS EN 17200. Construction products: Assessment of release of dangerous substances. Analysis of inorganic substances in digests and eluates. Analysis by inductively coupled plasma mass spectrometry (ICP-MS)
BS ISO 23812:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
BS ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
22/30444828 DC BS EN 14242. Aluminium and aluminium alloys. Chemical analysis. Inductively coupled plasma optical emission spectral analysis
BS ISO 18114:2021 Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
BS ISO 22415:2019 Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
BS EN 17197:2023 Construction products: Assessment of release of dangerous substances. Analysis of inorganic substances in eluates and digests. Analysis by inductively coupled plasma optical emission spectrometry (ICP-OES)
BS PD ISO/TS 17951-1:2016 Water quality. Determination of fluoride using flow analysis (FIA and CFA). Method using flow injection analysis (FIA) and spectrometric detection after off-line distillation
BS ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials

International Organization for Standardization (ISO)

ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 22048:2004 Surface chemical analysis — Information format for static secondary-ion mass spectrometry
ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
ISO 12010:2012 Water quality - Determination of short-chain polychlorinated alkanes (SCCPs) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
ISO 18114:2021 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
ISO/TS 15338:2020 Surface chemical analysis — Glow discharge mass spectrometry — Operating procedures
ISO 14237:2000 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials

US-ACEI

IPC TM-650 2.3.28-1995 Ionic Analysis of Circuit Boards Ion Chromatography Method

IPC - Association Connecting Electronics Industries

IPC TM-650 2.3.28A-2004 Ionic Analysis of Circuit Boards@ Ion Chromatography Method
IPC TM-650 2.3.28B-2012 Ionic Analysis of Circuit Boards@ Ion Chromatography Method

KR-KS

KS I ISO 17294-2014 Water quality — Application of inductively coupled plasma mass spectrometry(ICP-MS)
KS M 0035-2008(2023) General rules for ion chromatographic analysis
KS D ISO 17560-2003(2023) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
KS M 0025-2008(2023) General rules for mass spectrometric analysis
KS M 0027-2008(2023) General rules for analytical methods in gas chromatography mass spectrometry
KS D ISO 14237-2003(2023) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon

GSO

GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
OS GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
GSO ISO 18114:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
BH GSO ISO 23830:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
OS GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
OS GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
BH GSO ISO 22048:2016 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
BH GSO ISO 18114:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
GSO ISO 17560:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon

American Society for Testing and Materials (ASTM)

ASTM E1504-11 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM RR-E01-1115 2011 E2823-Test Method for Analysis of Nickel Alloys by Inductively Coupled Plasma Mass Spectrometry
ASTM UOP1031-19 Chromium (III) and Chromium (VI) Speciation in Water by IC-ICP-MS (Ion Chromatography- Inductively Coupled Plasma Mass Spectrometry)
ASTM D2786-91(2006) Standard Test Method for Hydrocarbon Types Analysis of Gas-Oil Saturates Fractions by High Ionizing Voltage Mass Spectrometry
ASTM D2786-91(1996) Standard Test Method for Hydrocarbon Types Analysis of Gas-Oil Saturates Fractions by High Ionizing Voltage Mass Spectrometry
ASTM D3239-91(2016) Standard Test Method for Aromatic Types Analysis of Gas-Oil Aromatic Fractions by High Ionizing Voltage Mass Spectrometry
ASTM D2786-91(2011) Standard Test Method for Hydrocarbon Types Analysis of Gas-Oil Saturates Fractions by High Ionizing Voltage Mass Spectrometry
ASTM D323-90 Standard Test Method for Vapor Pressure of Petroleum Products (Reid Method)
ASTM D323-15a Standard Test Method for Vapor Pressure of Petroleum Products (Reid Method)
ASTM D2786-91(2016) Standard Test Method for Hydrocarbon Types Analysis of Gas-Oil Saturates Fractions by High Ionizing Voltage Mass Spectrometry
ASTM D323-15 Standard Test Method for Vapor Pressure of Petroleum Products (Reid Method)
ASTM D323-94 Standard Test Method for Vapor Pressure of Petroleum Products (Reid Method)
ASTM D3239-91(2011) Standard Test Method for Aromatic Types Analysis of Gas-Oil Aromatic Fractions by High Ionizing Voltage Mass Spectrometry
ASTM D2786-91(2001)e1 Standard Test Method for Hydrocarbon Types Analysis of Gas-Oil Saturates Fractions by High Ionizing Voltage Mass Spectrometry
ASTM C1379-10 Standard Test Method for Analysis of Urine for Uranium-235 and Uranium-238 Isotopes by Inductively Coupled Plasma-Mass Spectrometry
ASTM D3239-91(2001) Standard Test Method for Aromatic Types Analysis of Gas-Oil Aromatic Fractions by High Ionizing Voltage Mass Spectrometry
ASTM D3239-91(1996) Standard Test Method for Aromatic Types Analysis of Gas-Oil Aromatic Fractions by High Ionizing Voltage Mass Spectrometry
ASTM D3239-91(2006) Standard Test Method for Aromatic Types Analysis of Gas-Oil Aromatic Fractions by High Ionizing Voltage Mass Spectrometry
ASTM E10-08 Standard Test Method for Brinell Hardness of Metallic Materials
ASTM E10-15 Standard Test Method for Brinell Hardness of Metallic Materials
ASTM UOP1037-20 Trace Metals Analysis in Liquefied Petroleum Gases by Inductively Coupled Plasma-Mass Spectrometry
ASTM E1097-97 Standard Guide for Direct Current Plasma Emission Spectrometry Analysis
ASTM D846-84 Standard Test Method for Analysis of Multiple Elements in Cannabis Matrices by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
ASTM D8469-22 Standard Test Method for Analysis of Multiple Elements in Cannabis Matrices by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
ASTM E1881-12 Standard Guide for Cell Culture Analysis with SIMS
ASTM RR-D37-2001 2022 D8469-Test Method for Analysis of Multiple Elements in Cannabis Matrices by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
ASTM C1637-21 Standard Test Method for Determination of Impurities in Plutonium Materials—Acid Digestion and Inductively Coupled Plasma-Mass Spectroscopy (ICP-MS) Analysis
ASTM C1637-13 Standard Test Method for the Determination of Impurities in Plutonium Metal: Acid Digestion and Inductively Coupled Plasma-Mass Spectroscopy (ICP-MS) Analysis
ASTM E1881-06 Standard Guide for Cell Culture Analysis with SIMS
ASTM E1140-95(2000) Standard Practice for Testing Nitrogen/Phosphorus Thermionic Ionization Detectors for Use In Gas Chromatography
ASTM C1637-06 Standard Test Method for the Determination of Impurities in Plutonium Metal: Acid Digestion and Inductively Coupled Plasma-Mass Spectroscopy (ICP-MS) Analysis
ASTM C1476-00 Standard Test Method for Analysis of Urin for Technetium-99 by Inductively Coupled Plasma-Mass Spectrometry
ASTM E2823-17 Standard Test Method for Analysis of Nickel Alloys by Inductively Coupled Plasma Mass Spectrometry (Performance-Based)
ASTM C1845-16 Standard Practice for The Separation of Lanthanide Elements from Uranium Matrices Using High Pressure Ion Chromatography (HPIC) for Isotopic Analyses by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
ASTM C1476-06 Standard Test Method for Analysis of Urine for Technetium-99 by Inductively Coupled Plasma-Mass Spectrometry

Japanese Industrial Standards Committee (JISC)

JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
JIS K 0127:2001 General rules for ion chromatographic analysis
JIS K 0127:1992 General rules for ion chromatographic analysis
JIS K 0127:2013 General rules for ion chromatography
JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers
JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
JIS K 0153:2015 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
JIS K 0118:1979 General rules for mass spectrometric analysis
JIS K 0123:1995 General rules for analytical methods in gas chromatography mass spectrometry
JIS K 0163:2010 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
JIS K 0400-52-30:2001 Water quality -- Determination of 33 elements by inductively coupled plasma atomic emission spectroscopy
JIS K 0133:2022 General rules for ICP-mass spectrometry

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC TM-650 2.3.28-2004 Ionic Analysis of Circuit Boards, Ion Chromatography Method Revision A

Korean Agency for Technology and Standards (KATS)

KS M 0035-1993 General rules for ion chromatographic analysis
KS M 0035-2023 General rules for ion chromatographic analysis
KS D ISO 22048-2020 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 22048-2005(2020) Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 18114-2020 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS D ISO 18114-2005(2020) Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS M 0025-2008(2018) General rules for mass spectrometric analysis
KS D 1702-2020 Platium－Determination of trace-element content by inductively coupled plasma spectrometric analysis－Matrix matching method
KS M 0027-1993 General Rules for Analytical Methods in Gas Chromatography Mass Spectrometry
KS M 0027-2023 General rules for analytical methods in gas chromatography mass spectrometry
KS M 0025-2023 General rules for mass spectrometric analysis
KS D 1673-2007 Methods for inductively coupled plasma emission spectrochemical analysis of steel
KS M 0025-1993 General rules for mass spectrometric analysis
KS D ISO 18114:2005 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS I ISO 17294:2014 Water quality — Application of inductively coupled plasma mass spectrometry(ICP-MS)
KS I ISO 17294-2014(2021) Water quality — Application of inductively coupled plasma mass spectrometry(ICP-MS)
KS D 1673-2007(2022) Methods for inductively coupled plasma emission spectrochemical analysis of steel
KS D ISO 20341-2020 Surface chemical analysis－Secondary-ion mass spectrometry－Method for estimating depth resolution parameters with multiple delta-layer reference materials
KS M 0027-2008(2018) General rules for analytical methods in gas chromatography mass spectrometry

SCC

10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
AWWA WQTC58858 Liquid Chromatography of Bromate and Bromoacetic Acids with Inductively Coupled Plasma Mass Spectrometry Detection
DANSK DS/CEN/TS 17200:2018 Construction products: Assessment of release of dangerous substances – Analysis of inorganic substances in digests and eluates – Analysis by Inductively Coupled Plasma – Mass Spectrometry (ICP-MS)
DANSK DS/CEN/TS 17200+AC:2019 Construction products: Assessment of release of dangerous substances – Analysis of inorganic substances in digests and eluates – Analysis by Inductively Coupled Plasma – Mass Spectrometry (ICP-MS)
AWWA WQTC55099 The Use of Electrospray Ionization (ESI) High-Field Asymmetric Waveform Ion Mobility Mass Spectrometry (FAIMS-MS) for the Analysis of Haloacetic Acids (HAAS) in Drinking Water
BS PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
NS-EN 14242:2004 Aluminium and aluminium alloys — Chemical analysis — Inductively coupled plasma optical emission spectral analysis
ISO 17109:2015/DAmd 1 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films — A...
NS-EN 14242:2023 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectrometric analysis
SN-CEN/TS 17200:2018 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by Inductively Coupled Plasma - Mass Spectrometry (ICP-MS)
DANSK DS/EN 17200:2023 Construction products: Assessment of release of dangerous substances – Analysis of inorganic substances in eluates and digests – Analysis by inductively coupled plasma mass spectrometry (ICP-MS)
DIN EN 17200:2024 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in eluates and digests - Analysis by inductively coupled plasma mass spectrometry (ICP-MS); German version EN 17200:2023
DANSK DS/EN 14242:2004 Aluminium and aluminium alloys – Chemical analysis – Inductively coupled plasma optical emission spectral analysis
NS-ENV 14029:2001 Lead and lead alloys — Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), after separation of the lead matrix
10/30199169 DC BS ISO 12406. Surface chemical analysis. Secondary ion mass spectrometry. Method for depth profiling of arsenic in silicon
DIN EN 17200 E:2022 Draft Document - Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by inductively coupled plasma mass spectrometry (ICP-MS); German and English version prEN 17200:2022
07/30138812 DC BS ISO 23830. Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
DIN EN 14242 E:2022 Draft Document - Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectral analysis; German and English version prEN 14242:2022
AWWA QTC98245 Analysis of Metals by Inductively Coupled Plasma-Mass Spectrometry: Effect of Concentration on Accuracy and Precision
SN-CEN/TS 17197:2018 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by Inductively Coupled Plasma - Optical Emission Spectrometry (ICP-OES)
DIN EN 17197:2024 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in eluates and digests - Analysis by inductively coupled plasma optical emission spectrometry (ICP-OES); German version EN 17197:2023
DANSK DS/EN 17197:2023 Construction products: Assessment of release of dangerous substances – Analysis of inorganic substances in eluates and digests – Analysis by inductively coupled plasma optical emission spectrometry (ICP-OES)
DANSK DS/CEN/TS 17197:2018 Construction products: Assessment of release of dangerous substances – Analysis of inorganic substances in digests and eluates – Analysis by Inductively Coupled Plasma – Optical Emission Spectrometry (ICP-OES)
AWWA WQTC62560 Analysis of Less Volatile Compounds Using Ion Trap Mass Spectrometry Coupled with Modified Purge-Trap Technique

Association Francaise de Normalisation

NF T90-046:2014 Water quality - Determination of short-chain polychlorinated alkanes (SCCPs) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
NF ISO 17560:2006 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron in silicon by thickness profiling
NF ISO 23830:2009 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Repeatability and constancy of the scale of relative intensities in static mass spectrometry of secondary ions
NF EN 17200:2023 Construction products: assessment of the emission of hazardous substances - Analysis of inorganic substances in digestates and eluates - Analysis by inductively coupled plasma mass spectrometry (ICP-MS)
NF EN 1785:2003 Food products - Detection of ionized foods containing lipids - Analysis by gas chromatography/mass spectrometry of 2-alkylcytobutanones
XP A06-422*XP ENV 14029:2001 Lead and lead alloys - Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), after separation of the lead matrix
NF T51-241:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).
NF X21-066*NF ISO 23812:2009 Surface chemical analysis - Secondary ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
XP A06-421*XP ENV 13800:2000 Lead and lead alloys - Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), without separation of the lead matrix
NF X21-064*NF ISO 23830:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry.
NF ISO 14237:2010 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron atoms in silicon using uniformly doped materials
NF EN 1784:2003 Produits alimentaires - Détection d'aliments ionisés contenant des lipides - Analyse par chromatographie en phase gazeuse des hydrocarbures
NF T30-711:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).
NF X21-070*NF ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials.

German Institute for Standardization

DIN EN ISO 12010 E:2013-12 Water quality Determination of short-chain polychlorinated triphenylane (SCCP) in water by gas chromatography mass spectrometry (GC-MS) and negative ion chemical ionization (NCI) (draft)
DIN EN ISO 12010 E:2018-03 Water quality Determination of short-chain polychlorinated triphenylane (SCCP) in water by gas chromatography mass spectrometry (GC-MS) and negative ion chemical ionization (NCI) (draft)
DIN V ENV 13800:2000 Lead and lead alloys - Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES) without separation of the lead matrix; German version ENV 13800:2000
DIN EN 17200:2022-06 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by inductively coupled plasma mass spectrometry (ICP-MS); German and English version prEN 17200:2022 / Note: Date ...
DIN EN 14242:2023-04 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectrometric analysis; German version EN 14242:2023
DIN EN 14242:2023 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectrometric analysis
DIN EN 17200:2022 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by inductively coupled plasma mass spectrometry (ICP-MS); German and English version prEN 17200:2022
DIN CEN/TS 17200:2019*DIN SPEC 18484:2019 Construction products - Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by Inductively Coupled Plasma - Mass Spectrometry (ICP-MS)
DIN CEN/TS 17200:2019-03*DIN SPEC 18484:2019-03 Construction products - Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by Inductively Coupled Plasma - Mass Spectrometry (ICP-MS); German version CEN/TS 17200:2018+AC:2018 / Note: To b...
DIN EN 14242:2004 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectral analysis; German version EN 14242:2004
DIN EN ISO 12010:2014 Water quality - Determination of short-chain polychlorinated alkanes (SCCPs) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI) (ISO 12010:2012); German version EN ISO 12010:2014
DIN EN ISO 17294-1:2022-07 Water quality - Application of inductively coupled plasma mass spectrometry (ICP-MS) - Part 1: General guidelines (ISO/DIS 17294-1:2022); German and English version prEN ISO 17294-1:2022 / Note: Date of issue 2022-06-17*Intended as replacement for DIN ...
DIN EN 14242 E:2022-01 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectral analysis
DIN EN 17197:2022 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by inductively coupled plasma optical emission spectrometry (ICP-OES); German and English version prEN 17197:2022

AT-ON

ONORM M 6279-1991 Water analysis — Determination oj 33 elements by inductively coupled plasma emission spectrometry (ICP-AES)
ONORM M 6253 Teil.1-1985 Water analysis; determination ofanionic Surfactants by the methylene blue spectrometric method

Institute of Electrical and Electronics Engineers (IEEE)

IEEE Std 802.15.4-2020/Cor 1-2022 (Corrigendum to IEEE Std 802.15.4-2020 as amended by IEEE Std 802. IEEE Standard for Low-Rate Wireless Networks Corrigendum 1: Correction of Errors Preventing Backward Compatibility

European Committee for Standardization (CEN)

EN 17200:2023 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in eluates and digests - Analysis by inductively coupled plasma mass spectrometry (ICP-MS)
CEN/TS 17200:2018+AC:2018 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by Inductively Coupled Plasma - Mass Spectrometry (ICP-MS)
FprEN 17200 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by inductively coupled plasma mass spectrometry (ICP-MS)
PD CEN/TS 17200:2018 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by Inductively Coupled Plasma - Mass Spectrometry (ICP-MS)
EN 14242:2004 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectral analysis
PD CEN/TS 17197:2018 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by Inductively Coupled Plasma - Optical Emission Spectrometry (ICP-OES)
EN 17197:2023 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in eluates and digests - Analysis by inductively coupled plasma optical emission spectrometry (ICP-OES)

Standard Association of Australia （SAA）

AS ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
AS ISO 22048:2006 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
AS ISO 22048:2006(R2016) Surface chemical analysis - Information format for static secondary-ion mass spectrometry
AS 4873.1:2005 Recommended practice for inductively coupled plasma-mass spectrometry (ICP-MS) - Principles and techniques

Spanish Association for Standardization (UNE)

UNE-EN 14242:2023 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectrometric analysis (Endorsed by Asociación Española de Normalización in April of 2023.)

Danish Standards Foundation

DS/ENV 14029:2001 Lead and lead alloys - Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), after separation of the lead matrix
DS/EN 14242:2004 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectral analysis
DS/ENV 13800:2001 Lead and lead alloys - Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), without separation of the lead matrix

Lithuanian Standards Office

LST EN 14242-2005 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectral analysis

RU-GOST R

GOST R 56240-2014 Copper. Spectral methods of impurity analysis
GOST R 57851.1-2017 Gas-condensate mixture. Part 1. Separation gas. Compositional analysis by gas chromatography method

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