electron probe face

electron probe face, Total:28 items.

The international standard classification for "electron probe face" includes: Surgical instruments and materials , Physicochemical methods of analysis , Optical measuring instruments , Other standards related to analytical chemistry , Optical equipment .

The Chinese standard classification for "electron probe face" includes: Other special devices , Basic standards and general methods , Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer .

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Professional Standard - Military and Civilian Products

• WJ 2297-1995 Electronic Probe Verification Regulations

Professional Standard - Medicine

• YY/T 0172-1994 Explorer for womb
• YY/T 0172-2014 Uterine probe

National Metrological Verification Regulations of the People's Republic of China

• JJG(地质) 1017-1990 Verification Regulations for Electronic Probe Instrument
• JJG 901-1995 Verivication Regulation of Electron Probe Microanalyzer

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
• GB/T 15074-2008 General guide of quantitative analysis by EPMA
• GB/T 32055-2015 Microbeam analysis―Electron probe microanalysis―Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
• GB/T 15074-1994 General guide for EPMA quantitative analysis
• GB/T 17363-1998 Method of quantitative electron probe microanalysis on gold products
• GB/T 15075-1994 Method for testing EPMA instrument

Professional Standard - Petroleum

• SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals
• SY/T 6027-2012 Quantitative Analysis Method of Rock and Mineral by Electron Probe Microanalysis

国家能源局

• SY/T 6027-2019 Quantitative analysis of rocks and minerals by electron probe microanalysis

Yunnan Provincial Standard of the People's Republic of China

• DB53/T 443-2012 Fire technical appraisal method Electron probe analysis method

国家市场监督管理总局、中国国家标准化管理委员会

• GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary

CZ-CSN

• CSN ON 81 3790-1966 Electric feeler
• CSN ON 81 3791-1966 Holder of electric íeeler

HU-MSZT

• MNOSZ 15510-1955 Surgical instruments. uterine probe

Korean Agency for Technology and Standards (KATS)

• KS D ISO 23833:2012 Microbeam analysis-Electron probe microanalysis(EPMA)-Vocabulary
• KS D ISO 23833:2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
• KS D ISO 23833:2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary

KR-KS

• KS D ISO 23833-2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
• KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary

GSO

• GSO ISO 23833:2015 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
• BH GSO ISO 23833:2017 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary

SCC

• BS ISO 23833:2006 Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary
• DIN 6801-1:2019 Procedures of dosimetry with probe-type detectors for proton and ion radiation - Part 1: Ionization chambers

Others: Electron probe,surface laser,liquid level,Factor surface,Crystal face,response surface,surface data,Single crystal face,Pockmarked,face analysis,face detection,face + factor,face map,Surface factors,crystal facet,base surface non-base surface,Noodles,Film inside and outside,electron probe face,base surface non-base surface