Spectrometer point analysis

Spectrometer point analysis, Total:97 items.

The international standard classification for "Spectrometer point analysis" includes: Other standards related to analytical chemistry , Electricity. Magnetism. Electrical and magnetic measurements , Chemical analysis , Physicochemical methods of analysis , Measurement of electrical and magnetic quantities , Diagnostic, maintenance and test equipment .

The Chinese standard classification for "Spectrometer point analysis" includes: Electrochemical, thermochemistry and optical profile type analyzer , Electronic measurement and equipment in general , Basic standards and general methods , Radio Measurement , Technical management , Highway vehicle servicing installation .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 28634-2012 Microbeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 11462-1989 Test methods of spectrum analyzers
GB/T 11461-2013 General Specification for Spectrum Analyzer
GB/T 11461-1989 Generic specification of spectrum analzers
GB/T 32055-2015 Microbeam analysis―Electron probe microanalysis―Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
GB/T 15244-2013 Microbeam analysis—Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry

National Metrological Technical Specifications of the People's Republic of China

JJF 1205-2008 Calibration Specification for Harmonious and Flicker Analysis System
JJF(电子) 38-1982 Calibration method of BP-24, BP-25, BP-30 microwave spectrum analyzer
JJF(电子) 37-1982 Calibration Method of BP-9 Broadband Microwave Spectrum Analyzer
JJF 1396-2013 Calibration Specification for Spectrum Analyzer
JJF 2078-2023 Calibration Specification for Real-time Spectrum Analyzers

Taiwan Provincial Standard of the People's Republic of China

CNS 14341-1999 Optical spectrum analyzer

Professional Standard - Electron

SJ 20914-2004 General specification for spectrum analyzer
SJ/T 10234-1991 Spectrum analyzer for QF4031

National Metrological Verification Regulations of the People's Republic of China

JJG(地质) 1004-1990 Verification Regulations for Oscilloscope Polarograph
JJG(航天) 10-1985 2112 Verification Regulations for Spectrum Analyzers
JJG(邮电) 007-1990 Specification for verification of microwave system analyzers
JJG 501-2000 Spectrum Analyzer
JJG 1035-2022 Optical Spectrum Analyzers in Telecommunication
JJG(航天) 9-1985 2107 Verification Regulations for Spectrum Analyzers
JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers
JJG 748-2007 Verfication Regulation of Oscilloscopic Polarograph
JJG 748-1991 Oscilloscopic Polarograph

Group Standards of the People's Republic of China

T/ZPP 017-2023 Mass Cytometry Analyzer

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41074-2021 Microbeam analysis―Method of specimen preparation for analysis of general powders using WDS and EDS

Professional Standard - Traffic

JT/T 386.1-2017 Motor vehicle exhaust analyzer —Part 1： Exhaust analyzer for Ignition vehicles

Professional Standard - Machinery

JB/T 5224-1991 Oscillographic Polarograph - Specification

机械电子工业部

JB 5224-1991 Technical conditions of oscillographic polarograph

Military Standard of the People's Republic of China-General Armament Department

GJB 4235A-2020 Technical requirements for spectrum measurement instruments

British Standards Institution (BSI)

BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
BS EN 62129:2006 Calibration of optical spectrum analyzers
BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BS 6329:1982 Method of expression of the properties of spectrum analyzers
BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy

Japanese Industrial Standards Committee (JISC)

JIS C 6183:1992 Test methods of fiber-optic spectrum analyzer
JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
JIS C 6192:2008 Calibration of optical spectrum analyzers
JIS K 0127:1992 General rules for ion chromatographic analysis

International Electrotechnical Commission (IEC)

IEC 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
IEC PAS 62129:2004 Calibration of optical spectrum analyzers
IEC 62129:2006 Calibration of optical spectrum analyzers
IEC 60714:1981 Expression of the properties of spectrum analyzers

SCC

CEI EN 62129-1:2016 Calibration of wavelength/optical frequency measurement insturments Part 1: Optical spectrum analyzers
DANSK DS/EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments – Part 1: Optical spectrum analyzers
BS EN 61290-1-1:1998 Optical spectrum analyzer
BS ISO 17470:2004 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
CEI EN 62129:2006 Calibration of optical spectrum analyzers
DIN EN 62129-1 E:2014 Draft Document - Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 86/468/CD:2014)
DANSK DS/EN 62129:2006 Calibration of optical spectrum analyzers
VDI/VDE 2631 BLATT 11-2020 Shape measurement technology - spectral analysis (Fourier analysis, harmonic analysis)
BS ISO 22489:2006 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy

European Committee for Electrotechnical Standardization（CENELEC）

EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers

Spanish Association for Standardization (UNE)

UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)

Association Francaise de Normalisation

NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
NF C93-845:2006 Calibration of optical spectrum analyzers.
NF EN 62129-1:2016 Calibration of wavelength measuring devices/optical frequency measuring devices - Part 1: optical spectrum analyzers
NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.

U.S. Air Force

AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER
AIR FORCE A-A-59130 VALID NOTICE 1-2012 Analyzer, Spectrum 10 KHZ to 50 GHZ
AIR FORCE A-A-59112 A VALID NOTICE 1-2012 Spectrum Analyzer 100 HZ to 1.8 GHZ

GSO

BH GSO ISO 17470:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GSO ISO 17470:2015 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BH GSO ISO 22489:2017 Microbeam analysis -- Electron probe microanalysis -- Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
GSO ISO 22489:2015 Microbeam analysis -- Electron probe microanalysis -- Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
OS GSO OIML R83:2008 Gas chromatograph/mass spectrometer systems for the analysis of organic pollutants in water

European Committee for Standardization (CEN)

CEN EN 62129-2006 Calibration of optical spectrum analyzers
CEN EN 62129-2006_ Calibration of optical spectrum analyzers

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

IEEE 748-1979 STANDARD FOR SPECTRUM ANALYZERS

International Organization for Standardization (ISO)

ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Danish Standards Foundation

DS/EN 62129:2006 Calibration of optical spectrum analyzers
DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers

American Society for Testing and Materials (ASTM)

ASTM D7941/D7941M-23 Standard Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer
ASTM RR-D03-2000 2023 D7941/D7941M-Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer
ASTM D7941/D7941M-14 Standard Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer

Institute of Electrical and Electronics Engineers (IEEE)

IEEE Std 748-1979 IEEE Standard for Spectrum Analyzers

Korean Agency for Technology and Standards (KATS)

KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 22489-2023 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS C 6918-2020 Test methods of fiber-optic spectrum analyzer

KR-KS

KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

South African Bureau of Standard

SANS 62129:2008 Calibration of optical spectrum analyzers

IN-BIS

IS 11148-1984 Spectrum Analyzer Performance

German Institute for Standardization

DIN EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 62129-1:2016); German version EN 62129-1:2016
DIN EN 62129:2007 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006

CZ-CSN

CSN ISO 8158:1994 Evaluation of the performance characteristics of gas analysers

SE-SIS

SIS SS IEC 578:1981 Nuclear instrumentation - Multichannel amplitude analyzers

Lithuanian Standards Office

LST EN 62129-2006 Calibration of optical spectrum analyzers (IEC 62129:2006)
LST EN 62129-2006/AC-2007 Calibration of optical spectrum analyzers (IEC 62129:2006)

International Federation of Trucks and Engines

NAVISTAR CEMS DT-14-2009 Surface Waviness Definition via ALSA Analyzer

RU-GOST R

GOST 4.361-1985 Product-quality index system. Mass-spectrometric analysers. Index nomenclature

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