Crystal face
Crystal face, Total:4 items.
The international standard classification for "Crystal face" includes: Semiconducting materials .
The Chinese standard classification for "Crystal face" includes: Semimetal and semiconductor material in general , Metal physical property test method .
Group Standards of the People's Republic of China
- T/CNIA 0177-2023 Determination of grain size and recrystallization area fraction of deformed aluminum and aluminum alloys - Electron backscattered diffraction method
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques
- GB/T 13388-2009 Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques
American Society for Testing and Materials (ASTM)
- ASTM F847-94(1999) Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
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